Backscatter characterization using interlinearly adaptive electromagnetic X-ray scanning
Methods and an x-ray source for sweeping an x-ray beam across an object of inspection. A beam of electrons is emitted by a cathode, while a sweep controller applies a signal to a beam controller in a prescribed path on an anode, thereby causing an x-ray beam to be emitted from an aperture disposed at one apex of a snout of variable length. The aperture may be a Rommel aperture that allows for forming a scanning x-ray of desired size and flux independently of the angle at which the beam is emitted. Scanning rate may be varied during the course of a scan. Multiple x-ray beams may be formed simultaneously, where one beam is inside a conveyance while the other is outside the conveyance, for example.
1. An x-ray source comprising:
a cathode for emitting a beam of electrons;
a beam controller for varying a direction of the beam of electrons relative to an anode;
a snout, opaque to transmission of x-rays therethrough, characterized by a first aperture disposed at one apex of the snout and characterized by a variable snout length; and
a sweep controller for applying a signal to the beam controller in such a manner as to scan the beam of electrons in a prescribed path on the anode, thereby causing an x-ray beam to be emitted from the aperture in a direction that varies as a function of time.
2. The x-ray source in accordance with claim 1 , wherein the aperture is a Rommel aperture.
3. The x-ray source in accordance with claim 2 , wherein the Rommel aperture is a variable Rommel aperture.
4. The x-ray source in accordance with claim 1 , wherein the first aperture is adapted to be varied in position relative to the anode.
5. The x-ray source in accordance with claim 1 , wherein the beam controller comprises a steering coil.
6. The x-ray source in accordance with claim 1 , further comprising a snout length controller.
7. The x-ray source in accordance with claim 1 , further comprising a second aperture for emission of an x-ray beam, adapted such that x-rays may be emitted from the first aperture or the second aperture on the basis of placement of the electron beam on the anode.
8. The x-ray source in accordance with claim 6 , further comprising a filter disposed in a channel disposed between the anode and the second aperture.
9. A method for sweeping an x-ray beam across an object of inspection, the method comprising:
varying a direction of a beam of electrons relative to an anode upon which the beam of electrons impinges;
coupling x-rays generated at the anode via an aperture disposed at an apex of a snout characterized by a snout length, thereby generating an x-ray beam characterized by a direction scanned as a function of time; and
adjusting the snout length on a basis of a dimension of the object of inspection.
10. The method in accordance with claim 9 , further comprising differentially filtering x-rays emitted through two apertures in the snout.
11. The method in accordance with claim 9 , further comprising scanning a first portion of the object of inspection and subsequently scanning a second portion of the object of inspection.
12. The method in accordance with claim 11 , wherein the second portion of the object of inspection overlaps the first portion, at least in part.
13. The method in accordance with claim 11 , wherein subsequently scanning the second portion of the object of inspection includes scanning at a second sampling rate distinct from a first sampling rate at which the first portion was scanned.
14. The method in accordance with claim 13 , wherein the second sampling rate is based, at least in part, on measurements derived during the course of a scan.
15. An x-ray source comprising:
a cathode for emitting a beam of electrons;
a controller for varying a direction of the beam of electrons relative to a first anode and a second anode;
a first snout, opaque to transmission of x-rays therethrough, characterized by a first aperture disposed at one apex of the first snout;
a second snout, opaque to transmission of x-rays therethrough, characterized by a second aperture disposed at one apex of the second snout; and
a sweep controller for applying a signal to the beam controller in such a manner as to scan the beam of electrons in a prescribed path on the first and second anodes, thereby causing a first x-ray beam to be emitted from the first aperture in a direction that varies as a first function of time and a second x-ray beam to be emitted from the second aperture in a direction that varies as a second function of time.
16. The x-ray source in accordance with claim 15 , wherein the first aperture is a Rommel aperture.
17. The x-ray source in accordance with claim 15 , wherein the first aperture is a variable Rommel aperture.
18. The x-ray source in accordance with claim 16 , wherein the second aperture is a Rommel aperture.
19. The x-ray source in accordance with claim 18 , wherein the first aperture and the second aperture have distinct aperture openings.
20. The x-ray source in accordance with claim 15 , further comprising a snout length controller for controlling a length of the first snout.
21. A mobile system for simultaneously inspecting a vehicle and cargo, the mobile system comprising:
a bilateral scanning system disposed within a conveyance for sweeping a first x-ray beam in a scan path outside the conveyance and a second x-ray beam in a second scan path in a plane within the conveyance;
a conveyor for moving the cargo through the plane of the second scan path;
a first detector for detecting x-rays scattered by the vehicle from the first x-ray beam; and
a second detector for detecting x-rays interacting with the cargo.