IP Library Granted Patent US 10,731,972
Granted Patent B2
US 10,731,972 · App. 16/462,187 · Granted Aug 4, 2020

Instantaneous phase mapping deflectometry

Inventors: Dae Wook Kim (Tucson, AZ); Isaac Trumper (Tucson, AZ)
Assignee: Arizona Board of Regents on Behalf of the University of Arizona
G01B11/2441
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Quick Facts
Patent No.
US 10,731,972
App. No.
16/462,187
Granted
Aug 4, 2020
Kind
B2
Abstract

Provided are instantaneous phase mapping deflectometry measurement systems and methods based on multiplexing phase shifted fringe patterns with color, and decomposing them in X and Y using Fourier techniques. The new methods and devices provide accurate measurements, and more robust tools with less uncertainty when reconstructing a surface (e.g., compared to prior art Fourier Transform Profilometry (FTP) methods). The systems and methods revolutionize the applications of deflectometry by enabling measuring dynamic events (e.g., in high vibration environments, and a host of other previously impossible scenarios), and including environmental changes to the bending modes of large optics. Methods of error correction applicable to the new methods and devices are also provided.

Claims (60)

1. A non-contact instantaneous phase mapping deflectometry system to measure a surface, comprising:

a display positioned proximate a first side of a surface to be measured;

a display pattern generator configured to generate a multiplexed pattern to display on the display, the multiplexed display pattern comprising, in each of two orthogonal directions, at least three fringe patterns, each fringe pattern comprising a plurality of fringes sufficient to provide a carrier frequency such that component x and y fringes are distinguishable in Fourier domain and each fringe pattern having distinct color-encoded phase shift information to provide a distinctly multiplexed display pattern comprising, in each of two orthogonal directions, a phase-shifted multiplexed fringe pattern having distinct color-encoded phase shift information;

an imaging device positioned to detect an input image comprising at least a portion of the phase-shifted multiplexed fringe pattern after interaction with the surface, and to generate an electronic image thereof, the imaging device having at least three separately readable color channels to obtain at least three respective sets of data corresponding to at least three phase shifts to provide at least three phase-shifted images; and

an image analyzer configured to analyze each of the at least three phase-shifted images by Fourier transform to provide distinct peaks in the Fourier domain at locations corresponding to the carrier frequencies of the fringes in the x and y directions, the image analyzer configured to apply filters or masks that isolate only x or y frequencies to decompose each of the at least three phase-shifted images into two separate one-directional fringe images, the image analyzer configured to apply an inverse Fourier transform to the filtered data to reconstruct the one-directional fringe patterns that made up the input image to provide, based on a single input image, at least six unique outputs corresponding to the at least three phase shift fringe patterns in both orthogonal directions required for reconstruction of the surface.

2. The system of claim 1 , wherein no information is eliminated from raw measurement data during the Fourier domain processing.

3. The system of claim 1 , wherein the system is further configured to:

generate four data sets comprising two wrapped phases and corresponding modulation, one in each direction;

unwrap the phases to convert the phases to slope data given in two directions; and

integrate the slope data to obtain a reconstructed surface.

4. The system of claim 1 , wherein the at least three phase-shifted images comprise red, green, and blue phase-shifted images.

5. The system of claim 1 , wherein a geometry of the system is configured to be adjustable either by tilting or translating the display screen and the imaging device until a set of measured fringes are obtained that enable removal of an ambiguity in the Fourier domain or fringe direction.

6. The system of claim 1 , wherein the system is further configured to:

compute a difference between a conventional phase shifting measurement and an instantaneous measurement for a common nominal state to provide a difference map; and

apply the difference map as a correction in a surface height domain of a dynamic data set to remove spatial frequency errors.

7. A non-contact instantaneous phase mapping deflectometry system to measure a surface, comprising:

a programmable display screen that is programmed to display a phase-shifted multiplexed fringe pattern having, in each of two orthogonal directions, distinct color-encoded phase shift information, such that upon the screen being placed at a known distance in front of a specular surface, the display screen is operable to produce an input pattern reflected from the surface;

an imaging device located proximate the display screen and focused on the surface, the imaging device configured to generate an output image to provide slope information in two orthogonal directions based on a single input image comprising at least a portion of the input pattern reflected from the surface; and

a computing device configured to calculate slopes of the surface based on the slope information and to integrate the slopes to give the surface topography, wherein the computing device is further configured to:

compute a difference between a conventional phase shifting measurement and an instantaneous measurement for a common nominal state to provide a difference map; and

apply the difference map as a correction in a surface height domain of a dynamic data set to remove spatial frequency errors.

8. The system of claim 7 , wherein the imaging device is positioned to detect the input image, and to generate an electronic image thereof, the imaging device having at least three separately readable color channels to obtain at least three respective sets of data corresponding to the color-encoded phase shift information to provide at least three phase-shifted images, and wherein the system is configured to analyze each of the at least three phase-shifted images by Fourier transform to provide distinct peaks in the Fourier domain at the locations corresponding to the carrier frequencies of the display fringes in the x and y directions, the system configured to apply filters or masks that isolate only the x or y frequency to decompose each of the at least three phase-shifted images into two separate one-directional fringe images, the system configured to apply an inverse Fourier transform to the filtered data to reconstruct the one-directional fringe patterns that made up the input image to provide, based on a single input image, at least six unique outputs in both orthogonal directions required for reconstruction of the surface.

9. The system of claim 7 , wherein the system is further configured to:

generate four data sets comprising two wrapped phases and corresponding modulation, one in each direction;

unwrap the phases to convert the phases to slope data given in two directions; and

integrate the slope data to obtain a reconstructed surface.

10. The system of claim 7 , wherein the plurality of fringes is sufficient to provide a carrier frequency such that the component x and y fringes are distinguishable in the Fourier domain.

11. The system of claim 8 , wherein the at least three phase-shifted images comprise red, green, and blue phase-shifted images.

12. The system of claim 7 , wherein a geometry of the system is configured to be adjustable either by tilting or translating the display screen and the imaging device until a set of measured fringes are obtained to enable removal of an ambiguity in the Fourier domain or fringe direction.

13. The system of claim 7 , wherein no information is eliminated from raw measurement data during the Fourier domain processing.

14. A non-contact instantaneous phase mapping deflectometry method to measure a surface, comprising:

positioning a display proximate a first side of a surface to be measured;

generating a multiplexed pattern to display on the display, the multiplexed display pattern comprising, in each of two orthogonal directions, at least three fringe patterns, each fringe pattern comprising a plurality of fringes sufficient to provide a carrier frequency such that component x and y fringes are distinguishable in Fourier domain and each fringe pattern having distinct color-encoded phase shift information to provide a distinctly multiplexed display pattern comprising, in each of two orthogonal directions, a phase-shifted multiplexed fringe pattern having distinct color-encoded phase shift information;

detecting, using an imaging device, an input image comprising at least a portion of the phase-shifted multiplexed fringe pattern after interaction with the surface to obtain at least three respective sets of data corresponding to the color-encoded phase shift information to provide at least three phase-shifted images;

analyzing the at least three phase-shifted images by Fourier transform to provide distinct peaks in the Fourier domain at the locations corresponding to the carrier frequencies of the fringes in the x and y directions;

filtering or masking to isolate only x or y frequencies to decompose each of the at least three phase-shifted images into two separate one-directional fringe images; and

applying an inverse Fourier transform to the filtered data to reconstruct the one-directional fringe patterns that made up the input image to provide, based on a single input image, at least six unique outputs corresponding to the at least three phase shift fringe patterns in both orthogonal directions required for reconstruction of the surface.

15. The method of claim 14 , wherein no information is eliminated from raw measurement data during the Fourier domain processing.

16. The method of claim 14 , further comprising:

generating four data sets comprising two wrapped phases and corresponding modulation, one in each direction;

unwrapping the phases to convert the phases to slope data given in two directions; and

integrating the slope data to obtain a reconstructed surface.

17. The method of claim 14 , wherein the at least three phase-shifted images comprise red, green, and blue phase-shifted images.

18. The method of claim 14 , further comprising:

computing a difference between a conventional phase shifting measurement and an instantaneous measurement for a common nominal state to provide a difference map; and

applying the difference map as a correction in a surface height domain of a dynamic data set to remove spatial frequency errors.

19. A non-contact instantaneous phase mapping deflectometry method to measure a surface, comprising:

displaying, on a display screen, a phase-shifted multiplexed fringe pattern having, in each of two orthogonal directions, distinct color-encoded phase shift information, such that upon the screen being placed at a known distance in front of a specular surface, the display screen is operable to produce an input pattern reflected from the surface;

generating an output image, using an imaging device located proximate the display screen and focused on the surface, to provide slope information in two orthogonal directions based on a single input image comprising at least a portion of the input pattern reflected from the surface;

calculating, using a computing device, slopes of the surface and integrating the slopes to give the surface topography;

computing a difference between a conventional phase shifting measurement and an instantaneous measurement for a common nominal state to provide a difference map; and

applying the difference map as a correction in a surface height domain of a dynamic data set to remove spatial frequency errors.

20. The method of claim 19 , wherein the imaging device is positioned to detect the input image, and to generate an electronic image thereof, the imaging device having at least three separately readable color channels to obtain at least three respective sets of data corresponding to the color-encoded shift information to provide at least three phase-shifted images, and wherein the system is configured to analyze each of the at least three phase-shifted images by Fourier transform to provide distinct peaks in the Fourier domain at the locations corresponding to the carrier frequencies of the display fringes in the x and y directions, the system configured to apply filters or masks that isolate only the x or y frequency to decompose each of the at least three phase-shifted images into two separate one-directional fringe images, the system configured to apply an inverse Fourier transform to the filtered data to reconstruct the one-directional fringe patterns that made up the input image to provide, based on a single input image, at least six unique outputs in both orthogonal directions required for reconstruction of the surface.

21. The method of claim 19 , further comprising:

generating four data sets comprising two wrapped phases and corresponding modulation, one in each direction;

unwrapping the phases to convert the phases to slope data given in two directions; and

integrating the slope data to obtain a reconstructed surface.

22. The method of claim 19 , wherein the plurality of fringes is sufficient to provide a carrier frequency such that the component x and y fringes are distinguishable in the Fourier domain.

23. The method of claim 20 , wherein the at least three phase-shifted images comprise red, green, and blue phase-shifted images.

24. The method of claim 19 , wherein no information is eliminated from raw measurement data during the Fourier domain processing.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 17, 2019
From: KIM, DAE WOOK; TRUMPER, ISAAC
To: ARIZONA BOARD OF REGENTS ON BEHALF OF THE UNIVERSITY OF ARIZONA
Reel/Frame 050400/0607 →
Continuity (2)
Provisional Application 62424362 · Nov 18, 2016
Related Publication 20190316898A1 · Oct 17, 2019