IP Library Granted Patent US 11,031,421
Granted Patent B2
US 11,031,421 · App. 16/610,292 · Granted Jun 8, 2021

Solid-state imaging element and imaging apparatus

Inventors: Kazuhiko Nakadate (Kanagawa, JP); Toshifumi Wakano (Kanagawa, JP); Masahiko Nakamizo (Kanagawa, JP)
Assignee: Sony Semiconductor Solutions Corporation
H01L27/14605H01L27/14612H01L27/14643H04N5/3745
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,031,421
App. No.
16/610,292
Granted
Jun 8, 2021
Kind
B2
Abstract

A solid-state imaging element of a pixel sharing type with improved driving of transistors is disclosed. A first electric charge accumulating section and a second electric charge accumulating section are arranged in a predetermined direction. A first transfer section transfers electric charge from first photoelectric conversion elements to the first electric charge accumulating section, causing it to accumulate the electric charge. A second transfer section transfers electric charge from second photoelectric conversion elements to the second electric charge accumulating section, causing it to accumulate the electric charge. A first transistor is configured to output a signal corresponding to an amount of the electric charge accumulated in each of the first electric charge accumulating section and the second electric charge accumulating section. A second transistor is arranged with the first transistor in the predetermined direction and connected in parallel to the first transistor.

Claims (54)

1. A solid-state imaging element comprising:

a first electric charge accumulating section and a second electric charge accumulating section arranged in a predetermined direction;

a plurality of first photoelectric conversion elements;

a first transfer section configured to transfer electric charge from the plurality of first photoelectric conversion elements to the first electric charge accumulating section and cause the first electric charge accumulating section to accumulate the electric charge;

a plurality of second photoelectric conversion elements;

a second transfer section configured to transfer electric charge from the plurality of second photoelectric conversion elements to the second electric charge accumulating section and cause the second electric charge accumulating section to accumulate the electric charge;

a first transistor configured to output a signal corresponding to an amount of the electric charge accumulated in each of the first electric charge accumulating section and the second electric charge accumulating section;

a second transistor arranged with the first transistor in the predetermined direction and connected in parallel to the first transistor, wherein

each of the first electric charge accumulating section and the second electric charge accumulating section is configured to generate a voltage corresponding to the amount of the accumulated electric charge, and

each of the first transistor and the second transistor is configured to amplify the voltage and output the voltage as the signal;

a third transistor and a fourth transistor arranged in the predetermined direction, wherein

the third transistor is configured to open and close a path between the first transistor and a predetermined signal line according to a predetermined selection signal, and

the fourth transistor is configured to open and close a path between the third transistor and the predetermined signal line according to the predetermined selection signal; and

a reset transistor and a dummy transistor arranged in the predetermined direction, wherein

the reset transistor is configured to initialize the first electric charge accumulating section and the second electric charge accumulating section.

2. The solid-state imaging element according to claim 1 , further comprising:

another transistor different from the first transistor and the second transistor, wherein

the another transistor and one of the first transistor and the second transistor are arranged in a direction perpendicular to the predetermined direction.

3. The solid-state imaging element according to claim 1 , further comprising:

a wiring layer, in which

a signal line connected to the first transistor and the second transistor is wired along the predetermined direction.

4. An imaging apparatus comprising the solid-state imaging element according to claim 1 , and

a signal processor configured to perform predetermined processing on the signal.

5. A solid-state imaging element comprising:

a first electric charge accumulating section and a second electric charge accumulating section arranged in a predetermined direction;

a plurality of first photoelectric conversion elements;

a first transfer section configured to transfer electric charge from the plurality of first photoelectric conversion elements to the first electric charge accumulating section and cause the first electric charge accumulating section to accumulate the electric charge;

a plurality of second photoelectric conversion elements;

a second transfer section configured to transfer electric charge from the plurality of second photoelectric conversion elements to the second electric charge accumulating section and cause the second electric charge accumulating section to accumulate the electric charge;

a first transistor configured to output a signal corresponding to an amount of the electric charge accumulated in each of the first electric charge accumulating section and the second electric charge accumulating section;

a second transistor arranged with the first transistor in the predetermined direction and connected in parallel to the first transistor, wherein

each of the first electric charge accumulating section and the second electric charge accumulating section is configured to generate a voltage corresponding to the amount of the accumulated electric charge, and

each of the first transistor and the second transistor is configured to amplify the voltage and output the voltage as the signal;

a third transistor and a fourth transistor arranged in the predetermined direction, wherein

the third transistor is configured to open and close a path between the first transistor and a predetermined signal line according to a predetermined selection signal, and

the fourth transistor is configured to open and close a path between the third transistor and the predetermined signal line according to the predetermined selection signal; and

a reset transistor and a fifth transistor arranged in the predetermined direction, wherein

the reset transistor is configured to initialize the first electric charge accumulating section and the second electric charge accumulating section.

6. The solid-state imaging element according to claim 5 , wherein

the fifth transistor is an amplification transistor connected in parallel to the first transistor and the second transistor.

7. The solid-state imaging element according to claim 5 , wherein

the fifth transistor is a selection transistor connected in parallel to one of the third transistor and the fourth transistor.

8. An imaging apparatus comprising the solid-state imaging element according to claim 5 , and a signal processor configured to perform predetermined processing on the signal.

9. A solid-state imaging element comprising:

a first electric charge accumulating section and a second electric charge accumulating section arranged in a predetermined direction;

a plurality of first photoelectric conversion elements;

a first transfer section configured to transfer electric charge from the plurality of first photoelectric conversion elements to the first electric charge accumulating section and cause the first electric charge accumulating section to accumulate the electric charge;

a plurality of second photoelectric conversion elements;

a second transfer section configured to transfer electric charge from the plurality of second photoelectric conversion elements to the second electric charge accumulating section and cause the second electric charge accumulating section to accumulate the electric charge;

a first transistor configured to output a signal corresponding to an amount of the electric charge accumulated in each of the first electric charge accumulating section and the second electric charge accumulating section;

a second transistor arranged with the first transistor in the predetermined direction and connected in parallel to the first transistor; and

another transistor different from the first transistor and the second transistor,

wherein the first transistor, the second transistor, and the another transistor are arranged in the predetermined direction.

10. An imaging apparatus comprising the solid-state imaging element according to claim 9 , and a signal processor configured to perform predetermined processing on the signal.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 7, 2020
From: NAKADATE, KAZUHIKO; WAKANO, TOSHIFUMI; NAKAMIZO, MASAHIKO
To: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Reel/Frame 051853/0770 →
Priority Claims (1)
JP JP2017-110522 · Jun 5, 2017 · national
Continuity (1)
Related Publication 20200083266A1 · Mar 12, 2020
Cited By (1)
US 12,342,640