Determining a voltage and/or frequency for a performance mode
According to certain aspects, a method includes receiving an input test signal at a test input, receiving an event signal, and passing the input test signal to a test output or blocking the input test signal from the test output based on the event signal. In certain aspects, the event signal indicates an occurrence of an event in a circuit block (e.g., a memory, a processor, or another type of circuit block). The event may include a precharge operation, opening of input latches, reset of a self-time loop, arrival of a data value at a flop in a signal path, an interrupt signal indicating an error or failure in the circuit block, or another type of event.
1. An apparatus, comprising:
a first flop having a data input, a clock input, and an output, wherein the clock input of the first flop is configured to receive a clock signal;
a blocking gate having a signal input, a control input, and an output, wherein the signal input is coupled to the output of the first flop; and
a second flop having a data input, a clock input, and an output, wherein the data input of the second flop is coupled to the output of the blocking gate, and the clock input of the second flop is configured to receive the clock signal;
wherein the blocking gate is configured to:
receive an event signal at the control input, wherein the event signal indicates an occurrence of an event in a memory, and wherein the event is one of a precharge operation in the memory, opening of input latches in the memory, reset of a self-time loop in the memory, and an error in the memory; and
couple the output of the first flop to the data input of the second flop or block the output of the first flop from the data input of the second flop based on the event signal.
2. The apparatus of claim 1 , wherein the event is the precharge operation in the memory, and the blocking gate is configured to:
couple the output of the first flop to the data input of the second flop when the event signal indicates an occurrence of the event in the memory; and
block the output of the first flop from the data input of the second flop when the event signal does not indicate the occurrence of the event.
3. The apparatus of claim 2 , further comprising:
a replica bit line;
a detection circuit configured to:
detect a precharge signal in the memory; and
precharge the replica bit line in response to detecting the precharge signal; and
a threshold detector coupled to the replica bit line, wherein the threshold detector is configured to:
detect a voltage of the replica bit line; and
generate the event signal based on the detected voltage.
4. The apparatus of claim 3 , wherein the threshold detector is configured to:
compare the detected voltage of the replica bit line with a threshold; and
set the event signal to a logic value indicating the occurrence of the event when the detected voltage is equal to or above the threshold.
5. The apparatus of claim 3 , wherein the detection circuit receives the precharge signal twice in a clock cycle, and the detection circuit is configured to detect a second instance of the precharge signal in the clock cycle.
6. The apparatus of claim 3 , further comprising a delay element coupled between the threshold detector and the control input of the blocking gate.
7. The apparatus of claim 2 , wherein the event comprises an arrival of a data value at an input of a flop in a signal path of the memory.
8. The apparatus of claim 1 , wherein the event is the opening of the input latches in the memory, and the input latches are clocked using a latch clock signal, and the apparatus further comprises:
a detection circuit configured to:
detect an edge of the latch clock signal; and
output a detection signal in response to detecting the edge of the latch clock signal; and
a delay circuit coupled between the detection circuit and the control input of the blocking gate, wherein the delay circuit is configured to delay the detection signal by a time delay to generate the event signal.
9. The apparatus of claim 8 , wherein the time delay is approximately equal to a delay between a time that at least one of a data signal, an address signal and a control signal enter the input latches and a time that the at least one of the data signal, the address signal and the control signal are latched in the memory.
10. The apparatus of claim 1 , wherein the event is the error in the memory, and the blocking gate is configured to:
block the output of the first flop from the data input of the second flop when the event signal indicates the occurrence of the event in the memory; and
couple the output of the first flop to the data input of the second flop when the event signal does not indicate the occurrence of the event in the memory.