IP Library Granted Patent US 11,240,455
Granted Patent B2
US 11,240,455 · App. 16/319,181 · Granted Feb 1, 2022

Ad conversion device, ad conversion method, image sensor, and electronic apparatus

Inventors: Tomonori Yamashita (Kanagawa, JP); Yosuke Ueno (Kanagawa, JP); Atsumi Niwa (Kanagawa, JP)
Assignee: Sony Semiconductor Solutions Corporation
H04N5/378H03M1/56H04N5/37455
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Quick Facts
Patent No.
US 11,240,455
App. No.
16/319,181
Granted
Feb 1, 2022
Kind
B2
Abstract

The present technology relates to an AD conversion device, an AD conversion method, an image sensor, and an electronic apparatus that are able to achieve high-speed, low-power-consumption AD conversion. In a case where an electrical signal and a variable-level reference signal are compared by a comparator and the result of comparison is used to perform AD (Analog to Digital) conversion of the electrical signal, control is exercised in such a manner that a bias current flowing in the comparator to operate the comparator during a certain section of the reference signal including a section where the reference signal changes is increased from a first current, which is larger than 0 (zero), to a second current, which is larger than the first current. The present technology is applicable, for example, to AD conversion of an electrical signal.

Claims (24)

1. An analog to digital (AD) conversion device comprising:

an AD conversion section that includes a comparator for comparing an electrical signal with a variable-level reference signal, wherein the AD conversion section performs AD conversion of the electrical signal by using a result of a comparison made by the comparator between the electrical signal and the variable-level reference signal; and

a controller configured to exercise control in such a manner that a bias current flowing in the comparator to operate the comparator during a certain section of the variable-level reference signal including a section where the reference signal changes is increased from a first current to a second current, the first current being larger than 0 (zero) and the second current being larger than the first current.

2. The AD conversion device according to claim 1 , wherein the controller is further configured to exercise control in such a manner that a capacitance is connected to the output of the comparator during a certain section of the reference signal including a section where the reference signal changes.

3. The AD conversion device according to claim 1 , wherein the comparator includes a differential pair to which the electrical signal and the reference signal are inputted, and

the AD conversion device further includes a current source and an additional current source, the current source being connected to the differential pair, the additional current source being connected to the differential pair under the control of the controller.

4. The AD conversion device according to claim 1 , wherein the comparator includes a differential pair to which the electrical signal and the reference signal are inputted,

the AD conversion device further includes a current source that is a mirror destination of a current mirror and connected to the differential pair, and

the controller is configured to increase a current flowing to the current source by increasing a current flowing to a mirror source of the current mirror.

5. An analog to digital (AD) conversion method comprising a step of:

in a case where a result of a comparison made by a comparator comparing an electrical signal with a variable-level reference signal is used to perform AD conversion of the electrical signal, exercising control in such a manner that a bias current flowing in the comparator to operate the comparator during a certain section of the variable-level reference signal including a section where the reference signal changes is increased from a first current to a second current, the first current being larger than 0 (zero) and the second current being larger than the first current.

6. An image sensor, comprising:

a pixel that includes a photoelectric conversion element for performing photoelectric conversion and outputting an electrical signal;

a reference signal output section that outputs a variable-level reference signal;

an analog to digital (AD) conversion section that includes a comparator for comparing the electrical signal outputted from the pixel with the reference signal and performing AD conversion of the electrical signal by using a result of a comparison made by the comparator between the electrical signal and the reference signal; and

a controller configured to exercise control in such a manner that a bias current flowing in the comparator to operate the comparator during a certain section of the reference signal including a section where the variable-level reference signal changes is increased from a first current to a second current, the first current being larger than 0 (zero) and the second current being larger than the first current.

7. An electronic apparatus, comprising:

an optical system that collects light; and

an image sensor that receives the light and outputs a signal corresponding to an amount of the light received,

wherein the image sensor includes:

a pixel that includes a photoelectric conversion element for performing photoelectric conversion and outputting an electrical signal,

a reference signal output section that outputs a variable-level reference signal,

an analog to digital (AD) conversion section that includes a comparator for comparing the electrical signal outputted from the pixel with the reference signal and performing AD conversion of the electrical signal by using a result of a comparison made by the comparator between the electrical signal and the reference signal, and

a controller configured to exercise control in such a manner that a bias current flowing in the comparator to operate the comparator during a certain section of the variable-level reference signal including a section where the reference signal changes is increased from a first current to a second current, the first current being larger than 0 (zero) and the second current being larger than the first current.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 21, 2019
From: YAMASHITA, TOMONORI; UENO, YOSUKE; NIWA, ATSUMI
To: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Reel/Frame 048075/0362 →
Priority Claims (1)
JP JP2016-148566 · Jul 28, 2016 · national
Continuity (1)
Related Publication 20210185256A1 · Jun 17, 2021
Cited By (1)
US 12,199,632