IP Library Granted Patent US 10,348,989
Granted Patent B2
US 10,348,989 · App. 15/505,063 · Granted Jul 9, 2019

Image processing device, image processing method, and image processing system

Inventor: Kazuhide Fujita (Kanagawa, JP)
Assignee: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
H04N5/3675G06T3/4038H04N5/2176H04N5/367H04N9/045H04N9/07H04N9/646
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Quick Facts
Patent No.
US 10,348,989
App. No.
15/505,063
Granted
Jul 9, 2019
Kind
B2
Abstract

The present technology relates to an image processing device, an image processing method, and an image processing system capable of improving detection accuracy of a defective pixel. Provided is an image processing device including a defective pixel estimation unit that estimates a defect of a pixel of interest in an image captured by a solid-state imaging device that contains a two-dimensional array of color pixels, and high-sensitivity pixels having higher sensitivity than sensitivities of the color pixels. The defect of the pixel of interest is estimated on the basis of a correlation between pixel values of the high-sensitivity pixels, and pixel values of the color pixels. The image processing device further includes a defective pixel correction unit that corrects the pixel of interest when it is estimated that the pixel of interest is a defective pixel. The present technology is applicable to an image processing device which corrects a defective pixel by signal processing, for example.

Claims (51)

1. An image processing device, comprising:

circuitry configured to:

obtain a first correlation between pixel values of high-sensitivity pixels and pixel values of color pixels based on distribution information associated with the pixel values of the high-sensitivity pixels and the pixel values of the color pixels in an image captured by a solid-state imaging device, wherein

the image contains a two-dimensional array of the color pixels and the high-sensitivity pixels,

the high-sensitivity pixels have higher sensitivity than sensitivities of the color pixels, and

the high-sensitivity pixels and the color pixels surround a pixel of interest;

compare, based on the pixel of interest being one of the color pixels or the high-sensitivity pixels, a gradient of the pixel values of the high-sensitivity pixels that surrounds the pixel of interest with a gradient of the pixel values of the color pixels that surrounds the pixel of interest, wherein a color of the color pixels is same as a color of the pixel of interest;

obtain a second correlation between the pixel values of the high-sensitivity pixels and the pixel values of the color pixels based on the comparison;

estimate a defective pixel in the image based on the obtained second correlation between the pixel values of the high-sensitivity pixels and the pixel values of the color pixels; and

correct a defect of the pixel of interest in the image based on estimation that the pixel of interest is the defective pixel.

2. The image processing device according to claim 1 ,

wherein the circuitry is further configured to obtain the gradient of the pixel values of the high-sensitivity pixels and the gradient of the pixel values of the color pixels in one of a horizontal direction or a vertical direction with respect to the pixel of interest.

3. The image processing device according to claim 1 ,

wherein the circuitry is further configured to:

compare a difference between a pixel value of the pixel of interest and an average of the pixel values of the color pixels that surrounds the pixel of interest with a threshold value;

estimate a possibility of the defect of the pixel of interest based on the comparison of the difference between the pixel value of the pixel of interest and the average of the pixel values of the color pixels that surrounds the pixel of interest with the threshold value; and

estimate the defective pixel based on the first correlation between the pixel values of the high-sensitivity pixels and the pixel values of the color pixels, wherein the pixel of interest is the defective pixel.

4. The image processing device according to claim 1 ,

wherein the high-sensitivity pixels are white (W) pixels and,

wherein the color pixels are one of red (R) pixels, green (G) pixels, or blue (B) pixels.

5. An image processing method, comprising:

in an image processing device:

obtaining a first correlation between pixel values of high-sensitivity pixels and pixel values of color pixels based on distribution information associated with the pixel values of the high-sensitivity pixels and the pixel values of the color pixels in an image captured by a solid-state imaging device, wherein

the image contains a two-dimensional array of the color pixels and the high-sensitivity pixels,

the high-sensitivity pixels have higher sensitivity than sensitivities of the color pixels, and

the high-sensitivity pixels and the color pixels surround a pixel of interest;

comparing, based on the pixel of interest being one of the color pixels or the high-sensitivity pixels, a gradient of the pixel values of the high-sensitivity pixels that surrounds the pixel of interest with a gradient of the pixel values of the color pixels that surrounds the pixel of interest, wherein a color of the color pixels is same as a color of the pixel of interest;

obtaining a second correlation between the pixel values of the high-sensitivity pixels and the pixel values of the color pixels based on the comparison;

estimating a defective pixel in the image based on the obtained second correlation between the pixel values of the high-sensitivity pixels and the pixel values of the color pixels; and

correcting a defect of the pixel of interest in the image based on estimation that the pixel of interest is the defective pixel.

6. An image processing system, comprising:

a solid-state imaging device configured to capture an image, wherein

the image contains a two-dimensional array of color pixels and high-sensitivity pixels,

the high-sensitivity pixels have higher sensitivity than sensitivities of the color pixels, and

the high-sensitivity pixels and the color pixels surround a pixel of interest; and

an image processing device, comprising:

circuitry configured to:

obtain a first correlation between pixel values of high-sensitivity pixels and pixel values of color pixels in the image;

comparing, based on the pixel of interest being one of the color pixels or the high-sensitivity pixels, a gradient of the pixel values of the high-sensitivity pixels that surrounds the pixel of interest with a gradient of the pixel values of the color pixels that surrounds the pixel of interest, wherein a color of the color pixels is same as a color of the pixel of interest;

obtaining a second correlation between the pixel values of the high-sensitivity pixels and the pixel values of the color pixels based on the comparison;

estimate a defective pixel in the image based on the obtained second correlation between the pixel values of the high-sensitivity pixels and the pixel values of the color pixels; and

correct a defect of the pixel of interest in the image based on the estimation that the pixel of interest is the defective pixel.

7. An image processing device, comprising:

circuitry configured to:

obtain a correlation between pixel values of high-sensitivity pixels and pixel values of color pixels in an image captured by a solid-state imaging device,

wherein the image contains a two-dimensional array of the color pixels and the high-sensitivity pixels, and

wherein the high-sensitivity pixels have higher sensitivity than sensitivities of the color pixels;

compare a difference between a pixel value of a pixel of interest and an average of the pixel values of the color pixels that surrounds the pixel of interest with a threshold value, wherein a color of the color pixels is same as a color of the pixel of interest;

estimate a possibility of a defect of the pixel of interest in the image based on the comparison;

estimate a defective pixel in the image based on the correlation between the pixel values of the high-sensitivity pixels and the pixel values of the color pixels; and

correct the defect of the pixel of interest based on estimation that the pixel of interest is the defective pixel.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 17, 2017
From: FUJITA, KAZUHIDE
To: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Reel/Frame 041751/0721 →
Priority Claims (1)
JP 2014-172360 · Aug 27, 2014 · national
Continuity (1)
Related Publication 20170257584A1 · Sep 7, 2017
Cited By (1)
US 12,432,338