Voltage-tunable wavelength-agile 2D material-based light-emitting transistors
An optoelectronic device is provided that includes a doped substrate, a tunneling barrier, a direct bandgap two dimensional semiconductor material, a hot electron emitter, a gate electrode, and a voltage bias. The hot electron emitter injects hot electrons from the underlying substrate into the conduction band of the direct bandgap two dimensional semiconductor material via quantum tunneling. The gate electrode is operable to provide the voltage bias in a direction normal to the X-Y plane of the direct bandgap two dimensional semiconductor material so as to generate an electric field perpendicular to the direct bandgap two dimensional semiconductor material. The voltage bias provided by the gate is operable to change an optical bandgap of the direct bandgap two dimensional semiconductor material continuously from the visible to the mid-infrared spectral regime via an electric dipole layer enhanced Giant Stark Effect for electrically-tunable hot electron luminescence applications.
1. A semiconducting optoelectronic device comprising:
a doped substrate disposed on an X-Y plane;
a tunneling barrier disposed on said substrate;
a direct bandgap two dimensional semiconductor material disposed on said tunneling barrier in a second X-Y plane; and
a top-gate voltage source arranged to provide a voltage bias in a direction normal to the second X-Y plane so as to generate an electric field perpendicular to said direct bandgap two dimensional semiconductor material,
wherein said doped substrate acts as a hot electron emitter to inject electrons through said tunneling barrier and into said direct bandgap two dimensional semiconductor material, and
wherein the voltage bias provided by said top-gate voltage source is operable to change an optical bandgap of said direct bandgap two dimensional semiconductor material via a giant Stark Effect.
2. The semiconducting optoelectronic device of claim 1 ,
wherein said direct bandgap two dimensional semiconductor material comprises a direct bandgap monolayer two dimensional semiconductor material, and
wherein said top-gate voltage source is optically transparent.
3. The semiconducting optoelectronic device claim 2 , wherein said top-gate voltage source comprises a material selected from the group consisting of indium tin oxide, ion-gel, ionic-liquid, graphene and combinations thereof.
4. The semiconducting optoelectronic device of claim 3 , wherein said direct bandgap monolayer two dimensional semiconductor material comprises a material selected from the group consisting of MoS 2 , WS 2 , WSe 2 , other transition metal dichalcogenides, black phosphorous, and combinations thereof.
5. The semiconducting optoelectronic device of claim 4 , wherein said doped substrate comprises silicon doped with n ++ .
6. The semiconducting optoelectronic device of claim 5 , wherein said direct bandgap monolayer two dimensional semiconductor material comprises multiple monolayers of direct bandgap monolayer two dimensional semiconductor material.
7. The semiconducting optoelectronic device claim 1 , wherein said top-gate voltage source comprises a material selected from the group consisting of indium tin oxide, ion-gel, ionic-liquid, graphene and combinations thereof.
8. The semiconducting optoelectronic device of claim 7 , wherein said direct bandgap two dimensional semiconductor material comprises a material selected from the group consisting of MoS 2 , WS 2 , WSe 2 , other transition metal dichalcogenides, black phosphorous, and combinations thereof.
9. The semiconducting optoelectronic device of claim 8 , wherein said doped substrate comprises silicon doped with n ++ .
10. The semiconducting optoelectronic device of claim 9 , wherein said direct bandgap two dimensional semiconductor material comprises multiple monolayers of direct bandgap two dimensional semiconductor material.
11. The semiconducting optoelectronic device of claim 1 , wherein said direct bandgap two dimensional semiconductor material comprises a material selected from the group consisting of MoS 2 , WS 2 , WSe 2 , other transition metal dichalcogenides, black phosphorous, and combinations thereof.
12. The semiconducting optoelectronic device of claim 11 , wherein said doped substrate comprises silicon doped with n ++ .
13. The semiconducting optoelectronic device of claim 12 , wherein said direct bandgap two dimensional semiconductor material comprises multiple monolayers of direct bandgap two dimensional semiconductor material.
14. The semiconducting optoelectronic device of claim 1 , wherein said doped substrate comprises silicon doped with n ++ .
15. The semiconducting optoelectronic device of claim 14 , wherein said direct bandgap two dimensional semiconductor material comprises multiple monolayers of direct bandgap two dimensional semiconductor material.
16. The semiconducting optoelectronic device of claim 1 , wherein said direct bandgap two dimensional semiconductor material comprises multiple monolayers of direct bandgap two dimensional semiconductor material.
17. The semiconducting optoelectronic device of claim 16 , wherein said direct bandgap two dimensional semiconductor material disposed on said tunneling barrier in a second X-Y plane and is operable to emit light when said doped substrate injects electrons through said tunneling barrier and into said direct bandgap two dimensional semiconductor material.
18. The semiconducting optoelectronic device of claim 1 , wherein said direct bandgap two dimensional semiconductor material disposed on said tunneling barrier in a second X-Y plane is operable to detect light when said doped substrate injects electrons through said tunneling barrier and into said direct bandgap two dimensional semiconductor material.
19. A method of emitting light, said method comprising:
providing a semiconducting optoelectronic device comprising:
a doped substrate disposed on an X-Y plane;
a tunneling barrier disposed on the substrate;
a direct bandgap two dimensional semiconductor material disposed on the tunneling barrier in a second X-Y plane; and
a top-gate voltage source arranged to provide a voltage bias in a direction normal to the second X-Y plane so as to generate an electric field perpendicular to the direct bandgap two dimensional semiconductor material,
wherein the doped substrate acts as a hot electron emitter to inject electrons through the tunneling barrier and into the direct bandgap two dimensional semiconductor material,
wherein the voltage bias provided by the top-gate voltage source is operable to change an optical bandgap of the direct bandgap two dimensional semiconductor material via a giant Stark Effect;
providing the voltage bias, via the top-gate voltage source, so as to generate an electric field perpendicular to the direct bandgap two dimensional semiconductor material;
injecting, via the doped substrate, electrons through the tunneling barrier and into the conduction band of the direct bandgap two dimensional semiconductor material; and
emitting light from the direct bandgap two dimensional semiconductor material.
20. A method of detecting light, said method comprising:
providing a semiconducting optoelectronic device comprising:
a doped substrate disposed on an X-Y plane;
a tunneling barrier disposed on the substrate;
a direct bandgap two dimensional semiconductor material disposed on the tunneling barrier in a second X-Y plane; and
a top-gate voltage source arranged to provide a voltage bias in a direction normal to the second X-Y plane so as to generate an electric field perpendicular to the direct bandgap two dimensional semiconductor material,
wherein the doped substrate acts as a hot electron emitter to inject electrons through the tunneling barrier and into the conduction band of the direct bandgap two dimensional semiconductor material,
wherein the voltage bias provided by the top-gate voltage source is operable to change an optical bandgap of the direct bandgap two dimensional semiconductor material via a giant Stark Effect;
providing the voltage bias, via the top-gate voltage source, so as to generate an electric field perpendicular to the direct bandgap two dimensional semiconductor material;
injecting, via the doped substrate, electrons through the tunneling barrier and into the conduction band of the direct bandgap two dimensional semiconductor material; and
receiving light into at least one of the direct bandgap two dimensional semiconductor material and the substrate.