Inverted TCK, input and fixed address registers, comparator, compare register

1. A device address port comprising:

(a) a state machine having a test mode select input, an inverted test clock input, and control outputs;

(b) an address data register having a test data in input, a control input coupled to the control outputs, and parallel address data outputs;

(c) a first address comparator having first parallel address data inputs coupled to the parallel address data outputs, first parallel address register inputs, and a first result output;

(d) a second address register having an input coupled to the test data in input, a control input coupled to the control outputs of the state machine, and second parallel address register outputs coupled to the first parallel address register inputs; and

(e) a compare register having a first result input coupled to the first result output, a control input coupled to the control outputs of the state machine, and a compare register first output.

2. The device address port of claim 1 in which:

the first address comparator is a group address comparator;

the first parallel address register inputs are group parallel address register inputs;

the first result output is a group result output;

the second address register is a group address register;

the second parallel outputs are group parallel address register outputs; and

the first result input is a group result input.

3. The device address port of claim 1 in which the state machine includes a power on reset input and a test reset output.

4. The device address port of claim 1 including:

(a) a second address comparator having second parallel address data inputs coupled to the first parallel address data outputs, second parallel address register inputs, and a second result output;

(b) a third address register having a control input coupled to the control outputs of the state machine, and third parallel address register outputs coupled to the second parallel address register inputs; and

(c) the compare register having a second result input coupled to the second result output, and a compare register second output.

5. The device address port of claim 4 in which the third address register is un-connected to the test data in input.

6. The device address port of claim 1 including:

(a) a second address comparator having second parallel address data inputs coupled to the first parallel address data outputs, second parallel address register inputs, and a second result output;

(b) a third address register having a control input coupled to the control outputs of the state machine, and third parallel address register outputs coupled to the second parallel address register inputs;

(c) a third address comparator having third parallel address data inputs coupled to the first parallel address data outputs, third parallel address register inputs, and a third result output;

(d) a fourth address register having a control input coupled to the control outputs of the state machine, and fourth parallel address register outputs coupled to the third parallel address register inputs; and

(e) the compare register having a second result input coupled to the second result output, a compare register second output, a third result input coupled to the third result output, and a compare register third output.

7. The device address port of claim 6 in which the third and fourth address registers are un-connected to the test data in input.

8. The device of claim 1 in which the state machine has a compare register input coupled to the compare register first output.

9. A device address port comprising:

(a) a state machine having a test mode select input, an inverted test clock input, a compare register local input, and control outputs;

(b) an address data register having a test data in input, a control signal input coupled to the control outputs, and parallel address data outputs;

(c) a group address comparator having parallel address data inputs coupled to the parallel address data outputs, group parallel address register inputs, and a group result output;

(d) a local address comparator having parallel address data inputs coupled to the parallel address data outputs, local parallel address register inputs, and a local result output;

(e) a global address comparator having parallel address data inputs coupled to the parallel address data outputs, global parallel address register inputs, and a global result output;

(f) a group address register having an input coupled to the test data in input, a control signal input coupled to the control signal outputs of the state machine, and group parallel address register outputs coupled to the group parallel address register inputs;

(g) a local address register having local parallel address register outputs coupled to the local parallel address register inputs;

(h) a global address register having global parallel address register outputs coupled to the global parallel address register inputs; and

(i) a compare register having a group result input coupled to the group result output, a local result input coupled to the local result output, a global result input coupled to the global result output, a control input coupled to the control outputs of the state machine, a compare register local output coupled to the a compare register local input, a compare register group output, and a compare register global output.

10. The device address port of claim 9 in which the global address register and the local address register are free of connection to the test data in input.

11. The device address port of claim 9 in which the address register, the group address register, the local address register, and the global address register are free of test data out outputs.

12. The device address port of claim 9 in which the state machine includes a power on reset input and a test reset output.