Method of measuring electromagnetic signal and electronic device therefor

1. An electronic device comprising:

a housing comprising:

a first side facing in a first direction,

a second side facing in a second direction opposite to the first direction, and

a lateral member at least enclosing a space between the first side and the second side;

a display displayed through at least a part of the first side;

at least one electromagnetic (EM) sensor disposed in the housing or the space, the EM sensor configured to sense an EM signal;

a processor disposed in the housing, the processor operably connected to the display and the EM sensor; and

a memory operably connected to the processor,

wherein the memory stores instructions, which, when executed, enable the processor to:

obtain an input signal including an electromagnetic signal of an external electronic device and a self-noise signal, using the EM sensor;

identify an ambient condition of the electronic device;

identify a compensation self-noise corresponding to the ambient condition;

generate a signal pattern by removing the self-noise signal from the input signal based on the input signal and the compensation self-noise; and

identify the external electronic device based on at least a part of the signal pattern.

2. The electronic device of claim 1 , wherein the ambient condition comprises at least one of:

whether an external power source is connected; or

whether another module is activated.

3. The electronic device of claim 1 , wherein the instructions further enable the processor to:

determine that the compensation self-noise needs updating;

measure the self-noise signal; and

update the compensation self-noise based on a result of measurement of the self-noise signal.

4. The electronic device of claim 3 , wherein the instructions further enable the processor to determine whether the compensation self-noise needs updating based on a record of results of identification of the external electronic device using the compensation self-noise.

5. The electronic device of claim 3 , wherein the instructions further enable the processor to set a sampling rate for the measurement, a number of repetitions, or a measurement duration to be greater than a value used when a currently stored compensation self-noise is generated.

6. The electronic device of claim 3 , wherein, for the identification of the compensation self-noise, the instructions further enable the processor to:

obtain a plurality of measured signals;

remove a time-varying component from the plurality of measured signals; and

generate an average signal of signals from which the time-varying component is removed.

7. The electronic device of claim 6 , wherein, for removing the time-varying component, the instructions further enable the processor to:

obtain average signals by performing sliding window averaging with respect to the plurality of measured signals; and

remove at least one average signal having a correlation less than or equal to a reference among the average signals.

8. An electronic device comprising:

a housing comprising:

a first side facing in a first direction,

a second side facing in a second direction opposite to the first direction, and

a lateral member at least enclosing a space between the first side and the second side;

a display displayed through at least a part of the first side;

at least one EM sensor disposed in the housing or the space, the EM sensor configured to sense an EM signal;

a processor disposed in the housing, the processor operably connected to the display and the EM sensor; and

a memory operably connected to the processor,

wherein the memory comprises instructions, which, when executed, enable the processor to:

determine at least one measurement parameter in association with measurement of a self-noise;

measure the self-noise according to the at least one measurement parameter;

generate a compensation self-noise based on a result of measurement of the self-noise;

identify an ambient condition when measuring the self-noise; and

store information associated with the ambient condition together with the compensation self-noise.

9. The electronic device of claim 8 , wherein the at least one measurement parameter comprises at least one of a sampling rate, a number of repetitions, or a measurement duration.

10. The electronic device of claim 9 , wherein the instructions further enable the processor to set the sampling rate, the number of repetitions, or the measurement duration according to a required accuracy.

11. The electronic device of claim 9 , wherein, for the generation of the compensation self-noise, the instructions further enable the processor to:

obtain a plurality of measured signals;

remove a time-varying component from the plurality of measured signals; and

generate an average signal of the signals from which the time-varying component is removed.

12. The electronic device of claim 11 , wherein, for removing the time-varying component, the instructions further enable the processor to:

obtain average signals by performing sliding window averaging with respect to the plurality of measured signals; and

remove at least one average signal having a correlation less than or equal to a reference among the average signals.

13. An operation method of an electronic device, the method comprising:

obtaining an input signal comprising an electromagnetic (EM) signal of an external electronic device and a self-noise signal using an EM sensor;

identifying an ambient condition of the electronic device;

identifying a compensation self-noise corresponding to the ambient condition;

generating a signal pattern by removing the self-noise signal from the input signal based on the input signal and the compensation self-noise; and

identifying the external electronic device based on at least a part of the signal pattern.

14. The method of claim 13 , wherein the ambient condition comprises at least one of:

whether an external power source is connected; or

whether another module is activated.

15. The method of claim 13 , wherein the compensation self-noise is determined based on a result of removing a time-varying component from measured signals associated with the self-noise signal obtained using the EM sensor.

16. The method of claim 13 , further comprising:

determining whether the compensation self-noise needs updating;

measuring the self-noise signal; and

updating the compensation self-noise based on a result of the measurement of the self-noise signal.

17. The method of claim 16 , further comprising setting a sampling rate for the measurement, a number of repetitions, or a measurement duration to be greater than a value used when a currently stored compensation self-noise is generated.

18. The method of claim 16 , wherein the generating the compensation self-noise comprises:

obtaining a plurality of measured signals;

removing a time-varying component from the plurality of measured signals; and

generating an average signal of the signals from which the time-varying component is removed.