Test structure for additive manufacture and related method for emitter alignment
Embodiments of the disclosure provide a test structure for additive manufacture and related methods for emitter alignment. A test structure according to the disclosure can include: a body having a reference surface, wherein the body is formed with a first beam scanner of the AM system; and a plurality of calibration features defined on the reference surface of the body, wherein each of the plurality of calibration features includes an alignment surface positioned at an offset distance relative to the reference surface, and wherein each of the plurality of calibration features is formed with a second beam scanner of the AM system different than the first beam scanner.
1. A method for aligning beam scanners in an additive manufacturing (AM) system, comprising:
fabricating a test structure with at least two beam scanners of the AM system, the test structure including:
a body on a build platform of the AM system, the body having a reference surface, wherein the body is formed with a first beam scanner of the AM system, wherein the body comprises a plurality of substantially aligned layers which define the reference surface; and
a plurality of calibration features defined on the reference surface of the body, wherein each of the plurality of calibration features includes an alignment surface positioned at an offset distance relative to the reference surface, each of the plurality of calibration features includes a calibration layer positioned between two of the substantially aligned layers of the body, and wherein each of the plurality of calibration features is formed with a second beam scanner of the AM system different than the first beam scanner;
calculating an alignment correction for the first and second beam scanners of the AM system based on a difference between a position of the fabricated plurality of alignment surfaces and an expected position of the plurality of alignment surfaces; and
adjusting at least one of the first and second beam scanners based on the calculated alignment correction calculation.
2. The method of claim 1 , wherein the body comprises a plurality of recesses disposed on the reference surface, and wherein each of the plurality of calibration features is positioned within one of the recesses.
3. The method of claim 1 , wherein the alignment surfaces are offset inwardly or outwardly relative to the reference surface of the body.
4. The method of claim 1 , wherein the fabricating includes fabricating a plurality of test structures on the build platform, at least one test structure oriented with respect to an x-axis and at least one test structure oriented with respect to a y-axis on the build platform; wherein the calculating further includes calculating an alignment correction for each of the x-axis and the y-axis on the build platform based on a misalignment distance for each of the plurality of test structures.
5. The method of claim 1 , wherein the AM system comprises more than two beam scanners having a plurality of interlaced regions, wherein a first operating zone of the first beam scanner and a second operating zone of the second beam scanner overlap within each of the plurality of interlaced regions; and wherein the fabricating includes fabricating the plurality of test structures in a plurality of interlaced regions on the build platform; wherein the calculating further includes calculating an alignment correction for each of the more than two beam scanners based on a misalignment distance for each of the plurality of test structures.
6. The method of claim 1 , wherein the AM system comprises a direct metal laser melting machine, and wherein the first and second beam scanners each include a laser emitter.