IP Library Granted Patent US 11,515,873
Granted Patent B2
US 11,515,873 · App. 16/449,595 · Granted Nov 29, 2022

Semiconductor device and electronic device

Inventors: Hajime Kimura (Atsugi, JP); Yoshiyuki Kurokawa (Sagamihara, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H03K17/693G06N3/04G06N3/08H03K3/037H03K17/002H03K17/687H03K2017/6878
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Quick Facts
Patent No.
US 11,515,873
App. No.
16/449,595
Granted
Nov 29, 2022
Kind
B2
Abstract

A semiconductor device that can perform product-sum operation with low power is provided. The semiconductor device includes a switching circuit. The switching circuit includes first to fourth terminals. The switching circuit has a function of selecting one of the third terminal and the fourth terminal as electrical connection destination of the first terminal, and selecting the other of the third terminal and the fourth terminal as electrical connection destination of the second terminal, on the basis of first data. The switching circuit includes a first transistor and a second transistor each having a back gate. The switching circuit has a function of determining a signal-transmission speed between the first terminal and one of the third terminal and the fourth terminal and a signal-transmission speed between the second terminal and the other of the third terminal and the fourth terminal on the basis of potentials of the back gates. The potentials are determined by second data. When signals are input to the first terminal and the second terminal, a time lag between the signals output from the third terminal and the fourth terminal is determined by the first data and the second data.

Claims (46)

1. A semiconductor device comprising a first circuit, the first circuit comprising:

a switching circuit comprising:

a first transistor comprising a first gate and a second gate;

a second transistor comprising a third gate and a fourth gate; and

a first inverter circuit; and

a second inverter circuit, a third inverter circuit, and a fourth inverter circuit,

wherein the first gate of the first transistor is electrically connected to an input terminal of the first inverter circuit,

wherein the third gate of the second transistor is electrically connected to an output terminal of the first inverter circuit,

wherein one of a source and a drain of the first transistor is electrically connected to an output terminal of the second inverter circuit,

wherein one of a source and a drain of the second transistor is electrically connected to an output terminal of the third inverter circuit,

wherein the other of the source and the drain of the first transistor and the other of the source and the drain of the second transistor are electrically connected to an input terminal of the fourth inverter circuit,

wherein the switching circuit is configured to change time from output of a signal from the output terminal of the second inverter circuit to input of the signal to the input terminal of the fourth inverter circuit in response to a potential of the second gate of the first transistor, and

wherein the switching circuit is configured to change time from output of a signal from the output terminal of the third inverter circuit to input of the signal to the input terminal of the fourth inverter circuit in response to a potential of the fourth gate of the second transistor.

2. The semiconductor device according to claim 1 ,

wherein the first circuit further comprises a fifth inverter circuit, and

wherein the switching circuit is configured to control electrical connections between the output terminal of the second inverter circuit and one of the input terminal of the fourth inverter circuit and an input terminal of the fifth inverter circuit, and between the output terminal of the third inverter circuit and the other of the input terminals of the fourth inverter circuit and the fifth inverter circuit in response to a signal input to the switching circuit.

3. The semiconductor device according to claim 1 ,

wherein the switching circuit further comprises a holding unit, and

wherein the holding unit is configured to hold a potential of the second gate of the first transistor.

4. The semiconductor device according to claim 1 ,

wherein the switching circuit further comprises a holding unit comprising a third transistor and a capacitor, and

wherein one of a source and a drain of the third transistor is electrically connected to the second gate of the first transistor and the capacitor.

5. The semiconductor device according to claim 1 , wherein each of the first transistor and the second transistor comprises a metal oxide in a channel formation region.

6. The semiconductor device according to claim 1 , wherein the semiconductor device is configured to perform arithmetic operation of a neural network.

7. A semiconductor device comprising a first circuit, the first circuit comprising:

a switching circuit comprising:

a first transistor comprising a first gate and a second gate;

a second transistor comprising a third gate and a fourth gate; and

a first inverter circuit; and

a second inverter circuit and a third inverter circuit,

wherein the first gate of the first transistor is electrically connected to an input terminal of the first inverter circuit,

wherein the third gate of the second transistor is electrically connected to an output terminal of the first inverter circuit,

wherein one of a source and a drain of the first transistor is electrically connected to an output terminal of the second inverter circuit,

wherein one of a source and a drain of the second transistor is electrically connected to an output terminal of the third inverter circuit,

wherein the other of the source and the drain of the first transistor is electrically connected to a first output terminal,

wherein the switching circuit is configured to change time from output of a signal from the output terminal of the second inverter circuit to input of the signal to the first output terminal in response to a potential of the second gate of the first transistor, and

wherein the switching circuit is configured to change time from output of a signal from the output terminal of the third inverter circuit to input of the signal to the first output terminal in response to a potential of the fourth gate of the second transistor.

8. The semiconductor device according to claim 7 , wherein the switching circuit is configured to control electrical connections between the output terminal of the second inverter circuit and one of the first output terminal and a second output terminal, and between the output terminal of the third inverter circuit and the other of the first output terminal and the second output terminal in response to a signal input to the switching circuit.

9. The semiconductor device according to claim 7 ,

wherein the switching circuit further comprises a holding unit, and

wherein the holding unit is configured to hold a potential of the second gate of the first transistor.

10. The semiconductor device according to claim 7 ,

wherein the switching circuit further comprises a holding unit comprising a third transistor and a capacitor, and

wherein one of a source and a drain of the third transistor is electrically connected to the second gate of the first transistor and the capacitor.

11. The semiconductor device according to claim 7 , wherein each of the first transistor and the second transistor comprises a metal oxide in a channel formation region.

12. The semiconductor device according to claim 7 , wherein the semiconductor device is configured to perform arithmetic operation of a neural network.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 24, 2019
From: KIMURA, HAJIME; KUROKAWA, YOSHIYUKI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 049570/0350 →
Priority Claims (1)
JP JP2018-124122 · Jun 29, 2018 · national
Continuity (1)
Related Publication 20200007114A1 · Jan 2, 2020