Spectroscopic chemical analysis methods and apparatus
Spectroscopic chemical analysis methods and apparatus are disclosed which employ deep ultraviolet (e.g. in the 200 nm to 300 nm spectral range) electron beam pumped wide bandgap semiconductor lasers, incoherent wide bandgap semiconductor light emitting devices, and hollow cathode metal ion lasers to perform non-contact, non-invasive detection of unknown chemical analytes. These deep ultraviolet sources enable dramatic size, weight and power consumption reductions of chemical analysis instruments. In some embodiments, Raman spectroscopic detection methods and apparatus use ultra-narrow-band angle tuning filters, acousto-optic tuning filters, and temperature tuned filters to enable ultra-miniature analyzers for chemical identification. In some embodiments Raman analysis is conducted along with photoluminescence spectroscopy (i.e. fluorescence and/or phosphorescence spectroscopy) to provide high levels of sensitivity and specificity in the same instrument.
1. An apparatus for providing chemical analysis, comprising:
a) a package;
b) a source of excitation radiation located within the package, configured to direct excitation radiation onto a sample location that is external to the package, wherein the excitation radiation has a wavelength less than 300 nm;
c) at least one optical element configured to receive emission radiation coming from the sample location, wherein the emission radiation arises from the excitation radiation, and wherein the at least one optical element within the package directs the emission radiation along at least one detection path within the package;
d) at least one detector within the package to detect the emission radiation at at least one location along the detection path;
e) at least one controller configured to control operation of the source, and the detector, and
f) at least one analyzer configured to determine whether the detected emission radiation corresponds to a chemical compound of interest,
wherein the controller and analyzer are selected from the group consisting of: (1) multiple electronic components, (2) a single electronic component that provides both control and analysis, (3) multiple programmable electronic components, and (4) a single programmable electron component and
wherein source and controller are configured to provide pulses of excitation radiation and wherein the at least one detector and controller are configured to make a plurality of temporally spaced detections in a manner synchronized with the timing of the pulses of excitation radiation.
2. The apparatus of claim 1 wherein the controller, the at least one detector, and the source are configured to provide for detection of emission radiation between pulses of applied excitation radiation.
3. The apparatus of claim 1 wherein the controller, the at least one detector and the source are configured to provide for detection of emission radiation during pulses of excitation radiation from the source.
4. The apparatus of claim 1 wherein the controller, the at least one detector and the source are configured to provide a plurality of detection of emission radiation between two consecutive pulses of excitation radiation from the source wherein the detections are provided with a relative timing selected from the group consisting of: (1) relative to the initiation of a pulse and (2) relative to the termination of each pulse.
5. The apparatus of claim 1 wherein the source comprises a device selected from the group consisting of: (1) a hollow cathode laser; (2) an LED, (3) an LET, (4) a semiconductor laser, and (5) an e-beam pumped semiconductor laser.
6. The apparatus of claim 1 wherein the source provides excitation radiation at a wavelength less than 280 nm.
7. The apparatus of claim 1 wherein the source provides excitation radiation at a wavelength less than 250 nm.
8. The apparatus of claim 1 additionally comprising a battery located within the package for powering the source, the detector, the at least one controller, and the at least one analyzer.
9. The apparatus of claim 1 wherein the emission radiation comprises native fluorescence emission radiation.
10. The apparatus of claim 1 wherein the emission radiation is selected from the group consisting of: (1) native fluorescence emission radiation, (2) Raman emission radiation, (3) phosphorescence emission radiation, (4) Rayleigh scattering, and (5) luminescence emission radiation.
11. The apparatus of claim 1 wherein the emission radiation is selected from the group consisting of at least two of: (1) native fluorescence emission radiation, (2) Raman emission radiation, (3) phosphorescence emission radiation, and (4) Rayleigh scattering.
12. The apparatus of claim 1 wherein the at least one detector comprises a plurality of detectors that receive the emission radiation from the sample location without use of a dispersive optical element.
13. The apparatus of claim 1 wherein the at least one detector comprises a plurality of detectors that receive the emission radiation from the sample location using a tunable optical element.
14. The apparatus of claim 1 wherein the sample location comprising a manufacturing surface.
15. The apparatus of claim 1 wherein the manufacturing surface comprises a surface in pharmaceutical manufacturing.
16. The apparatus of claim 1 wherein the manufacturing surface comprises a surface in food manufacturing.