Device for positioning a semiconductor die in a wafer prober

1. A device for positioning a semiconductor die in a wafer prober, the device comprising a carrier plate, a clamp on a front surface of the carrier plate, and a frame shell, the dimensions of the carrier plate matching a standard geometry required by the wafer prober for receiving a semiconductor wafer to be probed by the wafer prober, the clamp being reversibly movable against a force of an elastic element between an open position and a closed position, the clamp being adapted for fixing the die on the carrier plate in the closed position and for releasing the die in the open position, the clamp comprising a first rectangular frame adapted for receiving the die in a first rectangular area surrounded by the first rectangular frame, the frame shell comprising a base element fixed to the front surface and a second rectangular frame fixed to the base element, the second rectangular frame being stacked on the base element, the first rectangular frame being received between the base element and the second rectangular frame and being movable relative to the frame shell along a degree of freedom parallel to the front surface, the frame shell having, when receiving the first rectangular frame, an overall thickness of less than an overall wafer thickness specified by the standard geometry, the device being adapted for simultaneously receiving the die in the first rectangular area and a second rectangular area surrounded by the second rectangular frame, the first rectangular frame being adapted for fixing the simultaneously received die on the carrier plate in the closed position by pressing the die against the frame shell.

2. The device of claim 1 , further comprising a vacuum plate attached to the clamp and resting on the carrier plate, the carrier plate further comprising one or more first vacuum ducts covered by the vacuum plate in the closed state.

3. The device of claim 2 , the vacuum plate covering at least 25 percent of the front surface.

4. The device of claim 1 , further comprising a stop structure, the clamp being movable toward and away from the stop structure along a degree of freedom parallel to the front surface, the clamp being adapted for fixing the die on the carrier plate in the closed position by pressing the die against the stop structure.

5. The device of claim 4 , the front surface comprising a recess forming the stop structure, the recess having a uniform depth of less than an overall wafer thickness specified by the standard geometry.

6. The device of claim 5 , wherein, in the area of the recess, the material of the carrier plate is replaced by a material having a higher thermal conductivity than the carrier plate.

7. The device of claim 4 , the stop structure protruding from the front surface.

8. The device of claim 7 , the stop structure comprising two nonparallel straight segments, the clamp being adapted for fixing the die on the carrier plate in the closed position by simultaneously pressing the chip against both of the segments.

9. The device of claim 4 , the degree of freedom comprising a translation.

10. The device of claim 1 , the front surface comprising a receiving area, the clamp being adapted, in the closed position, for bringing the die into contact with the receiving area, the device further comprising one or more second vacuum ducts in the receiving area.

11. The device of claim 10 , the second vacuum ducts covering between 1 and 50 percent of the receiving area.

12. The device of claim 1 , the base element comprising a third rectangular frame surrounding a third rectangular area, the device being adapted for simultaneously receiving the die in the first, the second and the third rectangular area, a first aligned edge of the second rectangular frame being aligned with a second aligned edge of the third rectangular frame, the first rectangular frame being adapted for fixing the simultaneously received die on the carrier plate in the closed position by simultaneously pressing the die against the first aligned edge and the second aligned edge.

13. The device of claim 1 , the elastic element being adapted for restoring the clamp into the closed position.

14. The device of claim 1 , the clamp being exchangeably mounted on the carrier plate.

15. The device of claim 1 , the carrier plate further comprising an alignment mark.

16. The device of claim 1 , the carrier plate being a semiconductor wafer or being made of a metal or a ceramic material.

17. The device of claim 16 , the metal being aluminum.

18. The device of claim 1 , the elastic element having a spring constant between 0.025 and 0.5 newton per millimeter.