IP Library Granted Patent US 10,700,270
Granted Patent B2
US 10,700,270 · App. 15/188,754 · Granted Jun 30, 2020

PCM switch and method of making the same

Inventors: Pavel Borodulin (Baltimore, MD); Nabil Abdel-Meguid El-Hinnawy (Columbia, MD); Robert Miles Young (Ellicott City, MD)
Assignee: NORTHROP GRUMMAN SYSTEMS CORPORATION
H01L45/06H01L45/1206H01L45/1226H01L45/1286H01L45/144H01L45/1666G11C13/0004Y10T29/49105
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Quick Facts
Patent No.
US 10,700,270
App. No.
15/188,754
Granted
Jun 30, 2020
Kind
B2
Abstract

One example includes a method for making a switch. The method includes forming an insulating layer over a substrate. The method also includes forming a resistive heating material over the insulating layer. The method also includes depositing a thermally conductive electrically insulating barrier layer over the heating material. The method also includes forming a phase-change material (PCM) component over the barrier layer spaced apart and proximal to the resistive heating material. The method also includes forming a quench layer proximal to at least one of the resistive heating material and the PCM component. The method further includes forming conductive lines from ends of the PCM component and control lines from ends of the resistive heating material.

Claims (24)

1. A method for making a switch, the method comprising:

forming an insulating layer over a substrate;

forming a quench layer over the insulating layer, the quench layer being adapted to dissipate heat associated with a resistive heating material and a phase-change material (PCM) component, the quench layer being formed as at least one of Silicon (Si), Silicon Carbide (SiC), or diamond;

forming the resistive heating material over the quench layer;

depositing a thermally conductive electrically insulating barrier layer over the resistive heating material;

forming the phase-change material (PCM) component over the barrier layer spaced apart and proximal to the resistive heating material and the quench layer; and

forming conductive lines from ends of the PCM component and control lines from ends of the resistive heating material.

2. The method of claim 1 , wherein forming the quench layer comprises forming the quench layer over the PCM component and the conductive lines.

3. The method of claim 1 , further comprising polishing the quench layer to provide a substantially planar surface of the quench layer on which the resistive heating material is formed.

4. The method of claim 1 , wherein the insulating layer is a first insulating layer, the method further comprising forming a second insulating layer in contact with at least one peripheral surface of the resistive heating material over the quench layer, such that the second insulating layer and the resistive heating material overly the quench layer.

5. The method of claim 1 , wherein forming the quench layer comprises:

forming a first quench layer over the insulating layer;

polishing the first quench layer to provide a substantially planar surface, wherein forming the resistive heating material comprises forming the resistive heating material over the substantially planar surface of the first quench layer; and

forming a second quench layer over the PCM component and the conductive lines.

6. A method for making a switch, the method comprising:

forming an insulating layer over a substrate;

forming a first quench layer over the insulating layer, the first quench layer being formed as one of Silicon (Si), Silicon Carbide (SiC), or diamond;

forming a resistive heating material over the first quench layer;

depositing a thermally conductive electrically insulating barrier layer over the resistive heating material;

forming a phase-change material (PCM) component over the barrier layer spaced apart and proximal to the resistive heating material;

forming conductive lines from ends of the PCM component and control lines from ends of the resistive heating material; and

forming a second quench layer over the resistive heating material and the PCM component, the second quench layer being adapted to dissipate heat associated with at least one of the resistive heating material and the PCM component, the second quench layer being formed as one of Silicon (Si), Silicon Carbide (SiC), or diamond.

7. The method of claim 6 , further comprising polishing the first quench layer to provide a substantially planar surface of the first quench layer on which the resistive heating material is formed.

8. The method of claim 6 , wherein the insulating layer is a first insulating layer, the method further comprising forming a second insulating layer in contact with at least one peripheral surface of the resistive heating material over the first quench layer, such that the second insulating layer and the resistive heating material overly the first quench layer.

Assignments (2)
CONFIRMATORY LICENSE Recorded Feb 19, 2018
From: NORTHROP GRUMMAN SYSTEMS CORPORATION
To: UNITED STATES GOVERNMENT
Reel/Frame 045417/0724 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 21, 2016
From: BORODULIN, PAVEL; EL-HINNAWY, NABIL ABDEL-MEGUID; YOUNG, ROBERT MILES
To: NORTHROP GRUMMAN SYSTEMS CORPORATION
Reel/Frame 038977/0516 →
Continuity (1)
Related Publication 20170365427A1 · Dec 21, 2017
Cited By (4)
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