Method and system for adjusting focal point position

1. A method implemented on at least one device including at least one processor and at least one computer-readable storage medium, the method comprising:

obtaining a working thermal capacity of an anode of an X-ray tube;

obtaining two training thermal capacities that are close to the working thermal capacity and two training focal point positions corresponding to the two training thermal capacities;

determining a first relationship between an offset value between a focal point position and a preset focal point position of the X-ray tube and a thermal capacity of the anode of the X-ray tube based on the two training thermal capacities and the two training focal point positions;

obtaining a second relationship between a grid voltage difference of a focusing cup of the X-ray tube and the focal point position;

determining a third relationship between a thermal capacity of the anode of the X-ray tube and the grid voltage difference based on the first relationship and the second relationship;

determining a target grid voltage difference of the focusing cup of the X-ray tube based on the working thermal capacity and the third relationship, wherein the target grid voltage difference is a difference between a first grid voltage of a first section of the focusing cup and a second grid voltage of a second section of the focusing cup; and

generating an instruction for adjusting the X-ray tube based on the target grid voltage difference.

2. The method of claim 1 , wherein the twoy training focal point positions are measured by an imaging system.

3. The method of claim 1 , wherein the two training focal point positions of the X-ray tube are obtained by:

measuring the two training focal point positions via a pin hole in a collimator of the X-ray tube.

4. The method of claim 1 , wherein the first relationship is represented in at least one form of a table, a curve, a database, or a trained model.

5. The method of claim 1 , wherein the obtaining a second relationship between a grid voltage difference of a focusing cup of the X-ray tube and the focal point position comprises:

obtaining a plurality of reference grid voltage differences of the focusing cup of the X-ray tube;

obtaining a plurality of reference focal point positions of the X-ray tube, wherein each of the plurality of reference focal point positions corresponds to one of the plurality of reference grid voltage differences, respectively; and

identifying the second relationship based on the plurality of reference grid voltage differences and the plurality of corresponding reference focal point positions.

6. The method of claim 5 , wherein the second relationship is identified by at least one of mapping, interpolation, curve fitting, or machine learning.

7. The method of claim 1 , wherein the second relationship comprises at least one of a first order function, a second or higher order function, a proportional function, a reversely proportional function, a trigonometric function, an exponential function, or a logarithm function.

8. The method of claim 1 , wherein the generating an instruction for adjusting the X-ray tube based on the target grid voltage difference comprises:

generating the instruction for adjusting at least one of the first grid voltage or the second grid voltage such that a difference between the first grid voltage and the second grid voltage after the adjustment equals the target grid voltage difference.

9. A system, comprising:

at least one computer-readable storage medium including a set of instructions; and

at least one processor in communication with the at least one computer-readable medium, wherein when executing the set of instructions, the system is directed to perform operations including:

obtaining a working thermal capacity of an anode of an X-ray tube;

obtaining two training thermal capacities that are close to the working thermal capacity and two training focal point positions corresponding to the two training thermal capacities;

determining a first relationship between an offset value between a focal point position and a preset focal point position of the X-ray tube and a thermal capacity of the anode of the X-ray tube based on the two training thermal capacities and the two training focal point positions;

obtaining a second relationship between a grid voltage difference of a focusing cup of the X-ray tube and the focal point position;

determining a third relationship between a thermal capacity of the anode of the X-ray tube and the grid voltage difference based on the first relationship and the second relationship;

determining a target grid voltage difference of the focusing cup of the X-ray tube based on the working thermal capacity and the third relationship, wherein the target grid voltage difference is a difference between a first grid voltage of a first section of the focusing cup and a second grid voltage of a second section of the focusing cup; and

generating an instruction for adjusting the X-ray tube based on the target grid voltage difference.

10. The system of claim 9 , wherein the two training focal point positions are measured by an imaging system.

11. The system of claim 9 , wherein the first relationship is represented in at least one form of a table, a curve, a database, or a trained model.

12. The system of claim 9 , wherein to obtain a second relationship between a grid voltage difference of a focusing cup of the X-ray tube and the focal point position, the system is directed to perform the operations including:

obtaining a plurality of reference grid voltage differences of the focusing cup of the X-ray tube;

obtaining a plurality of reference focal point positions of the X-ray tube, wherein each of the plurality of reference focal point positions corresponds to one of the plurality of reference grid voltage differences, respectively; and

identifying the second relationship based on the plurality of reference grid voltage differences and the plurality of corresponding reference focal point positions.

13. The system of claim 12 , wherein the second relationship is identified by at least one of mapping, interpolation, curve fitting, or machine learning.

14. The system of claim 9 , wherein the second relationship comprises at least one of a first order function, a second or higher order function, a proportional function, a reversely proportional function, a trigonometric function, an exponential function, or a logarithm function.

15. The system of claim 9 , wherein to generate an instruction for adjusting the X-ray tube based on the target grid voltage difference, the system is directed to perform the operations including:

generating the instruction for adjusting at least one of the first grid voltage or the second grid voltage such that a difference between the first grid voltage and the second grid voltage after the adjustment equals the target grid voltage difference.

16. A non-transitory computer readable medium storing instructions, the instructions, when executed by a computer, causing the computer to implement a method, comprising:

obtaining a working thermal capacity of an anode of an X-ray tube;

obtaining two training thermal capacities that are close to the working thermal capacity and two training focal point positions corresponding to the two training thermal capacities;

determining a first relationship between an offset value between a focal point position and a preset focal point position of the X-ray tube and a thermal capacity of the anode of the X-ray tube based on the two training thermal capacities and the two training focal points positions;

obtaining a second relationship between a grid voltage difference of a focusing cup of the X-ray tube and the focal point position;

determining a third relationship between a thermal capacity of the anode of the X-ray tube and the grid voltage difference based on the first relationship and the second relationship;

determining a target grid voltage difference of the focusing cup of the X-ray tube based on the working thermal capacity and the third relationship, wherein the target grid voltage difference is a difference between a first grid voltage of a first section of the focusing cup and a second grid voltage of a second section of the focusing cup; and

generating an instruction for adjusting the X-ray tube based on the target grid voltage difference.