Bias current generation circuit
The present invention discloses a bias current generation circuit. An operation amplifier compares an input voltage having a zero-temperature coefficient and a feedback voltage to generate a driving voltage. An output transistor generates a bias current according to the driving voltage. A variable resistive circuit is electrically coupled to the output transistor through a feedback node to generate the feedback voltage according to the bias current and includes series-coupled resistors and switch transistors. Each of the resistors has a resistance having a positive temperature coefficient and includes a current input terminal and a current output terminal. Each of the switch transistors is electrically coupled between the current output terminal of one of the resistors and a ground terminal. One of the switch transistors turns on according to a control voltage variable according to the temperature variation to enable resistors to generate the resistance having a negative temperature coefficient.
1. A circuit, comprising:
an operation amplifier comprising at least two input terminals and an output terminal, wherein the at least two input terminals are respectively configured to receive an input voltage having a zero-temperature coefficient and a feedback voltage to generate a driving voltage at the output terminal according to a comparison result between the input voltage and the feedback voltage;
an output transistor configured to generate a bias current according to the driving voltage; and
a variable resistive circuit electrically coupled to the output transistor through a feedback node and configured to generate the feedback voltage according to the bias current, wherein the variable resistive circuit comprises:
a plurality of resistors electrically coupled in series each having a load resistance and a positive-temperature coefficient and each having a current input terminal and a current output terminal; and
a plurality of switch transistors each electrically coupled between the current output terminal of one of the resistors and a ground terminal, wherein one of the switch transistors turns on according to a control voltage variable with a temperature change to enable the corresponding one of the resistors and generates a transistor resistance having a negative temperature coefficient.
2. The circuit of claim 1 , wherein an increased amount of the load resistance of each of the resistors generated due to the increase of the temperature and a decreased amount of the transistor resistance generated due to the increase of the temperature together keep a total resistance of the variable resistive circuit within a predetermined range.
3. The circuit of claim 1 , further comprising a bandgap circuit configured to generate the input voltage having the zero-temperature coefficient.
4. The circuit of claim 3 , wherein each of the switch transistors is an N-type transistor and the circuit further comprises:
a load resistor electrically coupled between a control terminal and the ground terminal; and
a positive-temperature coefficient current source electrically coupled to the control terminal and configured to provide a control current having the positive-temperature coefficient according to the operation of the bandgap circuit to the load resistor to generate the control voltage at the control terminal, wherein the control voltage has the positive-temperature coefficient.
5. The circuit of claim 3 , wherein each of the switch transistors is a P-type transistor and the circuit further comprises:
a load resistor electrically coupled between a voltage source and the control terminal; and
a positive-temperature coefficient current source electrically coupled between the control terminal and the ground terminal and configured to provide a control current having the positive-temperature coefficient according to the operation of the bandgap circuit to generate the control voltage at the control terminal, wherein the control voltage has the negative-temperature coefficient.
6. The circuit of claim 1 , wherein the output transistor comprises a gate configured to receive the driving voltage, and the circuit further comprises a calibration switch configured to electrically couple the gate to the ground terminal under a calibration mode and to electrically isolate the gate from the ground terminal to receive the driving voltage under an operation mode.
7. The circuit of claim 6 , wherein the feedback node is further configured to receive a calibration current under the calibration mode and control one of the switch transistors to turn one under the calibration mode such that a total resistance of the variable resistive circuit makes a voltage at the feedback node generated according to the calibration current equals to a target voltage.
8. The circuit of claim 7 , wherein the target voltage is set according to a manufacturing process deviation parameter.
9. The circuit of claim 1 , wherein the bias current is outputted to an external circuit through a current mirror.
10. The circuit of claim 1 , wherein the operation amplifier, the output transistor and the variable resistive circuit are disposed inside a single chip.