Methods and apparatus for beam management for device communications
A method includes receiving, from a second device, a signal using each beam of a first subset of beams of a beam set arranged in a layout, measuring a beam quality of the signal received using each beam of the first subset of beams, estimating a beam quality of the signal for each beam of a second subset of beams of the beam set, the first subset of beams and the second subset of beams comprising different beams, and the estimating being in accordance with the measured signal quality of the first subset of beams, selecting a beam from the beam set, selecting the beam being in accordance with the measured beam quality and the estimated beam quality, and communicating, with the second device, using the beam.
1. A method implemented by a first device, the method comprising:
receiving, by the first device from a second device, a signal using each beam of a first subset of beams of a beam set arranged in a layout;
measuring, by the first device, a beam quality of the signal received using each beam of the first subset of beams;
estimating, by the first device, a beam quality of the signal for each beam of a second subset of beams of the beam set, the first subset of beams and the second subset of beams comprising different beams, the second subset comprising at least one beam whose beam quality is not measured, and the estimating being in accordance with the measured signal quality of the first subset of beams;
selecting, by the first device, a beam from the beam set, selecting the beam being in accordance with the measured beam quality and the estimated beam quality; and
communicating, by the first device with the second device, using the selected beam.
2. The method of claim 1 , the first subset of beams and the second subset of beams being disjoint.
3. The method of claim 1 , a coverage area of each beam of the second subset of beams partially overlapping a coverage area of at least two beams of the first subset of beams.
4. The method of claim 1 , estimating the beam quality comprising, for each beam of the second subset of beams, determining the estimated beam quality of the beam of the second subset of beams as a combination of the measured beam quality of at least two beams of the first subset of beams having a coverage area that partially overlaps a coverage area of the beam of the second subset of beams.
5. The method of claim 4 , wherein the combination includes one of a sum, a weighted sum, a product, a weighted product, a linear combination, or a non-linear combination, of the measured beam quality of the at least two beams.
6. The method of claim 5 , the estimated beam quality being a weighted sum of the measured beam quality of the at least two beams, and the method further comprising determining, by the first device, a weighting factor for each beam of the first subset of beams.
7. The method of claim 1 , wherein the beam quality comprises at least one of a signal plus interference to noise ratio (SINR) of the signal, a signal to noise ratio (SNR) of the signal, a reference signal received power (RSRP) of the signal, a reference signal received quality (RSRQ) of the signal, or a received signal power of the signal.
8. The method of claim 1 , the first device being a user equipment (UE), and the second device being an access node.
9. The method of claim 1 , the beam set comprising 9 beams arranged in a 3×3 grid layout, and the first subset of beams comprising 4 beams arranged in a diamond layout.
10. The method of claim 1 , the beam set comprising 9 beams arranged in a 3×3 grid layout, and the first subset of beams comprising 5 beams arranged in a diagonal layout.
11. The method of claim 1 , the beam set comprising 7 beams arranged in a hexagonal layout, the first subset of beams and the second subset of beams comprising different beams of the 7 beams.
12. A first device comprising:
a non-transitory memory storage comprising instructions; and
one or more processors in communication with the memory storage, wherein the one or more processors execute the instructions to:
receive, from a second device, a signal using each beam of a first subset of beams of a beam set arranged in a layout;
measure a beam quality of the signal received using each beam of the first subset of beams;
estimate a beam quality of the signal for each beam of a second subset of beams of the beam set, the first subset of beams and the second subset of beams comprising different beams, the second subset comprising at least one beam whose beam quality is not measured, and the estimating of the beam quality of the signal being in accordance with the measured signal quality of the first subset of beams;
select a beam from the beam set, selecting the beam being in accordance with the measured beam quality and the estimated beam quality; and
communicate, with the second device, using the selected beam.
13. The first device of claim 12 , the first subset of beams and the second subset of beams being disjoint.
14. The first device of claim 12 , a coverage area of each beam of the second subset of beams partially overlapping a coverage area of at least two beams of the first subset of beams.
15. The first device of claim 12 , the one or more processors further executing the instructions to, for each beam of the second subset of beams, determine the estimated beam quality of the beam of the second subset of beams as a combination of the measured beam quality of at least two beams of the first subset of beams having a coverage area that partially overlaps a coverage area of the beam of the second subset of beams.
16. The first device of claim 15 , wherein the combination includes one of a sum, a weighted sum, a product, a weighted product, a linear combination, or a non-linear combination, of the measured beam quality of the at least two beams.
17. The first device of claim 16 , the estimated beam quality being a weighted sum of the measured beam quality of the at least two beams, and the one or more processors further executing the instructions to determine a weighting factor for each beam of the first subset of beams.
18. The first device of claim 12 , wherein the beam quality comprises at least one of a signal plus interference to noise ratio (SINR) of the signal, a signal to noise ratio (SNR) of the signal, a reference signal received power (RSRP) of the signal, a reference signal received quality (RSRQ) of the signal, or a received signal power of the signal.
19. The first device of claim 12 , the beam set comprising 9 beams arranged in a 3×3 grid layout, and the first subset of beams comprising 4 beams arranged in a diamond layout.
20. The first device of claim 12 , the beam set comprising 9 beams arranged in a 3×3 grid layout, and the first subset of beams comprising 5 beams arranged in a diagonal layout.
21. The first device of claim 12 , the beam set comprising 7 beams arranged in a hexagonal layout, the first subset of beams and the second subset of beams comprising different beams of the 7 beams.