High gamma disc-tuning probes for impedance tuners
View Patent ↗High GAMMA disc-shaped tuning probes for high frequency electro-mechanical slide screw impedance tuners use a notch slug concept, whereby the head of the tuning probes is split in two distinct lobes in a static pre-matching configuration. The disc-probes rotate around an axis perpendicular to the axis of the slotted airline of the tuner and do not require a cumbersome vertical axis. The rotation moves the tuning lobes gradually into the slot of the airline and controls the amplitude of the reflection factor through increasing coupling. The disc-probes comprise two diametrical opposite tuning lob assemblies designed to create high reflection (GAMMA) at two distinct frequency bands, one for high end frequencies and one for low end frequencies.
1. Disc-shaped notched tuning probes for slide screw tuners,
comprising
an approximately circular core disc with a protruding notched tuning segment,
wherein
the segment comprises two lobes each having a concave peripheral groove,
and wherein the slide screw tuners comprise,
an input port and an output port and a slabline between the ports, said slabline having two parallel sidewalls and a center conductor, and
at least one remotely controlled mobile carriage sliding parallel to the axis of the slabline,
and wherein
the disc-probe rotates between the sidewalls, controlled by the carriage,
and wherein
the diameter of the groove matches approximately the diameter of the center conductor, the thickness of the lobes matches the width of the slabline channel, and
the probe rotates approximately around the center of the core disc.
2. Disc-shaped, dual frequency band, notched tuning probes for slide screw tuners,
comprising
an approximately circular core disc with two protruding notched tuning segments #1
and #2 placed approximately diametrically on the periphery of the core,
wherein
each segment comprises two lobes, each having a concave peripheral groove, and wherein the slide screw tuners comprise,
a slabline between an input port and an output port with a channel between two grounded parallel sidewalls and a center conductor, and
at least one remotely controlled mobile carriage sliding parallel to the axis of the slabline,
and wherein
the disc-probe rotates between the sidewalls, controlled by the carriage, and wherein
the diameter of the groove matches approximately the diameter of the center conductor, the thickness of the lobes matches the width of the slabline channel, and
the probe rotates approximately around the center of the core disc.
3. Disc-probes as in claim 1 or 2 , wherein the concave surface of the groove is dielectrically coated.
4. Disc-probes as in claim 1 or 2 , wherein the lobes are sliced in the middle parallel to the disc surface.
5. Slabline, as in claim 1 or 2 ,
wherein inside top corners of the sidewalls are chamfered.
6. Disc-probes as in claim 2 , wherein the lobes of segment #1 are wider than the lobes of segment #2.