Method and apparatus for measurement of material condition
System and method for characterizing material condition. The system includes a sensor, impedance instrument and processing unit to collect measurements and assess material properties. A model of the system may be used to enable accurate measurements of multiple material properties. A cylindrical model for an electromagnetic field sensor is disclosed for modeling substantially cylindrically symmetric material systems. Sensor designs and data processing approaches are provided to focus the sensitivity of the sensor to localize material conditions. Improved calibration methods are shown. Sizing algorithms are provided to estimate the size of defects such as cracks and corrosion. Corrective measures are provided where the actual material configuration differs from the data processing assumptions. Methods are provided for use of the system to characterize material condition, and detailed illustration is given for corrosion, stress, weld, heat treat, and mechanical damage assessment.
1. An impedance instrument comprising:
a signal generator having
a reference signal generator configured to generate reference signals at a plurality of frequencies, each frequency having an in-phase reference signal and a quadrature reference signal, the quadrature reference signal being a version of the in-phase reference signal shifted one-quarter period;
a combiner to generate a combined signal by applying a weight to each in-phase reference signal and adding the weighted in-phase reference signals; and
a module to generate and output an excitation signal by at least amplifying the combined signal; and
a sense channel having:
an analog-to-digital converter to digitize a response signal into n successive digitized samples; and
a multiply/accumulate module to separately multiply the n successive digitized samples by respective samples of respective reference signals, to separately add products of the multiply associated with each reference signal, and divide each total by n to produce complex impedance measurements at each of the plurality of frequencies.
2. The impedance instrument of claim 1 , wherein the sense channel is among a plurality of parallel sensing channels each having a respective multiply/accumulate module.
3. The impedance instrument of claim 1 , wherein the multiply/accumulate module is configured to simultaneously process the successive digitized samples of the digitized response signal by independently at least multiplying the digitized samples by the in-phase and quadrature reference signals.
4. The impedance instrument of claim 1 , wherein, for each frequency, the multiply/accumulate module produces a real part of the complex impedance measurement from the digitized samples processed with the respective in-phase reference signal, and the multiply/accumulate module produces an imaginary part of the complex impedance measurement from the digitized samples processed with the respective quadrature reference signal.