Method and apparatus for electronics-harmful-radiation (EHR) measurement and monitoring

1. An electronics-harmful-radiation (EHR) monitoring system, comprising:

an EHR measurement circuit comprising:

a first device;

a single event upset (SEU) detector circuit configured to determine a first number of SEUs of the first device during a first period; and

an EHR measurement generator configured to generate a first EHR value based on the first number of SEUs and the first period; and

an EHR estimation circuit configured to generate a second EHR value associated with a second device based on the first EHR value.

2. The EHR monitoring system of claim 1 , wherein the first device includes a memory.

3. The EHR monitoring system of claim 2 , wherein the EHR measurement generator is further configured to generate the first EHR value based on a size of the memory.

4. The EHR monitoring system of claim 1 , wherein the EHR estimation circuit is configured to determine that the first device and second device are at a similar location.

5. The EHR monitoring system of claim 1 , wherein the EHR estimation circuit is configured to:

determine a first technology node for fabricating the first device;

determine a second technology node for fabricating the second device; and

generate the second EHR value based on the first and second technology nodes.

6. The EHR monitoring system of claim 5 , wherein the first and second technology nodes are the same.

7. The EHR monitoring system of claim 6 , wherein the first and second technology nodes are different.

8. The EHR monitoring system of claim 7 , wherein the EHR estimation circuit is configured to:

determine an EHR correction value associated with the first and second technology nodes; and

generate the second EHR value by applying the EHR correction value to the first EHR value.

9. The EHR monitoring system of claim 1 , wherein the first device is in a first integrated circuit (IC), and

wherein the second device is in a second IC.

10. The EHR monitoring system of claim 1 ,

wherein the first device and second device are at a same location.

11. A method, comprising:

determining, by a single event upset (SEU) detector circuit, a first number of SEUs of a first device during a first period;

generating, by an EHR measurement generator, a first EHR value based on the first number of SEUs and the first period; and

generating a second EHR value associated with a second device based on the first EHR value.

12. The method of claim 11 , wherein the first device includes a memory.

13. The method of claim 12 , further comprising:

generating, by the EHR measurement generator, the first EHR value based on a size of the memory.

14. The method of claim 11 , further comprising:

determining that the first device and second device are at a similar location.

15. The method of claim 11 , further comprising:

determining a first technology node for fabricating the first device;

determining a second technology node for fabricating the second device; and

generating the second EHR value based on the first and second technology nodes.

16. The method of claim 15 , wherein the first and second technology nodes are the same.

17. The method of claim 16 , wherein the first and second technology nodes are different.

18. The method of claim 17 , further comprising:

determining an EHR correction value associated with the first and second technology nodes; and

generating the second EHR value by applying the EHR correction value to the first EHR value.

19. The method of claim 11 , wherein the first device is in a first integrated circuit (IC), and

wherein the second device is in a second IC.

20. The method of claim 11 , wherein the first device and second device are at a same location.