IP Library › Granted Patent US 1,078,497
Granted Patent S1
US 1,078,497 · App. 29/825,987 · Granted Jun 10, 2025

Measuring device assembly

Inventor: Israel Michael Debro (Redondo Beach, CA)
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 1,078,497
App. No.
29/825,987
Granted
Jun 10, 2025
Kind
S1
Claims (1)

The ornamental design for a measuring device assembly as shown and described.

References Cited (22)
US 4756089A · Danielsson, III · 1988 [cited by examiner]
US D373735S · Kurisaki · 1996 [cited by examiner]
US D373736S · Kurisaki · 1996 [cited by examiner]
US D375906S · Negrotti · 1996 [cited by examiner]
US 5777562A · Hoffman · 1998 [cited by applicant]
US D700082S · Travis · 2014 [cited by examiner]
US D798753S · Iwata · 2017 [cited by examiner]
US D821232S · Ewringmann · 2018 [cited by examiner]
US D826753S · Tam · 2018 [cited by examiner]
US D871946S · Kleemann · 2020 [cited by examiner]
US D926607S · Vroonen · 2021 [cited by examiner]
US D941689S · Park · 2022 [cited by examiner]
US D1029664S · Oikonomopoulos · 2024 [cited by examiner]
US D1030525S · Oikonomopoulos · 2024 [cited by examiner]
US 12073275B1 · Fiore · 2024 [cited by examiner]
US D1042177S · Vogt · 2024 [cited by examiner]
US 20040117999A1 · Bennison · 2004 [cited by examiner]
US 20050206910A1 · Schroeder · 2005 [cited by examiner]
US 20100308806A1 · Ichikura · 2010 [cited by examiner]
US 20140353071A1 · Ando · 2014 [cited by examiner]
US 20180087932A1 · Kikuchi · 2018 [cited by examiner]
US 20230375320A1 · Milewicz · 2023 [cited by examiner]