System and methods for analyzing and estimating susceptibility of circuits to radiation-induced single-event-effects
Systems and methods for semiconductor design evaluation. IC layout information of a circuit design is received, and the circuit design is decomposed into smaller circuit pieces. Each circuit piece has IC layout information and a netlist. For each circuit piece, a set of strike models is selected based on the layout information and the net-list of the circuit piece and received radiation environment information. Each strike model has circuit components with voltage values corresponding to a respective particle strike. For each selected strike model of a circuit piece: a radiation susceptibility metric is determined by comparing functional results of simulation of the of the strike model with functional results of simulation of the circuit piece. For each circuit piece, a radiation susceptibility metric is determined based on the radiation susceptibility metrics generated for each selected strike model of the circuit piece.
1. A semiconductor design evaluation hardware system, comprising:
a first hardware compute accelerator constructed to:
store a plurality of sets of analog circuit particle strike models, each set being stored in association with respective layout information and radiation environment information, wherein each particle strike model has charge voltage circuit components with radiation susceptibility charge voltage values corresponding to a respective particle strike of a radiation environment identified by the radiation environment information, and wherein each particle strike model corresponds to a different particle strike of the radiation environment;
select a set of analog circuit particle strike models based on IC (integrated circuit) layout information and radiation environment information received for a placed and routed circuit design via a network;
generate first functional results by performing functional simulation of the particle strike models of the selected set;
generate second functional results by performing functional simulation of at least a portion of the placed and routed circuit design; and
generate a radiation susceptibility metric for the placed and routed circuit design by comparing the first functional results with the second functional results.
2. The system of claim 1 , wherein the first hardware compute accelerator is constructed to provide the radiation susceptibility metric to an external operator device via the network.