Granted Patent B1

US 11,158,422 · App. 17/068,181 · Granted Oct 26, 2021

Inventors: Todd Christopher Wilson (Columbus, OH); Necip Berme (Worthington, OH); Jan Jakub Ober (Columbus, OH)

Assignee: Bertec Corporation

G16H40/63

Abstract

Claims (26)

1. A measurement and testing system, comprising:

a first measurement device having a first sampling rate, the first measurement device configured to sense one or more first measured quantities and output one or more first measurement signals that are representative of the one or more first measured quantities, a first sampling period of the one or more first measurement signals being an inverse of the first sampling rate;

a second measurement device having a second sampling rate that is different than the first sampling rate of the first measurement device, the second measurement device configured to sense one or more second measured quantities and output one or more second measurement signals that are representative of the one or more second measured quantities, the second measurement device being included as a part of a data collection subsystem, the data collection subsystem forming a portion of the measurement and testing system and being separate from the first measurement device;

a microcontroller configured to produce a digital time reference signal using a reference sampling period; and

a data processing device operatively coupled to the first measurement device, the second measurement device, and the microcontroller, the data processing device including at least one hardware component, and the data processing device configured to execute computer executable stored instructions, the computer executable stored instructions comprised by the data processing device and comprising instructions for:

receiving the one or more first measurement signals from the first measurement device and the digital time reference signal from the microcontroller;

computing time-delayed values of the one or more first measurement signals from the first measurement device using a time delay;

selecting particular ones of the computed time-delayed values that occur coincident with a transition of the digital time reference signal produced by the microcontroller; and

sending the particular ones of the computed time-delayed values to the data collection subsystem with the second measurement device such that the one or more first measurement signals are able to be synchronized with the one or more second measurement signals.

2. The measurement and testing system according to claim 1 , wherein the digital time reference signal produced by the microcontroller is in the form of square wave signal.

3. The measurement and testing system according to claim 2 , wherein the transition of the digital time reference signal comprises an up transition of the square wave signal, a down transition of the square wave signal, or both an up transition and down transition of the square wave signal.

4. The measurement and testing system according to claim 1 , wherein the time delay used by the data processing device to compute the time-delayed values is based upon a predetermined fraction of the first sampling period of the one or more first measurement signals from the first measurement device.

5. The measurement and testing system according to claim 1 , wherein the reference sampling period of the digital time reference signal produced by the microcontroller is fractionally proportionate to the first sampling period of the first measurement device.

6. The measurement and testing system according to claim 1 , wherein the transition of the digital time reference signal determined by the data processing device comprises an increase in the digital time reference signal, a decrease in the digital time reference signal, or both an increase in the digital time reference signal and a decrease in the digital time reference signal.

7. A measurement and testing system, comprising:

a first measurement device having a first sampling rate, the first measurement device configured to sense one or more first measured quantities and output one or more first measurement signals that are representative of the one or more first measured quantities;

a second measurement device having a second sampling rate that is different than the first sampling rate of the first measurement device, the second measurement device configured to sense one or more second measured quantities and output one or more second measurement signals that are representative of the one or more second measured quantities, the second measurement device being included as a part of a data collection subsystem, the data collection subsystem forming a portion of the measurement and testing system and being separate from the first measurement device;

a microcontroller configured to sample a digital time reference signal on each of one or more transitions of the digital time reference signal and record time values; and

a data processing device operatively coupled to the first measurement device, the second measurement device, and the microcontroller, the data processing device including at least one hardware component, and the data processing device configured to execute computer executable stored instructions, the computer executable stored instructions comprised by the data processing device and comprising instructions for:

receiving the one or more first measurement signals from the first measurement device and the digital time reference signal from the microcontroller;

computing, for each of the time values determined by the microcontroller, a reconstructed value of the one or more first measurement signals outputted by the first measurement device; and

sending the computed reconstructed values to the data collection subsystem with the second measurement device for each transition of the digital time reference signal such that the one or more first measurement signals are able to be synchronized with the one or more second measurement signals.

8. The measurement and testing system according to claim 7 , wherein the digital time reference signal sampled by the microcontroller is in the form of square wave signal.

9. The measurement and testing system according to claim 8 , wherein the transition of the digital time reference signal comprises an up transition of the square wave signal, a down transition of the square wave signal, or both an up transition and down transition of the square wave signal.

10. The measurement and testing system according to claim 7 , wherein the reconstructed values computed by the data processing device comprise reconstructed values determined using interpolation.

11. The measurement and testing system according to claim 7 , wherein the transition of the digital time reference signal determined by the data processing device comprises an increase in the digital time reference signal, a decrease in the digital time reference signal, or both an increase in the digital time reference signal and a decrease in the digital time reference signal.

Assignments (1)

Continuity (6)

Cited By (10)

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