Memory system and method for controlling memory system
According to one embodiment, a memory system includes a memory device and a controller. The controller is configured to make the memory device apply a first verify voltage to a first word line for determining whether writing of a first data value into a first cell transistor has been completed. The controller is configured to make the memory device apply a second verify voltage to a second word line for determining whether writing of the first data value into a second cell transistor has been completed. The second verify voltage is different from the first verify voltage.
1. A memory system comprising:
a nonvolatile memory comprising a first cell transistor, a second cell transistor, a first word line, and a second word line,
the first word line and the second word line respectively being connected to the first cell transistor and the second cell transistor,
the nonvolatile memory being configured to write any one data value among one or more data values into each of the first cell transistor and the second cell transistor; and
a controller configured to:
instruct the nonvolatile memory to apply a first verify voltage to the first word line for determining whether writing of a first data value into the first cell transistor by using a first programming voltage has been completed, the first data value being one of the one or more data values; and
instruct the nonvolatile memory to apply a second verify voltage to the second word line for determining whether writing of the first data value into the second cell transistor by using the first programming voltage has been completed, the second verify voltage being different in a voltage level from the first verify voltage.
2. The memory system according to claim 1 , wherein
the nonvolatile memory comprises a plurality of word lines, the plurality of word lines including the first word line and the second word line,
the first word line is a first-end word line of the plurality of word lines,
the plurality of word lines includes a second-end word line located on a side opposite to the first-end word line in the plurality of word lines, and
the second word line is located between the first-end word line and the second-end word line.
3. The memory system according to claim 2 , wherein
the nonvolatile memory comprises a string of cell transistors that are electrically connected in series, the cell transistors including the first cell transistor and the second cell transistor, and
the first-end word line is located at a first end of the plurality of word lines that are connected to the string.
4. The memory system according to claim 2 , wherein
the first verify voltage is lower than the second verify voltage.
5. The memory system according to claim 1 , wherein
the nonvolatile memory comprises a plurality of word lines, the plurality of word lines including the first word line and the second word line, and the plurality of word lines and insulating layers are stacked alternately in a first direction, and
a size of the first cell transistor in a second direction is smaller than a size of the second cell transistor in the second direction, the second direction being substantially orthogonal to the first direction.
6. The memory system according to claim 5 , wherein
the first verify voltage is lower than the second verify voltage.
7. The memory system according to claim 1 , wherein
the nonvolatile memory comprises a plurality of cell transistors, the plurality of cell transistors including the first cell transistor and the second cell transistor,
the first verify voltage is used in a state where the controller determines that an average wear of the plurality of cell transistors is in a first wear range, and
the controller is configured to instruct the nonvolatile memory to apply a fifth verify voltage to the first word line for determining whether writing of the first data value into the first cell transistor has been completed in a state where the controller determines that the average wear of the plurality of cell transistors is in a second wear range, the fifth verify voltage being different in the voltage level from the first verify voltage, the second wear range being different from the first wear range.
8. The memory system according to claim 7 , wherein
the average wear of the plurality of cell transistors in the second wear range is more severe than the average wear of the plurality of cell transistors in the first wear range, and
the fifth verify voltage is higher than the first verify voltage.
9. The memory system according to claim 1 , wherein
the controller is further configured to:
instruct the nonvolatile memory to apply the first verify voltage to the first word line by transmitting a first adjustment value or a value acquired by using the first adjustment value to the nonvolatile memory; and
instruct the nonvolatile memory to apply the second verify voltage to the second word line by transmitting a second adjustment value or a value acquired by using the second adjustment value to the nonvolatile memory.
10. The memory system according to claim 9 , wherein
the first verify voltage has a voltage level adjusted on the basis of the first adjustment value and a first common reference value, and the second verify voltage has a voltage level adjusted on the basis of the second adjustment value and the first common reference value.
11. The memory system according to claim 10 , wherein
the controller is further configured to:
instruct the nonvolatile memory to apply, to the first word line, a third verify voltage that has a voltage level adjusted on the basis of the first adjustment value and a second common reference value for determining whether writing of a second data value into the first cell transistor has been completed, the second data value being one of the one or more data values and different from the first data value; and
instruct the nonvolatile memory to apply, to the second word line, a fourth verify voltage that has a voltage level adjusted on the basis of the second adjustment value and the second common reference value for determining whether writing of the second data value into the second cell transistor has been completed.
12. The memory system according to claim 10 , wherein
the controller is further configured to:
instruct the nonvolatile memory to apply, to the first word line, a third verify voltage that has a voltage level adjusted on the basis of a third adjustment value and a second common reference value for determining whether writing of a second data value into the first cell transistor has been completed, the second data value being one of the one or more data values and different from the first data value; and
instruct the nonvolatile memory to apply, to the second word line, a fourth verify voltage that has a voltage level adjusted on the basis of a fourth adjustment value and the second common reference value for determining whether writing of the second data value into the second cell transistor has been completed.
13. The memory system according to claim 9 , wherein
the nonvolatile memory comprises a plurality of word lines, the plurality of word lines including the first word line and the second word line,
the controller comprises a memory to store, at least temporarily, information associating a plurality of adjustment values with the plurality of word lines, the plurality of adjustment values including the first adjustment value and the second adjustment value, and
the controller is configured to acquire the first adjustment value corresponding to the first word line and the second adjustment value corresponding to the second word line from the information.
14. A memory system comprising:
a nonvolatile memory comprising a first cell transistor, a second cell transistor, a first word line, and a second word line which is not adjacent to the first word line,
the first word line and the second word line respectively being connected to the first cell transistor and the second cell transistor,
the nonvolatile memory being configured to write any one data value among one or more data values into each of the first cell transistor and the second cell transistor; and
a controller configured to:
instruct the nonvolatile memory to apply a first verify voltage to the first word line for determining whether writing of a first data value into the first cell transistor has been completed, the first data value being one of the one or more data values; and
instruct the nonvolatile memory to apply a second verify voltage to the second word line for determining whether writing of the first data value into the second cell transistor has been completed, the second verify voltage being different in a voltage level from the first verify voltage.
15. The memory system according to claim 14 , wherein
the first verify voltage is adjusted on the basis of at least one adjustment value.
16. The memory system according to claim 14 , wherein
the nonvolatile memory comprises a plurality of word lines, the plurality of word lines including the first word line and the second word line,
the first word line is a first-end word line of the plurality of word lines,
the plurality of word lines includes a second-end word line located on a side opposite to the first-end word line in the plurality of word lines, and
the second word line is located between the first-end word line and the second-end word line.
17. The memory system according to claim 14 , wherein
the nonvolatile memory further comprises a third word line located between the first word line and the second word line.
18. The memory system according to claim 14 , wherein
the nonvolatile memory further comprises a third cell transistor and a third word line, the third word line being connected to the third cell transistor, and
the controller is further configured to instruct the nonvolatile memory to apply a third verify voltage to the third word line for determining whether writing of the first data value into the third cell transistor has been completed, the third verify voltage being different in the voltage level from the first verify voltage and the second verify voltage.
19. A method for controlling a memory system, the memory system comprising a nonvolatile memory configured to write any one data value among one or more data values into each of a first cell transistor and a second cell transistor, the nonvolatile memory including a first word line connected to the first cell transistor, a second word line connected to the second cell transistor, and a third word line located between the first word line and the second word line,
the method comprising:
applying a first verify voltage to the first word line for determining whether writing of a first data value into the first cell transistor has been completed, the first data value being one of the one or more data values; and
applying a second verify voltage to the second word line for determining whether writing of the first data value into the second cell transistor has been completed, the second verify voltage being different in a voltage level from the first verify voltage.
20. The method for controlling the memory system according to claim 19 , wherein
the nonvolatile memory comprises a plurality of word lines, the plurality of word lines including the first word line and the second word line,
the first word line is a first-end word line of the plurality of word lines,
the plurality of word lines includes a second-end word line located on a side opposite to the first-end word line in the plurality of word lines, and
the second word line is located between the first-end word line and the second-end word line.