Method of calibrating impedance measurements of a battery
View Patent ↗A method of calibration is described that simplifies the measurement of battery impedance conducted in-situ while determining battery state-of-health. A single shunt measurement with a known Sum of Sines (SOS) current, at the desired frequency spread and known root mean squared (RMS) current is used to create a calibration archive. A calibration selected from this archive is used to calibrate an impedance measurement made on the battery.
1. A method, comprising:
performing a shunt measurement with one non-inductive shunt value using an excitation signal including a root mean squared current and a frequency range;
capturing a response time record of said one non-inductive shunt under test;
transforming said response time record to a frequency domain;
normalizing said response time record transformed to said frequency domain to said one non-inductive shunt value; and
recording said response time record transformed to said frequency domain and normalized to said non-inductive shunt value as a calibration record;
exciting a device under test using said excitation signal including said at least one RMS current level and said frequency range;
capturing a response time record of said device under test;
transforming said time record of said device under test to said frequency domain;
applying said calibration record to said response time record of said device under test; and
generating a measurement of said device under test.
2. The method of claim 1 ,
wherein said root mean squared current level comprises only a high range root mean squared current level; and
scaling said measurement of said high range root mean square current level.
3. The method of claim 2 , further comprising:
performing said shunt measurement with one non-inductive shunt value using an excitation signal including at least one the root mean squared current and each of a plurality of frequency ranges;
capturing said response time record of each one of said plurality of frequency ranges of said one non-inductive shunt under test;
transforming said response time record of each one of said plurality of frequency ranges to said frequency domain;
normalizing each response time record of each one of said plurality standardized frequency ranges to said known non-inductive shunt value and said high range root mean square current level;
recording said response time record of each one of said plurality of standardized frequency ranges transformed to said frequency domain and normalized to said non-inductive shunt value as a plurality of calibration records;
exciting said device under test at one of said plurality of standardized frequency ranges at said high range root mean square current level;
capturing said response time record of said device under test at said one of said plurality of standardized frequency ranges at said high range root mean square current level;
transforming said response time record of said device under test at said one of said plurality of standardized frequency ranges at said high range root mean square current level selecting one of said plurality of calibration records corresponding to said one of said plurality of standardized frequencies used to excite said device under test;
scaling said measurement root mean squared current level; and
applying said one of said plurality of calibration records to said response time record of said device under test; and
generating said measurement of said device under test.
4. The method of claim 3 ,
wherein said plurality of frequency ranges comprise harmonic octave and exact subsets of said frequency range.
5. The method of claim 4 , wherein said harmonic octave subsets comprise exact harmonic octave subsets of said frequency.
6. The method of claim 1 , further comprising in negative creating said response time record including a negative time portion backward of time zero corresponding to a fraction of a period of a lowest frequency of said excitation signal; and
discarding said negative time portion of said response time record.
7. The method of claim 6 , wherein said fraction of said period of said lowest frequency comprises about ten percent of said period of said lowest frequency.
8. The method of claim 1 , further comprising:
examining said response time record;
determining time periods in said response time record where a voltage level exceeds a saturation level of a digitizer within a data acquisition system;
discarding said time periods in said response time record where said voltage level exceeds said saturation level of said digitizer;
discarding said time periods in said calibration record which correspond to said time periods discarded in said response time record;
applying resulting said calibration record to resulting said time response record; and
generating a measurement of said device under test.