Total time-over-threshold (TTOT) processing for a photon-counting x-ray detector
There is provided a circuit ( 502; 503; 504 ) configured for operation with a multi-bin photon-counting x-ray detector ( 20 ) having multiple energy thresholds, wherein said circuit ( 502; 503; 504 ) is configured to obtain or generate several Total Time-Over-Threshold (TTOT) signals corresponding to several different energy thresholds, and provide energy integrating information based on said several TTOT signals.
1. A digital processing circuit configured for operation with a multi-bin photon-counting x-ray detector having multiple energy thresholds, wherein the digital processing circuit is configured to obtain more than one Total Time-Over-Threshold (TTOT) signal corresponding to more than one energy threshold, and provide energy integrating information based on said more than one TTOT signal, wherein the digital processing circuit is configured to receive said more than one TTOT signal and form a combined value representing at least said energy integrating information based on said more than one TTOT signal.
2. The digital processing circuit of claim 1 , wherein the digital processing circuit is configured to combine TTOT signals from low and high energy thresholds to form said combined value.
3. A measurement circuit for a photon-counting x-ray detector comprising the digital processing circuit of claim 1 .
4. An x-ray imaging system comprising the digital processing circuit of claim 1 .
5. The x-ray imaging system of claim 4 , wherein the x-ray imaging system is configured to perform material specific imaging of an object to be imaged based on the TTOT signals from several energy thresholds as spectral information, and/or the x-ray imaging system is configured to perform material specific imaging of an object to be imaged based on the TTOT signals in combination with a photon counting signal and/or a digital energy integrating signal formed from the TTOT signals.
6. A digital processing circuit configured for operation with a multi-bin photon-counting x-ray detector having multiple energy thresholds, wherein the digital processing circuit is configured to obtain more than one Total Time-Over-Threshold (TTOT) signal corresponding to more than one energy threshold, and provide energy integrating information based on said more than one TTOT signal, wherein the digital processing circuit is configured to receive said more than one TTOT signal and at least one photon-counting signal, and form a combined value representing energy integrating information and photon-counting information by signal combination.
7. The digital processing circuit of claim 6 , wherein the digital processing circuit is configured to form said combined value by signal combination dependent on the rate of incoming x-ray photons, and the digital processing circuit is configured to form said combined value by giving added weight to said at least one photon-counting signal in said signal combination at photon rates lower than a predetermined threshold rate and giving added weight to said more than one TTOT signal in said signal combination at photon rates higher than said threshold rate.
8. A measurement circuit for a photon-counting x-ray detector comprising the digital processing circuit of claim 6 .