IP Library Granted Patent US 11,633,724
Granted Patent B2
US 11,633,724 · App. 17/861,320 · Granted Apr 25, 2023

Methods for exhaust gas purification

Inventors: Shunsuke Oishi (Kakegawa, JP); Takaya Ota (Kakegawa, JP); Yoshinori Saito (Toyota, JP); Seiji Nakahigashi (Toyota, JP); Isao Chinzei (Toyota, JP); Hiromasa Suzuki (Toyota, JP)
Assignees: CATALER CORPORATION; TOYOTA JIDOSHA KABUSHIKI KAISHA
B01J23/63B01D53/9413B01J35/0006B01J37/0228B01J37/0244F01N3/2803B01D2255/1025B01D2255/407B01D2255/9022F01N2370/04
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Quick Facts
Patent No.
US 11,633,724
App. No.
17/861,320
Granted
Apr 25, 2023
Kind
B2
Abstract

Methods for exhaust gas purification, including the steps of: attaching an exhaust gas purification catalyst to an exhaust system of an internal combustion engine, and supplying an exhaust gas to the exhaust gas purification catalyst, where the exhaust gas purification catalyst includes an upper layer containing first carrier particles which are particles of an inorganic oxide and rhodium, and a lower layer containing second carrier particles which are particles of an inorganic oxide, the upper layer includes a rhodium-rich portion near the surface of the upper layer on the upstream side of the exhaust gas flow, and the existence range of the rhodium-rich portion is in a range of greater than 50% to 80% of the length of the upper layer from a downstream side end of an exhaust gas flow and of less than 20 μm in the depth direction from an outermost surface of the upper layer.

Claims (18)

1. A method for exhaust gas purification, comprising the steps of:

attaching an exhaust gas purification catalyst to an exhaust system of an internal combustion engine, and

supplying an exhaust gas to the exhaust gas purification catalyst, wherein

the exhaust gas purification catalyst comprises

an upper layer containing first carrier particles which are particles of an inorganic oxide and rhodium, and

a lower layer containing second carrier particles which are particles of an inorganic oxide,

the upper layer includes a rhodium-rich portion near the surface of the upper layer on the upstream side of the exhaust gas flow,

the existence range of the rhodium-rich portion is in a range of greater than 50% to 80% of the length of the upper layer from a downstream side end of an exhaust gas flow and of less than 20 μm in the depth direction from an outermost surface of the upper layer, and

the rhodium-rich portion contains rhodium in an amount of 55% to less than 100% of the total rhodium included in the upper layer, and

the exhaust gas purification catalyst is attached to the exhaust system so that the rhodium-rich portion thereof faces the downstream side of the exhaust gas flow.

2. The method according to claim 1 , wherein the range of the rhodium-rich portion in an exhaust gas flow direction is up to 70% of the length from the upper layer exhaust stream flow downstream side end.

3. The method according to claim 2 , wherein the range of the rhodium-rich portion in the depth direction is a range of up to 18 μm in the depth direction from the outermost surface of the upper layer.

4. The method according to claim 1 , wherein

the upper layer contains ceria, and a content of ceria in the upper layer is greater than 5% by mass to 25% by mass or less, when the total mass of the first carrier particles in the upper layer is 100% by mass.

5. The method according to claim 4 , wherein the content of ceria in the upper layer is 7% by mass to 15% by mass, when the total mass of the first carrier particles in the upper layer is 100% by mass.

6. The method according to claim 1 , wherein a quantity of rhodium included in the range of the rhodium-rich portion up to 50% of the length of the rhodium-rich portion from the downstream side end of the exhaust gas flow is 70% or less of the quantity of rhodium included in the rhodium-rich portion.

7. The method according to claim 1 , wherein the lower layer and the upper layer are present on a substrate.

8. The method according to claim 1 , wherein the lower layer constitutes a part or the entirety of a substrate, and the upper layer is present on the lower layer.

Priority Claims (1)
JP JP2018-029033 · Feb 21, 2018 · national
Continuity (2)
Division 16970519
Related Publication 20220339606A1 · Oct 27, 2022
Cited By (1)
US 12,201,965