IP Library › Granted Patent US 1,139,928
Granted Patent S1
US 1,139,928 · App. 30/011,321 · Granted Aug 4, 2026

Fan

Inventor: Weixing Liu (Shenzhen, CN)
Assignee: Qiku Smart-Link Technology (Shenzhen) Co., Ltd
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 1,139,928
App. No.
30/011,321
Granted
Aug 4, 2026
Kind
S1
Claims (1)

The ornamental design for a fan, as shown and described.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 6, 2026
From: LIU, WEIXING
To: QIKU SMART-LINK TECHNOLOGY (SHENZHEN) CO., LTD
Reel/Frame 074579/0653 →
Priority Claims (1)
CN 202530127046.9 · Mar 17, 2025 · national
References Cited (25)
US D1041638S · Wei · 2024 [cited by examiner]
US D1051330S · Wei · 2024 [cited by examiner]
US D1051528S · Zhu · 2024 [cited by examiner]
US D1058143S · Wei · 2025 [cited by examiner]
US D1060641S · Wei · 2025 [cited by examiner]
US D1067405S · Xu · 2025 [cited by examiner]
US D1068053S · Deng · 2025 [cited by examiner]
US 12270406B1 · Deng · 2025 [cited by examiner]
US D1077182S · Xu · 2025 [cited by examiner]
US D1077195S · Wei · 2025 [cited by examiner]
US D1080841S · Wei · 2025 [cited by examiner]
US D1087461S · Yi · 2025 [cited by examiner]
US D1089615S · Wei · 2025 [cited by examiner]
US D1095800S · Tan · 2025 [cited by examiner]
US D1097103S · Lin · 2025 [cited by examiner]
US D1097395S · Huang · 2025 [cited by examiner]
US D1101130S · Zhen · 2025 [cited by examiner]
US D1102076S · He · 2025 [cited by examiner]
US D1102077S · He · 2025 [cited by examiner]
US D1102579S · Li · 2025 [cited by examiner]
US D1103520S · Yi · 2025 [cited by examiner]
US 12467467B1 · Yi · 2025 [cited by examiner]
US D1109309S · Shen · 2026 [cited by examiner]
US D1113007S · Liu · 2026 [cited by examiner]
US 12571399B1 · Jian · 2026 [cited by examiner]