IP Library Granted Patent US 11,614,550
Granted Patent B2
US 11,614,550 · App. 17/046,105 · Granted Mar 28, 2023

X-ray detector with focused scintillator structure for uniform imaging

Inventors: Heidrun Steinhauser (Eindhoven, NL); Onno Jan Wimmers (Valkenswaard, NL)
Assignee: KONINKLIJKE PHILIPS N.V.
G01T1/20186G01N23/04G01T1/202
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Quick Facts
Patent No.
US 11,614,550
App. No.
17/046,105
Granted
Mar 28, 2023
Kind
B2
Abstract

Dual layer detector (XD) for X-ray imaging, comprising at least two light sensitive surfaces (LSS 1 ,LSS 2 ). The dual layer detector further comprises a first scintillator layer (SL, SL 1 ) including at least one scintillator element (SE) capable of converting X-radiation into light, the element having two faces, an ingress face (S 1 ) for admitting X-radiation into the element (SE) and an egress face (S 2 ) distal from the ingress face (S 1 ), wherein the two faces (S 1 ,S 2 ) are arranged shifted relative to each other, so that a longitudinal axis (LAX) of the scintillator element (SE) is inclined relative to a normal (n) of the layer. The scintillator element (SE) has a sidewall (w,w 1 ) extending between the two faces (S 1 ,S 2 ), the scintillator layer (SL) further comprising a second such scintillator element (SE′) having a sidewall (w′,w 1 ′), the second scintillator element (SE′) neighboring the first scintillator element (SE), wherein the sidewall (w,w 1 ) of the first scintillator element (SE) and the sidewall (w′,w 1 ′) of the second scintillator element (SE) are neighbored and are inclined relative to each other. The dual layer detector (XD) further comprises a second such scintillator layer (SL 2 ). One of the light sensitive surfaces (LSS 1 ,LSS 2 ) is arranged in between the two scintillator layers (SL 1 , SL 2 ).

Claims (24)

1. A dual layer detector for X-ray imaging, comprising:

at least two light sensitive surfaces;

a first scintillator layer including a first scintillator element and a second scintillator element configured to convert X-radiation into light, the first scintillator element neighboring the second scintillator element;

a second scintillator layer, wherein at least one of the light sensitive surfaces is arranged between the first and second scintillator layers,

wherein the first scintillator element has two faces, wherein the two faces are an ingress face configured to admit the X-radiation into the first scintillator element and an egress face distal from the ingress face, wherein the two faces are arranged shifted relative to each other, so that a longitudinal axis of the first scintillator element is inclined relative to a normal line of the ingress face, the normal line intersecting the longitudinal axis at the ingress face, wherein the first scintillator element has a sidewall extending between the two faces, the second scintillator element having a sidewall, wherein the sidewall of the first scintillator element and the sidewall of the second scintillator element are neighbored, and wherein the sidewall of the first scintillator element and the sidewall of the second scintillator element are inclined relative to the normal line at different angles, respectively, to define a wedge-shaped interspace or gap.

2. The dual layer detector of claim 1 , wherein the at least one respective scintillator element has at least one of an oblique prism shape, and an oblique conical shape.

3. The dual layer detector of claim 1 , wherein a cross-section of respective said at least one element is a polygon.

4. The dual layer detector of claim 1 , wherein respective cross sections of the respective at least one scintillator element are constant along a longitudinal axis.

5. The dual layer detector of claim 1 , wherein the two faces are arranged shifted along at least two different directions.

6. The dual layer detector of claim 1 , wherein the respective at least one element is formed by additive manufacturing.

7. The dual layer detector as per claim 1 , further comprising a light reflective substance at least partly surrounding the respective element.

8. The dual layer detector as per claim 1 , wherein respective longitudinal axes of the respective scintillator elements pass through their respective faces and aligned so as to focus on an imaginary spatial point located outside the layer.

9. The dual layer detector as per claim 1 , wherein the two light sensitive surfaces are arranged between the two scintillator layers.

10. The dual layer detector of claim 1 , wherein a connecting edge of the first scintillator element, which is arranged between the ingress face and the egress face, has a stepped profile.

11. The dual layer detector as per claim 1 , further comprising a light reflective substance disposed in the wedge-shaped interspace or gap,

wherein the light reflective substance includes a first sidewall and a second sidewall, the first sidewall being in surface contact with the sidewall of the first scintillator element, the second sidewall being in surface contact with the sidewall of the second scintillator element, and

wherein the first sidewall and the second sidewall are inclined relative to the normal line at different angles, respectively, to define a wedge-shaped light reflective substance portion between the neighboring scintillator elements.

12. An X-ray imaging apparatus, comprising:

an X-ray source comprising a focal spot; and

a dual layer detector for X-ray imaging, comprising:

at least two light sensitive surfaces;

a first scintillator layer including a first scintillator element and a second scintillator element configured to convert X-radiation into light, the first scintillator element neighboring the second scintillator element;

a second scintillator layer, wherein at least one of the light sensitive surfaces is arranged between the first and second scintillator layers,

wherein the first scintillator element has two faces, wherein the two faces are an ingress face configured to admit the X-radiation into the first scintillator element and an egress face distal from the ingress face, wherein the two faces are arranged shifted relative to each other, so that a longitudinal axis of the first scintillator element is inclined relative to a normal line of the ingress face, the normal line intersecting the longitudinal axis at the ingress face, wherein the first scintillator element has a sidewall extending between the two faces, the second scintillator element having a sidewall, wherein the sidewall of the first scintillator element and the sidewall of the second scintillator element are neighbored, and wherein the sidewall of the first scintillator element and the sidewall of the second scintillator element are inclined relative to the normal line at different angles, respectively, to define a wedge-shaped interspace or gap.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 8, 2020
From: STEINHAUSER, HEIDRUN; WIMMERS, ONNO JAN
To: KONINKLIJKE PHILIPS N.V.
Reel/Frame 054008/0464 →
Priority Claims (1)
EP 18167073 · Apr 12, 2018 · regional
Continuity (1)
Related Publication 20210239860A1 · Aug 5, 2021