IP Library Granted Patent US 11,611,722
Granted Patent B2
US 11,611,722 · App. 17/324,235 · Granted Mar 21, 2023

Microscope system, control method, and recording medium

Inventors: Keita Kojima (Tokyo, JP); Motohiro Shibata (Tokyo, JP); Takehiko Hayashi (Tokyo, JP); Keigo Mori (Tokyo, JP)
Assignee: Evident Corporation
H04N7/181G02B21/025G02B21/365G06T5/50G06T7/0012G06V10/25G06V20/00H04N5/23296G01N21/6458G01N2021/6439G06T2207/10056G06T2207/20221G06T2207/30024
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Quick Facts
Patent No.
US 11,611,722
App. No.
17/324,235
Granted
Mar 21, 2023
Kind
B2
Abstract

A microscope system is provided with a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification, and a processor. The processor is configured to specify a type of a container in which a specimen is placed, and when starting observation of the specimen placed in the container at the second magnification, the processor is configured to specify a map region corresponding to a map image constructed by stitching together a plurality of second images acquired by the microscope at a higher magnification than the first magnification by performing object detection according to the type of the container on a first image that includes the container acquired by the microscope at the first magnification, and cause a display unit to display the first image and a range of the map region on the first image.

Claims (54)

1. A microscope system comprising:

a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification; and

a processor,

wherein:

the processor is configured to specify a type of a container in which a specimen is placed,

when starting observation of the specimen placed in the container at the second magnification, the processor is configured to:

detect a structure corresponding to the type of the container based on a first image that includes the container acquired by the microscope at the first magnification,

specify a map region based at least on a result of detecting the structure, the map region corresponding to a map image constructed by stitching together a plurality of second images acquired by the microscope at a higher magnification than the first magnification by performing object detection according to the type of the container on the first image, and

cause a display unit to display the first image and a range of the map region on the first image, and

wherein the structure corresponding to the type of the container is (i) a cover slip in a case where the type of the container is a microscope slide, (ii) a hole part provided in a dish in a case where the type of the container is the dish, and (iii) a well in a case where the type of the container is a multi-well plate.

2. The microscope system according to claim 1 , wherein the processor is configured to:

detect the specimen placed in the container based on the first image, and

specify the map region based on the result of detecting the structure and a result of detecting the specimen.

3. The microscope system according to claim 1 , wherein the processor is configured to, in the case where the type of the container is the microscope slide, specify the map region from inside the cover slip overlapping the microscope slide.

4. The microscope system according to claim 1 , wherein the processor is configured to, in the case where the type of the container is the dish, specify the map region from inside the dish.

5. The microscope system according to claim 1 , wherein the processor is configured to, in the case where the type of the container is the dish, specify the map region from inside the hole part provided in the dish.

6. The microscope system according to claim 1 , wherein the processor is configured to, in the case where the type of the container is the multi-well plate, specify the map region from inside a well provided in the multi-well plate.

7. The microscope system according to claim 1 , further comprising:

a detection unit that outputs identification information identifying the type of the container by detecting an identification structure provided in a container holder that holds the container or in the container,

wherein the processor is configured to specify the type of the container based on the identification information outputted by the detection unit.

8. The microscope system according to claim 7 , wherein:

the identification structure is a magnet, and

the detection unit is a magnetic sensor.

9. The microscope system according to claim 1 , wherein the processor is configured to specify the type of the container based on the first image.

10. A microscope system comprising:

a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification; and

a processor,

wherein:

the processor is configured to specify a type of a container in which a specimen is placed,

when starting observation of the specimen placed in the container at the second magnification, the processor is configured to:

specify a map region corresponding to a map image constructed by stitching together a plurality of second images acquired by the microscope at a higher magnification than the first magnification by performing object detection according to the type of the container on a first image that includes the container acquired by the microscope at the first magnification, and

cause a display unit to display the first image and a range of the map region on the first image, and

the processor is configured to, in a case where the type of the container is a microscope slide, specify the map region from inside a cover slip overlapping the microscope slide.

11. The microscope system according to claim 10 , wherein the processor is configured to:

detect a staining state of the specimen placed in the container based on the first image, and

change a setting of an observation method of the microscope to an observation method corresponding to a result of detecting the staining state.

12. A microscope system comprising:

a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification; and

a processor,

wherein:

the processor is configured to specify a type of a container in which a specimen is placed,

when starting observation of the specimen placed in the container at the second magnification, the processor is configured to:

specify a map region corresponding to a map image constructed by stitching together a plurality of second images acquired by the microscope at a higher magnification than the first magnification by performing object detection according to the type of the container on a first image that includes the container acquired by the microscope at the first magnification, and

cause a display unit to display the first image and a range of the map region on the first image, and

the processor is configured to, in a case where the type of the container is a dish, specify the map region from inside the dish.

13. A microscope system comprising:

a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification; and

a processor,

wherein:

the processor is configured to specify a type of a container in which a specimen is placed,

when starting observation of the specimen placed in the container at the second magnification, the processor is configured to:

specify a map region corresponding to a map image constructed by stitching together a plurality of second images acquired by the microscope at a higher magnification than the first magnification by performing object detection according to the type of the container on a first image that includes the container acquired by the microscope at the first magnification, and

cause a display unit to display the first image and a range of the map region on the first image, and

the processor is configured to, in a case where the type of the container is a multi-well plate, specify the map region from inside a well provided in the multi-well plate.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 7, 2022
From: OLYMPUS CORPORATION
To: EVIDENT CORPORATION
Reel/Frame 061008/0214 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 12, 2021
From: KOJIMA, KEITA; SHIBATA, MOTOHIRO; HAYASHI, TAKEHIKO; MORI, KEIGO
To: OLYMPUS CORPORATION
Reel/Frame 057766/0322 →
Priority Claims (1)
JP JP2020-088467 · May 20, 2020 · national
Continuity (1)
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