Device enhancements for software defined silicon implementations
Methods, apparatus, systems and articles of manufacture (e.g., physical storage media) to provide device enhancements for software defined silicon implementations are disclosed. Example apparatus disclosed herein include a request interface to receive a request for a timestamp. Disclosed example apparatus also include a property checker to determine a first value of an electrical property of a feature embedded in a silicon product, the feature having electrical properties that change over time. Disclosed example apparatus further include a relative time determiner to calculate a relative time between the request and a previous event based on the first value of the electrical property and a second value of the electrical property, the second value of the electrical property associated with the previous event.
1. An apparatus comprising:
a request interface to receive a request for a timestamp;
property checker circuitry to determine a first value of an electrical property of a feature embedded in a silicon product, the feature having electrical properties that change over time; and
relative time determiner circuitry to calculate a relative time between the request and a previous event based on the first value of the electrical property and a second value of the electrical property, the second value of the electrical property associated with the previous event.
2. The apparatus of claim 1 , wherein the feature includes a radioisotope.
3. The apparatus of claim 1 , wherein the feature includes a physical unclonable function.
4. The apparatus of claim 1 , wherein the previous event is a time of manufacture of the silicon product.
5. The apparatus of claim 1 , further including absolute time determiner circuitry to calculate an absolute time based on the relative time and a recorded time of the previous event.
6. The apparatus of claim 1 , wherein the electrical property is at least one of a resistance of the feature or a capacitance of the feature.
7. The apparatus of claim 1 , wherein the request is issued by a client enterprise system, the request issued in association with a determination of whether to disable a license.
8. A non-transitory computer readable medium, comprising instructions, which when executed, cause a machine to:
receive a request for a timestamp;
determine a first value of an electrical property of a feature embedded in a silicon product, the feature having electrical properties that change over time; and
calculate a relative time between the request and a previous event based on the first value of the electrical property and a second value of the electrical property, the second value of the electrical property associated with the previous event.
9. The non-transitory computer readable medium of claim 8 , wherein the feature includes a radioisotope.
10. The non-transitory computer readable medium of claim 8 , wherein the feature includes a physical unclonable function.
11. The non-transitory computer readable medium of claim 8 , wherein the previous event is a time of manufacture of the silicon product.
12. The non-transitory computer readable medium of claim 8 , wherein the instructions further cause the machine to calculate an absolute time based on the relative time and a recorded time of the previous event.
13. The non-transitory computer readable medium of claim 8 , wherein the electrical property is at least one of a resistance of the feature or a capacitance of the feature.
14. A method comprising:
receiving a request for a timestamp;
determining a first value of an electrical property of a feature embedded in a silicon product, the feature having electrical properties that change over time; and
calculating a relative time between the request and a previous event based on the first value of the electrical property and a second value of the electrical property, the second value of the electrical property associated with the previous event.
15. The method of claim 14 , wherein the feature includes a radioisotope.
16. The method of claim 14 , wherein the feature includes a physical unclonable function.
17. The method of claim 14 , wherein the previous event is a time of manufacture of the silicon product.
18. The method of claim 14 , further including calculating an absolute time based on the relative time and a recorded time of the previous event.
19. The method of claim 14 , wherein the electrical property is at least one of a resistance of the feature or a capacitance of the feature.
20. The method of claim 14 , wherein the request is issued by a client enterprise system, the request issued in association with a determination of whether to disable a license.