IP Library › Granted Patent US 1,079,507
Granted Patent S1
US 1,079,507 · App. 29/927,118 · Granted Jun 17, 2025

Tester

Inventor: Minqing Ying (Jinan, CN)
Assignee: JiNan Huiquan Electronic Co., LTD.
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Quick Facts
Patent No.
US 1,079,507
App. No.
29/927,118
Granted
Jun 17, 2025
Kind
S1
Claims (1)

The ornamental design for a tester, as shown and described.

References Cited (5)
US D961413S · Yu · 2022 [cited by examiner]
US D974202S · Yu · 2023 [cited by examiner]
US D1000974S · Lin · 2023 [cited by examiner]
US 12111304B2 · Murray · 2024 [cited by examiner]
US 12203916B2 · Meissner · 2025 [cited by examiner]