Storage device and associated control method to determine target memory blocks for probe operation
A control method for a storage device is provided. The storage device includes a memory controller and a flash memory. The flash memory includes multiple blocks. The control method includes the following steps. Maintain a state table by the memory controller, wherein the state table records a disturbance count and a last check time of the blocks in the flash memory. Trigger a probe operation on a target block in the flash memory when at least one of the following conditions is met: (a) the disturbance count of the target block is greater than or equal to a disturbance count threshold; and (b) an elapsed time period of the target block is greater than or equal to an elapsed time threshold, wherein the elapsed time period of the target block starts from the last check time of the target block.
1. A control method for a storage device comprising a memory controller and a flash memory, the flash memory comprising a plurality of blocks, the control method comprising:
recording a disturbance count and a last check time of the plurality of blocks in the flash memory; and
triggering a probe operation on a target block in the flash memory when at least one of the following conditions is met:
(a) the disturbance count of the target block is greater than or equal to a disturbance count threshold, wherein the disturbance count threshold is adjusted according to an error bit number; and
(b) an elapsed time period of the target block is greater than or equal to an elapsed time threshold, wherein the elapsed time period of the target block starts from the last check time of the target block;
wherein the memory controller records the error bit number of the plurality of blocks in the flash memory;
the disturbance count threshold and the elapsed time threshold for each of the plurality of blocks are calculated according to the corresponding error bit number of each of the plurality of blocks; and
the memory controller starts migrating data stored in the target block depending on a result of the probe operation performed on the target block.
2. The control method according to claim 1 , wherein the step of recording a disturbance count and a last check time of the plurality of blocks in the flash memory comprises:
updating the last check time of a first block when the probe operation is triggered on the first block.
3. The control method according to claim 1 , wherein the step of recording a disturbance count and a last check time of the plurality of blocks in the flash memory comprises:
updating the last check time of a first block when a read operation is performed on the first block.
4. The control method according to claim 1 , wherein the step of recording a disturbance count and a last check time of the plurality of blocks in the flash memory comprises:
increasing the disturbance count of a first block when a read operation is performed on the first block.
5. The control method according to claim 1 , wherein the step of recording a disturbance count and a last check time of the plurality of blocks in the flash memory comprises:
resetting the disturbance count of a first block when the probe operation is triggered on the first block.
6. The control method according to claim 1 , wherein the disturbance count is a sum of a read count, a program count, and an erase count.
7. The control method according to claim 1 , wherein the error bit number of a first block is a maximum number of error bits among a plurality of pages in the first block.
8. The control method according to claim 1 , wherein the step of recording a disturbance count and a last check time of the plurality of blocks in the flash memory comprises:
resetting the error bit number of a first block when an erase operation is performed on the first block.
9. The control method according to claim 1 , wherein the memory controller further records an erase count of the plurality of blocks in the flash memory, and the control method further comprises:
calculating the disturbance count threshold and the elapsed time threshold for the plurality of blocks according to the corresponding erase count.
10. A storage device, comprising:
a flash memory, comprising a plurality of blocks; and
a memory controller, configured to record a disturbance count and a last check time of the plurality of blocks in the flash memory, and to trigger a probe operation on a target block in the flash memory when at least one of the following conditions is met:
(a) the disturbance count of the target block is greater than or equal to a disturbance count threshold, wherein the disturbance count threshold is adjusted according to an error bit number; and
(b) an elapsed time period of the target block is greater than or equal to an elapsed time threshold, wherein the elapsed time period of the target block starts from the last check time of the target block,
wherein the memory controller further records the error bit number of the plurality of blocks in the flash memory;
the memory controller is configured to calculate the disturbance count threshold and the elapsed time threshold for each of the plurality of blocks according to the corresponding error bit number of each of the plurality of blocks; and
the memory controller starts migrating data stored in the target block depending on a result of the probe operation performed on the target block.
11. The storage device according to claim 10 , wherein the memory controller is configured to update the last check time of a first block when the probe operation is triggered on the first block.
12. The storage device according to claim 10 , wherein the memory controller is configured to update the last check time of a first block when a read operation is performed on the first block.
13. The storage device according to claim 10 , wherein the memory controller is configured to increase the disturbance count of a first block when a read operation is performed on the first block.
14. The storage device according to claim 10 , wherein the memory controller is configured to reset the disturbance count of a first block when the probe operation is triggered on the first block.
15. The storage device according to claim 10 , wherein the disturbance count is a sum of a read count, a program count, and an erase count.
16. The storage device according to claim 10 , wherein the error bit number of a first block is a maximum number of error bits among a plurality of pages in the first block.
17. The storage device according to claim 10 , wherein the memory controller is configured to reset the error bit number of a first block when an erase operation is performed on the first block.
18. The storage device according to claim 10 , wherein the memory controller further records an erase count of the plurality of blocks in the flash memory, and the memory controller is configured to calculate the disturbance count threshold and the elapsed time threshold for the plurality of blocks according to the corresponding erase count.