IP Library Granted Patent US 10,740,913
Granted Patent B2
US 10,740,913 · App. 15/907,242 · Granted Aug 11, 2020

Ultrafast, robust and efficient depth estimation for structured-light based 3D camera system

Inventors: Lilong Shi (Pasadena, CA); Seunghoon Han (Seoul, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
G06T7/521G01B11/2513G06K9/6202H04N13/254H04N13/271G06T2207/10028H04N13/207H04N2013/0081
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Quick Facts
Patent No.
US 10,740,913
App. No.
15/907,242
Granted
Aug 11, 2020
Kind
B2
Abstract

A system and a method are disclosed for a structured-light system to estimate depth in an image. An image is received in which the image is of a scene onto which a reference light pattern has been projected. The projection of the reference light pattern includes a predetermined number of particular sub-patterns. A patch of the received image and a sub-pattern of the reference light pattern are matched based on either a hardcode template matching technique or a probability that the patch corresponds to the sub-pattern. If a lookup table is used, the table may be a probability matrix, may contain precomputed correlations scores or may contain precomputed class IDs. An estimate of depth of the patch is determined based on a disparity between the patch and the sub-pattern.

Claims (27)

1. A method for a structured-light system to estimate depth in an image, the method comprising:

receiving the image, the image being of a scene onto which a reference light pattern has been projected, the image including a projection of the reference light pattern, and the reference light pattern comprising a predetermined number of particular sub-patterns;

matching a patch of the image and a sub-pattern of the reference light pattern based on a probability that the patch corresponds to the sub-pattern, the patch comprising a predetermined number of pixels, and the probability being contained in a lookup table that comprises a probability matrix, matching the patch and the sub-pattern further comprises:

binarizing the pixels comprising the patch;

forming a vector from the pixels; and

determining a class of the patch by multiplying the vector of the pixels by the probability matrix to form a histogram representing probabilities that the patch is a particular sub-pattern of the reference light pattern; and

determining an estimate of depth of the patch based on a disparity between the patch and the sub-pattern.

2. The method of claim 1 , wherein the predetermined number of pixels comprising the patch is 16.

3. The method of claim 1 , wherein the probability matrix is formed based on Bayes' rule, by linear optimization or by a neural network.

4. A method for a structured-light system to estimate depth in an image, the method comprising:

receiving the image, the image being of a scene onto which a reference light pattern has been projected, the image including a projection of the reference light pattern, and the reference light pattern comprising a predetermined number of particular sub-patterns;

binarizing at least one patch of the image, the patch comprising a predetermined number of pixels;

matching the binarized patch and a sub-pattern of the reference light pattern based on a probability that the binarized patch corresponds to the sub-pattern, the probability that the binarized patch corresponds to the sub-pattern being contained in a lookup table that comprises a probability matrix, matching the binarized patch and the sub-pattern further comprises:

forming a vector from the binarized patch; and

determining a class of the patch by multiplying the vector of the binarized patch by the probability matrix to form a histogram representing probabilities that the patch is a particular sub-pattern of the reference light pattern; and

determining an estimate of depth of the at least one patch based on a disparity between the patch and the sub-pattern.

5. The method of claim 4 , wherein the probability matrix is formed based on Bayes' rule, by linear optimization or by a neural network.

6. The method of claim 4 , wherein matching the binarized patch and the sub-pattern further comprises using the binarized patch to access an entry in the lookup table that represents the probability that the patch corresponds to the sub-pattern.

7. The method of claim 6 , wherein each entry of the lookup table represents a correlation score of the probability the patch corresponds to each of the respective sub-patterns.

8. The method of claim 6 , wherein each entry of the lookup table represents a class identification of each respective sub-pattern.

9. A method for a structured-light system to estimate depth in an image, the method comprising:

receiving the image, the image being of a scene onto which a reference light pattern has been projected, the image including a projection of the reference light pattern, and the reference light pattern comprising a predetermined number of particular sub-patterns;

dividing the image into a plurality of patches by a predetermined window that slides over the image to form each individual patch of the plurality of patches, each patch comprising a predetermined number of pixels;

binarizing pixels comprising each patch of the plurality of patches;

using the binarized piels of each patch to access an entry in a lookup table to obtain a sub-pattern identification for the patch;

generating a probability histogram for the image using a voting process based on the sub-pattern identifications obtained for the patches of the plurality of patches; and

determining an estimate of depth of the patch based on a disparity between the patch and a sub-pattern selected from the probability histogram generated by the voting process.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 27, 2018
From: SHI, LILONG; HAN, SEUNGHOON
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 045057/0316 →
Continuity (2)
Provisional Application 62597904 · Dec 12, 2017
Related Publication 20190180459A1 · Jun 13, 2019
Cited By (7)
US 12,495,214 US 12,586,226 US 12,593,131 US 12,596,076 US 12,602,808 US 12,610,116 US 12,675,869