Patent Assignment
Reel/Frame 047640/0566
Patent Security Agreement
Recorded: 2018-10-01
Pages: 18
Assignor
DELTA DESIGN, INC.
Executed: 2018-10-01
Assignee
DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
60 WALL STREET, NEW YORK, NEW YORK, 10005
Covered Properties
(90)
Method of Thermally Coupling an Electronic Device to a Heat Exchange Member While Said Electronic Device Is Being Tested
Patent:
5,918,665 →
Application:
09/173,580 →
Mechanical Assembly for Regulating the Temperture of an Electronic Device Which Incorporates a Heat Exchanger That Contacts an Entire Planar Face on the Device Except for Its Corners
Patent:
6,196,299 →
Application:
09/210,259 →
Mechanical Assembly for Regulating the Temperature of an Electronic Device Which Incorporates at Least Two Leaf Springs for Self-Alignment Plus a Low Initial Contact Force and a Low Profile
Patent:
6,179,047 →
Application:
09/210,264 →
Apparatus, Method and System of Liquid-Based, Wide Range, Fast Response Temperature Control of Electronic Device
Patent:
6,389,225 →
Application:
09/352,762 →
Electronic System for Testing a Set of Multiple Chips Concurrently or Sequentially in Selectable Subsets Under Program Control to Limit Chip Power Dissipation
Patent:
6,363,504 →
Application:
09/386,945 →
Electronic System for Testing Chips Having a Selectable Number of Pattern Generators That Concurrently Broadcast Different Bit Streams to Selectable Sets of Chip Driver Circuits
Patent:
6,363,510 →
Application:
09/386,946 →
Program Storage Device Containing Instructions That Are Spaced Apart by Unused Bits That End on Word Boundaries and Which Generate Chip Testing Bit Streams of Any Length
Patent:
6,405,150 →
Application:
09/387,197 →
Multi-Stage Algorithmic Pattern Generator for Testing Ic Chips
Patent:
6,415,408 →
Application:
09/432,965 →
System for Testing Ic Chips Selectively with Stored or Internally Generated Bit Streams
Patent:
6,415,409 →
Application:
09/432,966 →
Electromechanical apparatus for testing IC chips using first and second sets of substrates which are pressed together
Patent:
6,307,388 →
Application:
09/511,789 →
Planar Subassembly for Testing Ic Chips Having Faces with Pressed Electrical Contacts That Carry All Power and Signals for the Chips
Pivoting springy mechanism that opens and closes pressed electrical contacts with a force which is nearly constant over a range of closed positions
Patent:
6,307,391 →
Application:
09/511,791 →
Apparatus for testing IC Chips using a sliding springy mechanism which exerts a nearly constant force
Patent:
6,325,662 →
Application:
09/511,792 →
System for Regulating the Temperature of Ic-Chips with a Fluid Which Is Heated and Cooled as a Function of the Fluid Temperatures to and from Heat Exchangers for the Ic-Chips
Patent:
6,412,551 →
Application:
09/574,784 →
System for regulating the temperature of ic-chips with a fluid whose temperature is controlled quickly by a slow response cooler and a fast response heater
Patent:
6,362,944 →
Application:
09/575,346 →
Apparatus and Method for Temperature Control of Ic Device During Test
Patent:
6,549,026 →
Application:
09/616,895 →
Connector for making multiple pressed co-axial connections having an air dielectric
Patent:
6,247,939 →
Application:
09/639,308 →
Connector for sending power to an IC-chip thru four pressed joints in series
Patent:
6,302,703 →
Application:
09/686,039 →
Connector for sending power to an ic-chip thru two pressed joints in series
Patent:
6,336,815 →
Application:
09/754,507 →
Temperature Control Device for an Electronic Component
Apparatus and Method for Controlling the Temperature of an Electronic Device Under Test
Integrated Circuit Cooling Apparatus
Apparatus and Method for Controlling the Temperature of an Integrated Circuit Device
Method of Fabricating an Alloy Film on a Face of a Heat Exchanger for an Integrated Circuit
Mechanical Assembly for Fabricating an Alloy Film on a Face of a Heat Exchanger for an Integrated Circuit
Patent:
6,478,076 →
Application:
09/912,842 →
Integrated Circuit Tester Having a Fail-Safe Mechanism for Moving Ic-Chips
Patent:
6,581,486 →
Application:
09/976,416 →
Apparatus, Method and System of Liquid-Based, Wide Range, Fast Response Temperature Control of Electric Devices
Method of Fabricating a Heat Exchanger, for Regulating the Temperature of Multiple Integrated Cicuit Modules, Having a Face of a Solid Malleable Metal Coated with a Release Agent
Patent:
6,658,736 →
Application:
10/215,992 →
Apparatus, Method and System of Liquid-Based, Wide Range, Fast Response Temperature Control of Electric Devices
Initial Contact Method of Preventing an Integrated Circuit Chip from Being Thermally Destroyed, in a Tester, Due to a Defective Pressed Joint
Patent:
6,774,661 →
Application:
10/391,887 →
Thermal Apparatus for Engaging Electronic Device
Method of Extending the Operational Period of a Heat-Exchanger in a Chip Tester
Patent:
7,004,243 →
Application:
10/625,051 →
Method for Controlling the Temperature of an Electronic Component Under Test
Temperature Control System Which Sprays Liquid Coolant Droplets Against an Ic-Module at a Sub-Atmospheric Pressure
Temperature Control System Which Sprays Liquid Coolant Droplets Against an Ic-Module and Directs Radiation Against the Ic-Module
System for Testing Multiple Groups of Ic-Chips Which Concurrently Sends Time-Shifted Test Signals to the Groups
Patent:
6,909,299 →
Application:
10/705,368 →
System for Testing a Group of Ic-Chips Having a Chip Holding Subassembly That Is Built-in and Loaded/Unloaded Automatically
System for Testing One or More Groups of Ic-Chips While Concurrently Loading/Unloading Another Group
Apparatus and Method for Controlling the Temperature of an Electronic Device Under Test
Active Thermal Control System with Miniature Liquid-Cooled Temperature Control Device for Electronic Device Testing
Electromechanical Module, for Holding Ic-Chips in a Chip Testing System, That Synchronizes and Translates Test Signals to the Ic-Chips
Patent:
6,958,617 →
Application:
10/759,910 →
Single-Transistor Two Resistor Circuit Which Translate Test Signals to Selectable Voltage Levels
Patent:
6,970,009 →
Application:
10/759,917 →
Dual Feedback Control System for Maintaining the Temperature of an Ic-Chip Near a Set-Point
Apparatus and Method for Controlling the Temperature of an Electronic Device
Method of Controlling the Operation of a Digital State Machine from a Master Controller in an Ic-Chip Testing System
Patent:
6,979,997 →
Application:
10/850,281 →
Mechanical Assembly, for Regulating the Temperature of an Ic-Chip, Having a Gimbaled Heat-Exchanger with Coiled Springy Conduits
Patent:
7,373,967 →
Application:
10/879,245 →
Apparatus and Method for Controlling the Temperature of an Electronic Device
Mechanical Assembly for Regulating the Temperature of an Electronic Device, Having a Spring with One Slideable End
Miniature Fluid-Cooled Heat Sink with Integral Heater
Heat Sink Pedestal with Interface Medium Chamber
Method of Maintaining an Ic-Module Near a Set-Point
Process for Handling Semiconductor Devices and Transport Media in Automated Sorting Equipment
Led Lighting System for Line Scan Camera Based Multiple Data Matrix Scanners
Apparatus and Method for Controlling Die Force in a Semiconductor Device Testing Assembly
Camera Based Pin Grid Array (Pga) Inspection System with Pin Base Mask and Low Angle Lighting
Soak Profiling
Ic Device-in-Pocket Detection with Angular Mounted Lasers and a Camera
Camera Based Vision Alignment with Device Group Guiding for Semiconductor Device Testing Handlers
Camera Based Two-Point Vision Alignment for Semiconductor Device Testing Handlers
Patent:
7,506,451 →
Application:
12/153,780 →
Vision Alignment with Multiple Cameras and Common Coordinate at Contactor for Ic Device Testing Handlers
Pick and Place Handler with a Floating Lock Device
Temperature Measurement Using a Diode with Saturation Current Cancellation
Miniature Fluid-Cooled Heat Sink with Integral Heater
Method of Manufacturing a Heat Sink Pedestal Device with Interface Medium Chamber
Devices with Pneumatic, Hydraulic and Electrical Components
Up-Look Camera Based Vision Apparatus to Auto Align Pick-and-Place Positions for Device Handlers
Alignment Mechanism
Side Gripping Mechanism and Device Handlers Having Same
System and Method for Accelerating a Device
Pick and Place Handler with a Floating Lock Device
Imaging System with Defocused and Aperture-Cropped Light Sources for Detecting Surface Characteristics
Method and Apparatus for Ic 3D Lead Inspection Having Color Shadowing
Side Gripping Mechanism and Device Handlers Having Same
Application:
14/293,652 →
Publication:
US 2015/0054533
Micro-Vision Alignment System with Guiding Rings for Ic Testing
System and Method for Accelerating a Device
Group Vision Alignment for Double Sided Ic Device Testing
Leak Tolerant Liquid Cooling System Employing Improved Air Purging Mechanism
Continuous Fluidic Thermal Interface Material Dispensing
Application:
15/210,361 →
Publication:
US 2017/0027084
Ic Device-in-Pocket Detection with Angular Mounted Lasers and a Camera
Alignment Mechanism
Application:
15/354,250 →
Publication:
US 2017/0067960
Socket Side Thermal System
Ic Test Site Vision Alignment System
Application:
15/472,006 →
Publication:
US 2017/0285102
Light Line Imager-Based Ic Tray Pocket Detection System
Test Handler Head Having Reverse Funnel Design
Offline Vision Assist Method and Apparatus for Integrated Circuit Device Vision Alignment
Application:
15/686,964 →
Publication:
US 2018/0059176
Vision Alignment System Outside of Test Site
Application:
15/722,736 →
Publication:
US 2019/0101588
Active Thermal Control Head Having Actuatable Cold Capacitor
Application:
15/879,154 →
Publication:
US 2018/0218926
Ic Device-in-Pocket Detection with Angular Mounted Lasers and a Camera
Application:
62/203,132 →
Socket Side Thermal System
Application:
62/444,092 →
System and Method for Liquid Nitrogen Recycling
Application:
62/583,274 →
Related Assignments
(10)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Oct 2, 2001
From: SCHLUMBERGER TECHNOLOGIES INC.
To: DELTA DESIGN, INC.
Reel/Frame 012211/0765 →
Assignment of Assignor's Interest
Oct 10, 2001
From: WAYBURN, LEWIS S.; GAGE, DEREK E.; HAYES, ANDREW M.; BARKER,R. WALTON
To: KRYOTECH, INC.
Reel/Frame 012246/0001 →
Assignment of Assignor's Interest
Jan 14, 2002
From: WALL, CHARLES B.; CRAPS, TERRY; SCHMIDT, CHARLES R.; BROWN, MATTHEW F.W.
To: KRYOTECH, INC.
Reel/Frame 012470/0137 →
Exclusive License
Dec 19, 2003
From: KRYOTECK, INC.
To: ADVANTEST CORPORATION
Reel/Frame 014210/0494 →
Re-Record to Correct the Conveying Party, Previous Recorded on Reel 014210 Frame 0494. Assignor Confirms the Licsense.
Jan 13, 2004
From: KRYOTECH, INC.
To: ADVANTEST CORPORATION
Reel/Frame 014250/0520 →
Assignment of Assignor's Interest
Jun 6, 2005
From: KRYOTECH INC.
To: DELTA DESIGN, INC.
Reel/Frame 016087/0822 →
Assignment of Assignor's Interest
Apr 18, 2006
From: UNISYS CORPORATION
To: DELTA DESIGN, INC.
Reel/Frame 017480/0927 →
Assignment of Assignor's Interest
Feb 1, 2007
From: KRYOTECH INC.
To: DELTA DESIGN, INC.
Reel/Frame 018837/0392 →
Corrective Assignment to Correct the Incorrect Statement That This Document Serves as an Oath/Declaration Previously Recorded on Reel 047640 Frame 0566. Assignor(S) Hereby Confirms the Patent Security Agreement.
Jan 2, 2019
From: DELTA DESIGN, INC.
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 048003/0306 →
Termination and Release of Security Interest in Patents Recorded at Reel 047640, Frame 0566
Mar 7, 2024
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS AGENT
To: DELTA DESIGN, INC.
Reel/Frame 066762/0857 →