Quenching circuit
View Patent ↗Disclosed is a quenching circuit including an avalanche photodiode and a quenching diode applying a bias voltage to the avalanche photodiode. Since the quenching circuit includes the quenching diode instead of a quenching resistor, the avalanche photodiode can quickly recover to linear mode from Geiger mode, and the bias voltage applied to the avalanche photodiode is stably maintained even though a current level of the avalanche photodiode fluctuates according to the intensity of incident light.
1. A quenching circuit including an avalanche photodiode and a quenching diode applying a bias voltage to one terminal of the avalanche photodiode, the quenching circuit comprising:
a first p-type semiconductor layer;
a first i-type semiconductor layer provided on an upper surface of the first p-type semiconductor layer;
a first n-type semiconductor layer provided on an upper surface of the first i-type semiconductor layer;
a second p-type semiconductor layer provided on a portion of the upper surface of the first n-type semiconductor layer; and
a pair of metal electrodes respectively serving as a first electrode provided under a lower surface of the first p-type semiconductor layer and a second electrode provided on an upper surface of the second p-type semiconductor layer,
wherein the avalanche photodiode includes the first p-type semiconductor layer, the first i-type semiconductor layer, and the first n-type semiconductor layer, and has a light-receiving region defined as a portion of the upper surface of the first n-type semiconductor layer, the portion not being covered by the second p-type semiconductor layer, and
wherein the quenching diode includes the second p-type semiconductor layer and the first n-type semiconductor layer.
2. The quenching circuit according to claim 1 , further comprising a second i-type semiconductor layer provided between the first n-type semiconductor layer and the second p-type semiconductor layer provided on the upper surface of the first n-type semiconductor layer wherein the second i-type semiconductor layer is provided to cover a portion of the upper surface of the first n-type semiconductor layer,
wherein the light-receiving region of the avalanche photodiode is defined as a portion of the upper surface of the first n-type semiconductor layer, the portion not being covered by the second i-type semiconductor layer, and
wherein the quenching diode is a PIN diode comprising the second p-type semiconductor layer, the second i-type semiconductor layer, and the first n-type semiconductor layer.
3. The quenching circuit according to claim 2 , wherein each of the first p-type semiconductor layer, the first i-type semiconductor layer, the first n-type semiconductor layer, the second p-type semiconductor layer, and the second i-type semiconductor layer is an SiC-based semiconductor layer.
4. The quenching circuit according to claim 2 , wherein each of the first p-type semiconductor layer, the first i-type semiconductor layer, the first n-type semiconductor layer, the second p-type semiconductor layer, and the second i-type semiconductor layer is a GaN-based semiconductor layer.
5. A quenching circuit including an avalanche photodiode and a quenching diode applying a bias voltage to one terminal of the avalanche photodiode, the quenching circuit comprising:
a first p-type semiconductor layer;
a first i-type semiconductor layer provided on an upper surface of the first p-type semiconductor layer;
a first n-type semiconductor layer provided on an upper surface of the first i-type semiconductor layer;
a second n − -type semiconductor layer provided on a portion of the first n-type semiconductor layer;
a Schottky metal layer provided on an upper surface of the second n − -type semiconductor layer; and
a pair of metal electrode respectively serving as a first electrode provided under a lower surface of the first p-type semiconductor layer and a second electrode provided on an upper surface of the Schottky metal layer,
wherein the avalanche photodiode is a PIN diode comprising the first p-type semiconductor layer, the first i-type semiconductor layer, and the first n-type semiconductor layer, and having a light-receiving region defined as a portion of the upper surface of the first n-type semiconductor layer, the portion being uncovered by the second n − -type semiconductor layer, and
wherein the quenching diode is a Schottky diode comprising the Schottky metal layer, the second n − -type semiconductor layer, and the first n-type semiconductor layer.
6. The quenching circuit according to claim 5 , wherein each of the first p-type semiconductor layer, the first i-type semiconductor layer, the first n-type semiconductor layer, and the second n − -type semiconductor layer is an SiC-based semiconductor layer.
7. The quenching circuit according to claim 5 , wherein each of the first p-type semiconductor layer, the first i-type semiconductor layer, the first n-type semiconductor layer, and the second n − -type semiconductor layer is a GaN-based semiconductor layer.
8. The quenching circuit according to claim 5 , wherein the Schottky metal layer is made of any one of nickel (Ni), titanium (Ti), aluminum (Al), and tungsten (W).
9. A quenching circuit including an avalanche photodiode and a quenching diode applying a bias voltage to one terminal of the avalanche photodiode, the quenching circuit comprising:
a first n-type semiconductor layer;
a first p-type semiconductor layer provided on an upper surface of the first n-type semiconductor layer and provided with a first hole through which a portion of the first n-type semiconductor layer is exposed; and
a pair of metal layers respectively serving as a first electrode provided on an upper surface of a first region of the first p-type semiconductor layer that is divided into the first region and a second region by the first hole serving as a boundary between the first region and the second region, and a second electrode provided on an upper surface of the second region of the first p-type semiconductor layer,
wherein the avalanche photodiode includes the first region of the first p-type semiconductor layer and the first n-type semiconductor layer and has a light-receiving region defined as the upper surface of the first region of the first p-type semiconductor layer, and
wherein the quenching diode includes the second region of the first p-type semiconductor layer and the first n-type semiconductor layer.
10. The quenching circuit according to claim 9 , further comprising a first i-type semiconductor layer provided between the first n-type semiconductor layer and the first p-type semiconductor layer, in which the first i-type semiconductor layer is provided with a second hole perpendicularly extending from the first hole formed in the first p-type semiconductor layer,
wherein the avalanche photodiode is a PIN diode comprising the first region of the first p-type semiconductor layer, a first region of the first i-type semiconductor layer that is divided into the first region and a second region by the second hole serving as a boundary between the first region and the second region, and the first n-type semiconductor layer, and
the quenching diode is a PIN diode comprising the second region of the first p-type semiconductor layer, the second region of the first i-type semiconductor layer, and the first n-type semiconductor layer.
11. The quenching circuit according to claim 10 , wherein each of the first n-type semiconductor layer, the first i-type semiconductor layer, and the first p-type semiconductor layer is an SiC-based semiconductor layer.
12. The quenching circuit according to claim 10 , wherein each of the first n-type semiconductor layer, the first i-type semiconductor layer, and the first p-type semiconductor layer is a GaN-based semiconductor layer.