Transient voltage suppressor bit stimulation
A transient voltage suppressor (TVS) can include an input line, a return line, and a plurality of TVS diodes disposed in series between the input line and the return line. The TVS can include a switch assembly operatively connected to the plurality of TVS diodes and configured to bypass at least one of the plurality of TVS diodes to allow a remainder of the plurality of TVS diodes to be tested at a voltage that is lower than if the switch assembly were not employed.
1. A transient voltage suppressor (TVS), comprising:
an input line;
a return line;
a plurality of TVS diodes disposed in series between the input line and the return line; and
a switch assembly operatively connected to the plurality of TVS diodes and configured to bypass at least one of the plurality of TVS diodes to allow a remainder of the plurality of TVS diodes to be tested at a voltage that is lower than if the switch assembly were not employed, wherein the switch assembly can include one or more switches connected between a first pair of the plurality of TVS diodes and the return line and between the first pair and a second pair of TVS diodes via one or more test lines connected at a test point between a respective pair of the plurality of TVS diodes, such that one pair of diodes can be bypassed at the same time as the remaining pair of diodes is being tested.
2. The TVS of claim 1 , wherein any or all of the one or more switches can be a MOSFET, an IGBT, or an NPN transistor.
3. The TVS of claim 1 , wherein the plurality of TVS diodes include four TVS diodes.
4. The TVS of claim 1 , wherein the one or more switches include a first switch configured to selectively bypass a first TVS diode and a second switch configured to selectively bypass as second TVS diode.
5. The TVS of claim 4 , wherein the one or more test lines include a first test line connected between the first pair and the first switch.
6. The TVS of claim 5 , wherein the one or more test lines include a second test line connected between the second pair and the second switch.
7. The TVS of claim 6 , wherein the second switch is connected in series with the first switch between the second test line and the return line such that the first test line is connected between the first switch and the second switch.
8. The TVS of claim 6 , further comprising a switching module configured to control each switch.
9. The TVS of claim 8 , wherein the switching module is configured to close the first switch and open the second switch to bypass the first TVS diode.
10. The TVS of claim 9 , wherein the switching module is configured to open the first switch and close the second switch to bypass the second TVS diode after bypassing the first TVS diode.
11. The TVS of claim 10 , wherein the switching module is configured to apply a test voltage less than an operational voltage to the input line and sequence each switch upon receiving a startup signal.
12. An aircraft system, comprising:
a transient voltage suppressor (TVS), comprising:
an input line;
a return line; and
a plurality of TVS diodes disposed in series between the input line and the return line; and
a switch assembly operatively connected to the series of TVS diodes and configured to bypass at least one TVS diode to reduce test voltage to test a remainder of TVS diodes, wherein the switch assembly can include one or more switches connected between a first pair of the plurality of TVS diodes and the return line and between the first pair and a second pair of TVS diodes via one or more test lines connected at a test point between a respective pair of the plurality of TVS diodes, such that one pair of diodes can be bypassed at the same time as the remaining pair of diodes is being tested.
13. The system of claim 12 , wherein the plurality of TVS diodes include four TVS diodes.
14. The system of claim 13 , wherein the one or more switches include a first switch configured to selectively bypass a first TVS diode and a second switch configured to selectively bypass as second TVS diode.
15. The system of claim 14 , wherein the one or more test lines include a first test line connected between the first pair and the first switch.
16. The system of claim 15 , wherein the one or more test lines include a second test line connected between the second pair and the second switch.
17. The system of claim 16 , wherein the second switch is connected in series with the first switch between the second test line and the return line such that the first test line is connected between the first switch and the second switch.
18. A method, comprising:
bypassing at least one of a plurality of transient voltage suppressor diodes of a transient voltage suppressor to allow a remainder of the plurality of transient voltage suppressor diodes to be tested at a voltage less than if the bypassing were not performed, wherein bypassing includes bypassing one pair of diodes at the same time as the remaining pair of diodes is being tested.