Testing device, testing system, and testing method

1. A testing device, comprising:

a testing socket having a first upper surface and a second upper surface substantially parallel to the first upper surface; and

a reflector on the second upper surface and having at least three reflection surfaces extending from the first upper surface till the second upper surface, wherein the at least three reflection surfaces are non-parallel with each other.

2. The testing device of claim 1 , wherein the reflector defines a transmission space between the at least three reflection surfaces for accommodating a device under test (DUT).

3. The testing device of claim 1 , wherein the testing socket defines an opening, the reflector defines a first opening and a second opening opposite to the first opening, a width of the first opening is greater than a width of the second opening in a cross-sectional view, and the width of the second opening is substantially equal to a width of the opening of the testing socket.

4. The testing device of claim 1 , further comprising a device holder surrounded by the at least three reflection surfaces of the reflector, wherein the device holder is configured for receiving a device under test (DUT).

5. The testing device of claim 4 , wherein the device holder includes a receiving portion for receiving the DUT, and the receiving portion is disposed between the first upper surface and the second upper surface.

6. The testing device of claim 4 , wherein the first upper surface defines a plurality of slots, the device holder has a plurality of extending portions, and a portion of at least one of the extending portions is positioned within at least one of the slots.

7. The testing device of claim 6 , wherein the slots are recessed from the plurality of upper surfaces of the testing socket.

8. A testing device, comprising:

a testing fixture defining a first opening and a second opening opposite to the first opening, and having a plurality of reflection surfaces defining a transmission space between the first opening and the second opening; and

a device holder disposed in the transmission space, wherein the plurality of reflection surfaces are around the device holder.

9. The testing device of claim 8 , wherein the device holder defines an upper opening, a lower opening opposite to the upper opening, and a lateral opening between the upper opening and the lower opening.

10. The testing device of claim 9 , wherein the device holder includes a plurality of strips to define the upper opening, the lower opening and the lateral opening.

11. The testing device of claim 9 , wherein the testing fixture defines a plurality of slots recessed from a plurality of upper surfaces thereof, the device holder includes an extending portion supported by the testing fixture, and a portion of the extending portion is positioned within the slots.

12. The testing device of claim 11 , wherein the testing fixture includes a first side wall and a second side wall opposite to the first side wall, and the slots are recessed from an upper surface of the first side wall and an upper surface of the second side wall.

13. The testing device of claim 8 , wherein a plurality of outer surfaces of the device holder are conformal with the plurality of reflection surfaces respectively.

14. The testing device of claim 13 , wherein the testing fixture includes:

a testing socket having a plurality of side walls and a bottom wall; and

a reflector on the bottom wall and having the plurality of reflection surfaces, wherein the plurality of side walls are around the reflector, wherein a bottom surface of the device holder is substantially aligned with a bottom surface of the reflector.

15. The testing device of claim 13 , wherein a top view, the plurality of outer surfaces of the device holder overlap the plurality of reflection surfaces respectively.

16. A testing device, comprising:

a testing socket configured for accommodating a device under test (DUT) including an antenna, wherein the testing socket defines an opening; and

a test antenna disposed corresponding to the opening of the testing socket, and configured for receiving an electromagnetic wave directly radiated from the antenna of the DUT and through the opening.

17. The testing device of claim 16 , wherein the electromagnetic wave is reflected by a reflector disposed in the testing socket and then received by the test antenna.

18. The testing device of claim 16 , further comprising a test board configured to control a DUT to radiate the electromagnetic wave, wherein the DUT is disposed between the test board and the test antenna.

19. The testing device of claim 16 , further comprising a device holder configured for receiving a DUT, wherein the electromagnetic wave radiated from the antenna of the DUT at least pass through a bottom portion and a lateral portion of the device holder.

20. The testing device of claim 19 , wherein a portion of the device holder is disposed in the testing socket, and between two opposite side walls of the testing socket, wherein the bottom portion of the device holder is disposed between the DUT and the test antenna.