IP Library › Granted Patent US 1,061,287
Granted Patent S1
US 1,061,287 · App. 29/877,541 · Granted Feb 11, 2025

Digimatic micrometer

Inventor: Yunchen Sun (Changzhou, CN)
Assignee: Qinghai Measuring Tools (Changzhou) Co., Ltd
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Quick Facts
Patent No.
US 1,061,287
App. No.
29/877,541
Granted
Feb 11, 2025
Kind
S1
Claims (1)

The ornamental design for a digimatic micrometer, as shown and described.

Assignments (2)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE NAME PREVIOUSLY RECORDED AT REEL: 063942 FRAME: 0833. ASSIGNOR(S) HEREBY CONFIRMS THE CONFIRMATORY ASSIGNMENT. Recorded Jun 16, 2023
From: SUN, YUNCHEN
To: QINGHAI MEASURING TOOLS (CHANGZHOU) CO., LTD
Reel/Frame 064007/0616 →
CONFIMATORY ASSIGNMENT Recorded Jun 9, 2023
From: SUN, YUNCHEN
To: QINGHAI MEASURING TOOLS (CHANGZHOU) CO., LTD.
Reel/Frame 063942/0833 →
Priority Claims (1)
CN 202330209640.3 · Apr 17, 2023 · national
References Cited (13)
US 4578868A · Sasaki · 1986 [cited by examiner]
US D429172S · Reymond · 2000 [cited by examiner]
US D611371S · Ohtani · 2010 [cited by examiner]
US 8296966B2 · Hayashida · 2012 [cited by examiner]
US D730212S · Biselx · 2015 [cited by examiner]
US D740142S · Zhang · 2015 [cited by examiner]
US D744359S · Biselx · 2015 [cited by examiner]
US RE47140E · Biselx · 2018 [cited by examiner]
US D839759S · Zhang · 2019 [cited by examiner]
US 10295324B2 · Matsumoto · 2019 [cited by examiner]
US 10996043B2 · Tsujimoto · 2021 [cited by examiner]
US 11280602B1 · Jeon · 2022 [cited by examiner]
US 11821724B2 · Matsumoto · 2023 [cited by examiner]