Imaging hidden objects

1. An imaging system for identifying information of an object hidden from view, the imaging system comprising:

a light source that generates a first beam of narrow-band light and a second beam of narrow-band light that has temporal fluctuations correlated with the first beam;

wherein the first beam is directed towards a first scattering surface and the second beam is directed towards a second scattering surface, both the first scattering surface and the second scattering surface having a surface roughness greater than a wavelength of light, and wherein the first scattering surface scatters the first beam to a scattered light that illuminates a hidden object, the hidden object reflects at least a portion of the scattered light towards the second scattering surface, the at least a portion of the scattered light interferes with the second beam and produces an interference pattern on the second scattering surface;

a first phase modulator positioned along the propagation direction of the second beam that modulates a phase of the second beam to introduce a first phase shift of the second beam and the first phase shifted second beam interferes with the light of the first beam reflected by the hidden object to produce a second interference pattern on the second scattering surface;

an image sensor positioned to detect irradiance of the interference pattern on the second scattering surface, wherein a line-of-sight between the image sensor and the hidden object is obstructed; and

an image processor that calculates a complex-valued light field that represents information of the hidden object based on the detected irradiance of the interference pattern on the second scattering surface.

2. The imaging system of claim 1 , wherein the first phase modulator modulates the phase of the second beam to introduce a second phase shift of the second beam and the second phase shifted second beam interferes with the light of the first beam reflected by the hidden object to produce a third interference pattern on the second scattering surface.

3. The imaging system of claim 2 , wherein the first phase modulator modulates the phase of the second beam to introduce a third phase shift of the second beam and the third phase shifted second beam interferes with the light of the first beam reflected by the hidden object to produce a fourth interference pattern on the second scattering surface.

4. The imaging system of claim 1 , wherein the first scattering surface at least partially overlaps with the second scattering surface.

5. The imaging system of claim 1 , wherein the narrow-band light is coherent and a linewidth of the narrow-band light is less than or equal to one nanometer.

6. The imaging system of claim 1 , wherein the light source is a laser source, one or more light emitting diodes, a narrow-band light filter, or a broadband light source with a narrow-band light filter.

7. The imaging system of claim 1 , wherein the narrow-band light has a frequency range in a visible portion of an electromagnetic spectrum, an infrared, an ultraviolet, or a millimeter wave spectrum.

8. The imaging system of claim 1 , wherein the complex-valued light field represents a hologram of the hidden object, and the image processor further performs numerical approximation to identify the hologram of the hidden object.

9. The imaging system of claim 1 , wherein the image processor further performs numerical approximation to identify an image of the hidden object based on a magnitude component of the complex-valued light field.

10. The imaging system of claim 1 , wherein the image processor further performs numerical approximation to identify a geometry of the hidden object based on a phase component of the complex-valued light field.

11. The imaging system of claim 1 , wherein the image processor further performs a field propagation, a Fourier transform, or a numerical approximation of the complex-valued light field.

12. A method for identifying information of an object hidden from view, comprising:

generating a first beam of narrow-band light to illuminate on a first scattering surface;

generating a second beam of narrow-band light to illuminate on a second scattering surface, the second beam has temporal fluctuations correlated with the first beam, and the narrow-band light is coherent and a linewidth of the narrow-band light is less than or equal to one nanometer;

wherein both the first scattering surface and the second scattering surface have a surface roughness greater than a wavelength of light, and wherein the first scattering surface scatters the first beam to a scattered light that illuminates a hidden object, the hidden object reflects at least a portion of the scattered light towards the second scattering surface, the at least a portion of the scattered light interferes with the second beam and produces an interference pattern on the second scattering surface;

detecting, with an image sensor, irradiance of the interference pattern on the second scattering surface, wherein a line-of-sight between the image sensor and the hidden object is obstructed; and

calculating a complex-valued light field that represents information of the hidden object based on the detected irradiance of the interference pattern on the second scattering surface.

13. The method of claim 12 , further comprising:

modulating a phase of the second beam to introduce a first phase shift of the second beam and the first phase shifted second beam interferes with the light of the first beam reflected by the hidden object to produce a second interference pattern on the second scattering surface;

modulating the phase of the second beam to introduce a second phase shift of the second beam and the second phase shifted second beam interferes with the light of the first beam reflected by the hidden object to produce a third interference pattern on the second scattering surface; and

modulating the phase of the second beam to introduce a third phase shift of the second beam and the third phase shifted second beam interferes with the light of the first beam reflected by the hidden object to produce a fourth interference pattern on the second scattering surface.

14. The method of claim 12 , wherein the narrow-band light has a frequency range in a visible portion of an electromagnetic spectrum, an infrared, an ultraviolet, or a millimeter wave spectrum.

15. The method of claim 12 , further comprises performing numerical approximation to identify a hologram of the hidden object based on the complex-valued light field.

16. The method of claim 12 , further comprises performing numerical approximation to identify an image of the hidden object based on a magnitude component of the complex-valued light field.

17. The method of claim 12 , further comprises performing numerical approximation to identify a geometry of the hidden object based on a phase component of the complex-valued light field.

18. The method of claim 12 , further comprises performing a field propagation, a Fourier transform, or a numerical approximation of the complex-valued light field.

19. An imaging system for identifying information of an object hidden from view, the imaging system comprising:

a light source that generates a first beam of narrow-band light and a second beam of narrow-band light that has temporal fluctuations correlated with the first beam, where the narrow-band light is coherent and a linewidth of the narrow-band light is less than or equal to one nanometer;

wherein the first beam is directed towards a first scattering surface and the second beam is directed towards a second scattering surface, both the first scattering surface and the second scattering surface having a surface roughness greater than a wavelength of light, and wherein the first scattering surface scatters the first beam to a scattered light that illuminates a hidden object, the hidden object reflects at least a portion of the scattered light towards the second scattering surface, the at least a portion of the scattered light interferes with the second beam and produces an interference pattern on the second scattering surface;

an image sensor positioned to detect irradiance of the interference pattern on the second scattering surface, wherein a line-of-sight between the image sensor and the hidden object is obstructed; and

an image processor that calculates a complex-valued light field that represents information of the hidden object based on the detected irradiance of the interference pattern on the second scattering surface.

20. The imaging system of claim 19 , wherein the first scattering surface at least partially overlaps with the second scattering surface.