Test handler head having reverse funnel design
A test head for a semiconductor device handler includes a plunger; and a funnel insert attached to the plunger via a funnel insert spring, the funnel insert having a channel extending axially therethrough, and the funnel insert including a plurality of sloped inner walls that are sloped outwardly in a distal direction of the funnel insert and configured to contact upper edges of a semiconductor device to center the semiconductor device in the funnel insert. The plunger includes a projecting portion that extends through the channel of the funnel insert. When the spring is in an uncompressed state, a distal end of the funnel insert extends past a distal end of the projecting portion of the plunger.
1. A test head for a semiconductor device handler, the test head comprising:
a plunger; and
a funnel insert movably attached to and vertically movable relative to the plunger via a funnel insert spring, the funnel insert having a channel extending axially therethrough, and the funnel insert including a plurality of sloped inner walls, wherein the plurality of sloped inner walls are sloped outwardly in a distal direction of the funnel insert toward a distal end of the funnel insert and are configured to contact upper edges of a semiconductor device to center the semiconductor device in the funnel insert,
wherein the plunger includes a projecting portion that extends through the channel of the funnel insert, and
wherein, when the spring is in an uncompressed state, the distal end of the funnel insert extends past a distal end of the projecting portion of the plunger.
2. The test head of claim 1 , further comprising:
a nest body having an inner flange at a distal end thereof;
a spring retainer plate attached to the nest body; and
a plunger spring,
wherein the plunger further includes a plate portion,
wherein the plunger spring is disposed between a lower surface of the spring retainer plate and an upper surface of the plate portion of the plunger, such that the plunger spring presses the plunger against an upper surface of the inner flange of the nest body, and
wherein a spring constant of the funnel insert spring is lower than a spring constant of the plunger spring.
3. The test head of claim 1 , wherein the plunger further includes an annular groove in which the funnel insert spring is disposed.
4. The test head of claim 1 ,
wherein the plunger has a channel extending axially therethrough, the channel of the plunger communicating with the channel of the funnel insert, and
the test head further comprises a vacuum input port disposed at a proximal end of the plunger, the vacuum input port being configured to supply a vacuum to the channels of the plunger and funnel insert.
5. The test head of claim 1 , wherein the funnel insert further includes a plurality of sloped outer walls that are sloped inwardly in a distal direction of the funnel insert.
6. A test handler including:
the test head of claim 5 , and
an input shuttle comprising:
a recess, and
a floating pocket disposed in the recess and comprising a device recess configured to hold the semiconductor device,
wherein the device recess is defined by sloped side walls that are sloped inwardly towards a bottom of the recess, the sloped side walls of the device recess corresponding to the sloped outer walls of the funnel insert.
7. A test head for a semiconductor device handler, the test head comprising:
a plunger;
a funnel insert movably attached to the plunger via a funnel insert spring, the funnel insert having a channel extending axially therethrough, and the funnel insert including a plurality of sloped inner walls that are sloped outwardly in a distal direction of the funnel insert and configured to contact upper edges of a semiconductor device to center the semiconductor device in the funnel insert;
a nest body having an inner flange at a distal end thereof;
a spring retainer plate attached to the nest body; and
a plunger spring,
wherein the plunger includes
a projecting portion that extends through the channel of the funnel insert,
a plate portion, and
an elongated portion extending proximally from the plate portion and extending through an opening in the spring retainer plate, and
wherein, when the funnel insert spring is in an uncompressed state, a distal end of the funnel insert extends past a distal end of the projecting portion of the plunger,
wherein the plunger spring is disposed between a lower surface of the spring retainer plate and an upper surface of the plate portion of the plunger, such that the plunger spring presses the plunger against an upper surface of the inner flange of the nest body, and
wherein a spring constant of the funnel insert spring is lower than a spring constant of the plunger spring.