IP Library › Granted Patent US 1,073,118
Granted Patent S1
US 1,073,118 · App. 29/935,284 · Granted Apr 29, 2025

Temperature test chamber

Inventors: Yanfeng Liu (Hunan, CN); Jiaxiong Shuai (Guangdong, CN); Quan Dai (Guangdong, CN)
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Quick Facts
Patent No.
US 1,073,118
App. No.
29/935,284
Granted
Apr 29, 2025
Kind
S1
Claims (1)

The ornamental design for a temperature test chamber, as shown and described.

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