Substrate for sample analysis, sample analysis device, sample analysis system, and program for sample analysis system
A substrate for sample analysis on which transfer of liquids is to occur with rotational motion, includes a substrate having a rotation axis; a first chamber and a second chamber being located in the substrate and respectively having a first space and a second space for retaining a first liquid and a second liquid; a third chamber being located in the substrate and having a third space for retaining the liquids to be discharged from the first chamber and the second chamber; a first channel having a path connecting the first chamber and the third chamber to transfer the first liquid; and a second channel having a path connecting the second chamber and the third chamber to transfer the second liquid.
1. A substrate for sample analysis on which transfer of liquids is to occur with rotational motion, the substrate for sample analysis comprising:
a substrate having a rotation axis;
a first chamber and a second chamber being located in the substrate and respectively having a first space and a second space for retaining a first liquid and a second liquid;
a third chamber being located in the substrate and having a third space for retaining the liquids to be discharged from the first chamber and the second chamber;
a first channel having a path connecting the first chamber and the third chamber in the substrate to transfer the first liquid; and
a second channel having a path connecting the second chamber and the third chamber in the substrate to transfer the second liquid, wherein,
in rotating the substrate clockwise or counterclockwise around the rotation axis while supporting the substrate so that the rotation axis of the substrate is inclined at an angle which is greater than 0° but not more than 90° with respect to a direction of gravity,
when the substrate is rotated by an angle A 1 from an arbitrary predetermined reference angle at which the first liquid and the second liquid retained in the first chamber and the second chamber are not transferred to the third chamber via the first channel and the second channel, respectively,
a first predetermined amount of first liquid moves from the first chamber to the third chamber, and
a second predetermined amount of second liquid moves from the second chamber to the third chamber; and
when the substrate is further rotated by an angle A 2 from the angle A 1 ,
a third predetermined amount of first liquid moves from the first chamber to the third chamber, and
a fourth predetermined amount of second liquid moves from the second chamber to the third chamber.
2. The substrate for sample analysis of claim 1 , wherein the first predetermined amount is the entire amount of first liquid that is retained in the first chamber, and the third predetermined amount is zero.
3. The substrate for sample analysis of claim 1 , wherein,
the first predetermined amount is the entire amount of first liquid that is retained in the first chamber;
the second predetermined amount is zero;
the third predetermined amount is zero; and
the fourth predetermined amount is the entire amount of second liquid that is retained in the second chamber.
4. The substrate for sample analysis of claim 1 , further comprising a magnet located near the third chamber.
5. The substrate for sample analysis of claim 1 , wherein the first channel and the second channel respectively transfer the first liquid and the second liquid based on gravity.
6. The substrate for sample analysis of claim 5 , wherein,
when the substrate is retained at the arbitrary predetermined reference angle while supporting the substrate so that the rotation axis of the substrate is inclined at an angle which is greater than 0° but not more than 90° with respect to the direction of gravity,
the third chamber is situated below the first chamber and the second chamber along the direction of gravity.
7. The substrate for sample analysis of claim 1 , wherein the second predetermined amount is zero.
8. The substrate for sample analysis of claim 7 , wherein the fourth predetermined amount is the entire amount of second liquid that is retained in the second chamber.
9. A sample analysis system comprising:
the substrate for sample analysis of claim 1 ; and
a sample analysis device, including
a motor to rotate the substrate for sample analysis around the rotation axis in a state where the rotation axis is inclined at an angle which is greater than 0° but not more than 90° with respect to the direction of gravity,
an angle detection circuit to detect an angle of a shaft of the motor,
a drive circuit to control rotation and a stopping angle of the motor based on a result of detection by the angle detection circuit, and
a control circuit including an arithmetic unit, a memory, and a program which is stored in the memory and executable by the arithmetic unit, to control based on the program an operation of the motor, the angle detection circuit, the origin detector, and the drive circuit,
wherein,
when the substrate for sample analysis with the first chamber and the second chamber being filled respectively with the first liquid and the second liquid is placed on a turntable of the sample analysis device,
the program
(a) stops the substrate for sample analysis at a predetermined first angle to transfer the first liquid in the first chamber through the first channel to the third chamber, and
(b) stops the substrate for sample analysis at a predetermined second angle to transfer the second liquid in the second chamber through the second channel to the third chamber.
10. The sample analysis system of claim 9 , wherein,
the substrate for sample analysis further includes
a fourth chamber being in the substrate located more distant from the rotation axis than is the third chamber and having a fourth space for retaining at least one of the first liquid or the second liquid to be discharged from the third chamber, and
a third channel being located in the substrate and having a path connecting the third chamber and the fourth chamber, the third channel capable of being filled via capillary action with the liquid that is retained in the third space; and
between the processes (a) and (b), the program,
(c) with a centrifugal force due to rotation of the substrate, rotates the substrate for sample analysis at a rate causing a centrifugal force which is stronger than a capillary force to act on the liquid filling the third channel, to move the first liquid in the third chamber through the third channel to the fourth chamber.
11. The sample analysis system of claim 9 , wherein, after the process (b), the program,
(d) with a centrifugal force due to rotation of the substrate, rotates the substrate for sample analysis at a rate causing a centrifugal force which is stronger than a capillary force to act on the liquid filling the third channel, to move the second liquid in the third chamber through the third channel to the fourth chamber.
12. A sample analysis device comprising:
a motor to rotate the substrate for sample analysis of claim 1 around the rotation axis in a state where the rotation axis is inclined at an angle which is greater than 0° but not more than 90° with respect to the direction of gravity;
an angle detection circuit to detect an angle of a shaft of the motor;
a drive circuit to control rotation and a stopping angle of the motor based on a result of detection by the angle detection circuit; and
a control circuit including an arithmetic unit, a memory, and a program which is stored in the memory and executable by the arithmetic unit, to control based on the program an operation of the motor, the angle detection circuit, and the drive circuit,
wherein,
when the substrate for sample analysis with the first chamber and the second chamber being filled respectively with the first liquid and the second liquid is placed on a turntable of the sample analysis device,
the program
(a) stops the substrate for sample analysis at a predetermined first angle to transfer the first liquid in the first chamber through the first channel to the third chamber, and
(b) stops the substrate for sample analysis at a predetermined second angle to transfer the second liquid in the second chamber through the second channel to the third chamber.
13. The sample analysis device of claim 12 , wherein,
the substrate for sample analysis further includes
a fourth chamber being in the substrate located more distant from the rotation axis than is the third chamber and having a fourth space for retaining at least one of the first liquid or the second liquid to be discharged from the third chamber, and
a third channel being located in the substrate and having a path connecting the third chamber and the fourth chamber, the third channel capable of being filled via capillary action with the liquid that is retained in the third space; and
between the processes (a) and (b), the program,
(c) with a centrifugal force due to rotation of the substrate, rotates the substrate for sample analysis at a rate causing a centrifugal force which is stronger than a capillary force to act on the liquid filling the third channel, to move the first liquid in the third chamber through the third channel to the fourth chamber.
14. The sample analysis device of claim 12 , wherein, after the process (b), the program,
(d) with a centrifugal force due to rotation of the substrate, rotates the substrate for sample analysis at a rate causing a centrifugal force which is stronger than a capillary force to act on the liquid filling the third channel, to move the second liquid in the third chamber through the third channel to the fourth chamber.
15. A non-transitory computer-readable storage medium storing a program for a sample analysis system comprising:
the substrate for sample analysis of claim 1 ; and
a sample analysis device, including
a motor to rotate the substrate for sample analysis around the rotation axis in a state where the rotation axis is inclined at an angle which is greater than 0° but not more than 90° with respect to the direction of gravity,
an angle detection circuit to detect an angle of a shaft of the motor,
a drive circuit to control rotation and a stopping angle of the motor based on a result of detection by the angle detection circuit, and
a control circuit including an arithmetic unit, a memory, and a program which is stored in the memory and executable by the arithmetic unit, to control based on the program an operation of the motor, the angle detection circuit, the origin detector, and the drive circuit,
wherein,
when the substrate for sample analysis with the first chamber and the second chamber being filled respectively with the first liquid and the second liquid is placed on a turntable of the sample analysis device,
the program
(a) stops the substrate for sample analysis at a predetermined first angle to transfer the first liquid in the first chamber through the first channel to the third chamber, and
(b) stops the substrate for sample analysis at a predetermined second angle to transfer the second liquid in the second chamber through the second channel to the third chamber.
16. The non-transitory computer-readable storage medium of claim 15 , wherein,
the substrate for sample analysis further includes
a fourth chamber being in the substrate located more distant from the rotation axis than is the third chamber and having a fourth space for retaining at least one of the first liquid or the second liquid to be discharged from the third chamber, and
a third channel being located in the substrate and having a path connecting the third chamber and the fourth chamber, the third channel capable of being filled via capillary action with the liquid that is retained in the third space; and
between the processes (a) and (b), the program,
(c) with a centrifugal force due to rotation of the substrate, rotates the substrate for sample analysis at a rate causing a centrifugal force which is stronger than a capillary force to act on the liquid filling the third channel, to move the first liquid in the third chamber through the third channel to the fourth chamber.
17. The non-transitory computer-readable storage medium of claim 15 , wherein, after the process (b), the program,
(d) with a centrifugal force due to rotation of the substrate, rotates the substrate for sample analysis at a rate causing a centrifugal force which is stronger than a capillary force to act on the liquid filling the third channel, to move the second liquid in the third chamber through the third channel to the fourth chamber.
18. The substrate for sample analysis of claim 1 , wherein,
the substrate includes
a first side face defining a portion of the first space in the substrate and adjoining the first channel, and a third side face adjoining the first side face, and
a second side face defining a portion of the second space in the substrate and adjoining the second channel, and a fourth side face adjoining the second side face; and
when the substrate is retained at the arbitrary predetermined reference angle while supporting the substrate so that the rotation axis of the substrate is inclined at an angle which is greater than 0° but not more than 90° with respect to the direction of gravity,
the first chamber retains the first liquid at least with the first side face and the third side face, and
the second chamber retains the second liquid at least with the second side face and the fourth side face.
19. The substrate for sample analysis of claim 18 , wherein a first boundary position between the first side face and the first channel is defined by a boundary between a liquid surface of a first wash solution and the first channel or the first side face that exists when, in rotating the substrate from the arbitrary predetermined reference angle to the angle A 1 , the first liquid first begins to move toward the third chamber at a position along a predetermined thickness direction.
20. The substrate for sample analysis of claim 19 , wherein a second boundary position between the second side face and the second channel is defined by a boundary between a liquid surface of a second wash solution and the second channel or the second side face that exists when, in rotating the substrate from the arbitrary predetermined reference angle to the angle A 2 , the second liquid first begins to move toward the third chamber at a position along the predetermined thickness direction.
21. The substrate for sample analysis of claim 20 , wherein,
in a case where the first boundary position is closer to the rotation axis than is the first side face and the second boundary position is closer to the rotation axis than is the second side face, or
in a case where the first boundary position is more distant from the rotation axis than is the first side face and the second boundary position is more distant from the rotation axis than is the second side face,
when the substrate is viewed from a direction which is parallel to the rotation axis in a state where the substrate is retained at the arbitrary predetermined reference angle while supporting the substrate so that the rotation axis of the substrate is inclined at an angle which is greater than 0° but not more than 90° with respect to the direction of gravity, the first boundary position and second boundary position are on either a right or left side on the substrate; and
a direction of rotation in which the substrate is rotated by the angle A 1 from the arbitrary predetermined reference angle and a direction of rotation in which the substrate is rotated by the angle A 2 from the angle A 1 are an identical direction.
22. The substrate for sample analysis of claim 20 , wherein,
in a case where the first boundary position is closer to the rotation axis than is the first side face and the second boundary position is closer to the rotation axis than is the second side face, or
in a case where the first boundary position is more distant from the rotation axis than is the first side face and the second boundary position is more distant from the rotation axis than is the second side face,
when the substrate is viewed from a direction which is parallel to the rotation axis in a state where the substrate is retained at the arbitrary predetermined reference angle while supporting the substrate so that the rotation axis of the substrate is inclined at an angle which is greater than 0° but not more than 90° with respect to the direction of gravity, the first boundary position and second boundary position are respectively on different right or left sides on the substrate,
a direction of rotation in which the substrate is rotated by the angle A 1 from the arbitrary predetermined reference angle and a direction of rotation in which the substrate is rotated by the angle A 2 from the angle A 1 are opposite directions.
23. The substrate for sample analysis of claim 20 , wherein,
in a case where the first boundary position is closer to the rotation axis than is the first side face and the second boundary position is more distant from the rotation axis than is the second side face, or
in a case where the first boundary position is more distant from the rotation axis than is the first side face and the second boundary position is closer to the rotation axis than is the second side face,
when the substrate is viewed from a direction which is parallel to the rotation axis in a state where the substrate is retained at the arbitrary predetermined reference angle while supporting the substrate so that the rotation axis of the substrate is inclined at an angle which is greater than 0° but not more than 90° with respect to the direction of gravity, the first boundary position and second boundary position respectively on different right or left sides on the substrate; and
a direction of rotation in which the substrate is rotated by the angle A 1 from the arbitrary predetermined reference angle and a direction of rotation in which the substrate is rotated by the angle A 2 from the angle A 1 are an identical direction.
24. The substrate for sample analysis of claim 20 , wherein,
in a case where the first boundary position is closer to the rotation axis than is the first side face and the second boundary position is more distant from the rotation axis than is the second side face, or
in a case where the first boundary position is more distant from the rotation axis than is the first side face and the second boundary position is closer to the rotation axis than is the second side face,
when the substrate is viewed from a direction which is parallel to the rotation axis in a state where the substrate is retained at the arbitrary predetermined reference angle while supporting the substrate so that the rotation axis of the substrate is inclined at an angle which is greater than 0° but not more than 90° with respect to the direction of gravity, the first boundary position and second boundary position are on either a right or left side on the substrate,
a direction of rotation in which the substrate is rotated by the angle A 1 from the arbitrary predetermined reference angle and a direction of rotation in which the substrate is rotated by the angle A 2 from the angle A 1 are opposite directions.