Overload recovery optimization in microelectromechanical system application specific integrated circuit
Disclosed herein is a MEMS ASIC. In some examples, the MEMS ASIC can include a MEMS, an analog front end (AFE) amplifier, an analog-to-digital converter (ADC), an overload detector, and a high-ohmic (HO) block. The HO block and the MEMS can form a high-pass filter (HPF). The impedance of the HO block can be related to the DC operating level of the AFE amplifier and the cutoff frequency of the HPF. In some examples, an overload event can occur, and the overload detector can be configured to adjust the impedance of the HO block to reduce the settling time of the MEMS ASIC. Methods of using the MEMS ASIC to reduce the settling time of the MEMS ASIC due to an overload event are disclosed herein.
1. A circuit comprising:
a microelectromechanical system (MEMS) component;
an analog front end (AFE) amplifier including an input coupled to the MEMS component and an output;
an overload detector coupled to the input of the AFE amplifier; and
a set of high-ohmic (HO) blocks comprising a first HO block coupled to the input of the AFE amplifier and the overload detector, wherein a resistance of the first HO block is variable and is capable of being adjusted to a first resistance or a second resistance by the overload detector, and wherein the second resistance is lower than the first resistance; and
logic coupled to the overload detector and configured to:
determine whether an overload event at the input of the AFE amplifier has occurred; and
in accordance with the determination that the overload event has occurred, cause the overload detector to change the resistance of the first HO block from the first resistance to the second resistance.
2. The circuit of claim 1 , wherein the determination of whether the overload event has occurred comprises:
determine whether a signal at the input of the AFE amplifier is greater than a first threshold; and
in accordance with the determination that the signal is greater than the first threshold, determine that the overload event has occurred.
3. The circuit of claim 1 , wherein the logic is further configured to:
determine whether the overload event at the input of the AFE amplifier has ended; and
in accordance with the determination that the overload event has ended, cause the overload detector to change the resistance of the HO block from the second resistance to the first resistance.
4. The circuit of claim 3 , wherein the determination of whether the overload event has ended comprises:
determine whether a signal at the input of the AFE amplifier is less than a second threshold; and
in accordance with the determination that the signal is less than the second threshold, determine that the overload event has ended.
5. The circuit of claim 1 , further comprising:
an analog-to-digital converter (ADC) coupled to the output of the AFE amplifier, wherein the overload detector is further coupled to the output of the ADC.
6. The circuit of claim 1 , wherein:
the first HO block comprises a resistor and a switch, the resistor and the switch are coupled in parallel,
the resistance of the first HO block is the first resistance when the switch is off, and
the resistance of the first HO block changes to the second resistance when the switch is on.
7. The circuit of claim 1 , wherein:
the first HO block comprises a MOSFET,
the resistance of the first HO block is the first resistance when the MOSFET is off, and
the resistance of the first HO block changes to the second resistance when the MOSFET is on.
8. The circuit of claim 1 , wherein:
a ratio between the first resistance and the second resistance is an attenuation factor,
the resistance of the first HO block multiplied by an effective capacitance of the MEMS component at the input of the AFE amplifier is an overload event settling time constant, and
the overload event settling time constant is reduced by the attenuation factor when the resistance of the first HO block changes from the first resistance to the second resistance.
9. A circuit comprising:
a microelectromechanical system (MEMS) component;
an analog front end (AFE) amplifier comprising a first input coupled to the MEMS component, a second input, and an output;
an overload detector coupled to at least one or more of: the first and second inputs of the AFE amplifier and the output of the AFE amplifier; and
a set of high-ohmic (HO) blocks comprising:
a first HO block coupled to the first input of the AFE amplifier and the overload detector;
a second HO block coupled to the second input of the AFE amplifier and the overload detector, wherein respective resistances of the first and second HO blocks are variable and are capable of being adjusted to a first resistance or a second resistance by the overload detector, and wherein the second resistance is lower than the first resistance; and
logic coupled to the overload detector and configured to:
determine whether an overload event has occurred at any of the first and second inputs of the AFE amplifier, and the output of the AFE amplifier; and
in accordance with the determination that the overload event has occurred, cause the overload detector to selectively change, based on the determination, the resistance of the first and second HO blocks from the first resistance to the second resistance.
10. The circuit of claim 1 , wherein the MEMS component is one of a microphone and a vibration sensor.
11. The circuit of claim 1 , wherein the first resistance is indicative of an operating level of the AFE amplifier.
12. The circuit of claim 1 , wherein:
the MEMS component at the input of the AFE amplifier has an effective capacitance,
the effective capacitance and the first HO block form a high-pass filter, and
the effective capacitance and the first resistance set a cutoff frequency of the high-pass filter, the cutoff frequency indicative of a frequency of interest passed from the MEMS component.
13. A method of operating a microelectromechanical system (MEMS) circuitry, comprising:
sensing, using an overload detector, a signal at an input of an analog front end (AFE) amplifier, wherein:
the input of the AFE amplifier is coupled to a MEMS component, and
the overload detector is coupled to the input of the AFE amplifier; and
determining, using the overload detector, whether an overload event at the input of the AFE amplifier has occurred; and
in accordance with the determination that the overload event has occurred, causing the overload detector to change a resistance of a first high-ohmic (HO) block of a set of HO blocks from a first resistance to a second resistance, wherein:
the first HO block is coupled to the overload detector,
the resistance of the first HO block is variable and is capable of being adjusted to the first resistance or the second resistance by the overload detector, and
the second resistance is lower than the first resistance.
14. The method of claim 13 , wherein the determination of whether the overload event has occurred comprises:
determining, using the overload detector, whether the signal at the input of the AFE amplifier is greater than a first threshold; and
in accordance with the determination that the signal is greater than the first threshold, determining that the overload event has occurred.
15. The method of claim 13 , further comprising:
determining, using the overload detector, whether the overload event at the input of the AFE amplifier has ended; and
in accordance with the determination that the overload event has ended, causing the overload detector to change the resistance of the HO block from the second resistance to the first resistance.
16. The method of claim 15 , wherein the determination of whether the overload event has ended comprises:
determining, using the overload detector, whether the signal at the input of the AFE amplifier is less than a second threshold; and
in accordance with a determination that the signal is less than the second threshold, determining that the overload event has ended.
17. The method of claim 13 , wherein the first HO block comprises a resistor and a switch, the method further comprising:
coupling the resistor and the switch in parallel;
changing the resistance of the first HO block to the first resistance when the switch is off; and
causing the overload detector to change the resistance of the first HO block to the second resistance by turning the switch on with the overload detector.
18. The method of claim 13 , wherein:
the first HO block comprises a MOSFET,
the resistance of the first HO block is the first resistance when the MOSFET is off, and
causing the overload detector to change the resistance of the first HO block to the second resistance comprises turning the MOSFET on with the overload detector.
19. The method of claim 13 , further comprising setting an operating level of the AFE amplifier based on the first resistance.
20. The method of claim 13 , wherein:
the MEMS component at the input of the AFE amplifier has an effective capacitance,
the effective capacitance and the first HO block form a high-pass filter, and
the effective capacitance and the first resistance set a cutoff frequency of the high-pass filter, the method further comprising:
passing frequencies of interest from the MEMS component using the high-pass filter.
21. The circuit of claim 9 , wherein:
the AFE amplifier comprises a second output;
the outputs of the AFE amplifier are differential outputs; and
the overload detector is further coupled to the second output.