Inspection system, inspection method, program, and storage medium
An inspection system includes an acquisition unit and a determination unit. The acquisition unit acquires an image representing a surface of an object. The determination unit performs color determination processing. The color determination processing is performed to determine a color of the surface of the object based on a plurality of conditions of reflection. The plurality of conditions of reflection are obtained from the image representing the surface of the object as acquired by the acquisition unit, and have a specular reflection component and a diffuse reflection component at respectively different ratios on the surface of the object.
1. An inspection system comprising:
an acquisitor configured to acquire a plurality of images representing a surface of an object;
a separator configured to respectively obtain a plurality of first separate images from the plurality of images acquired by the acquisitor, the plurality of first separate images representing a condition of reflection in which a proportion of a specular reflection component on the surface of the object is greater than a proportion of a diffuse reflection component on the surface of the object; and
a determiner configured to synthesize together the plurality of first separate images respectively obtained from the plurality of images to generate a first synthetic image, wherein
the determiner is configured to determine a condition of the object based on the first synthetic image.
2. The inspection system of claim 1 , wherein
the separator is configured to respectively obtain the plurality of first separate images and a plurality of second separate images from the plurality of images acquired by the acquisitor.
3. The inspection system of claim 2 , wherein
the plurality of second separate images represents a condition of reflection in which the proportion of the diffuse reflection component on the surface of the object is greater than the proportion of the specular reflection component on the surface of the object.
4. The inspection system of claim 2 , wherein
the determiner is configured to synthesize together the plurality of second separate images respectively obtained from the plurality of images to generate a second synthetic image,
the determiner is configured to determine the condition of the object based on the second synthetic image.
5. The inspection system of claim 2 , further comprising:
a lighting system configured to irradiate the surface of the object with light, wherein
the lighting system includes a lamp for irradiating the surface of the object with light, and
the lamp radiates white light.
6. The inspection system of claim 3 , wherein
the determiner is configured to determine a color of the surface of the object using sample data including information about a target color of the surface of the object.
7. The inspection system of claim 3 , wherein the determiner is configured to determine the condition of the object using sample data including information about a shape of the surface of the object.
8. An inspection method comprising the steps of:
acquiring a plurality of images representing a surface of an object;
respectively obtaining a plurality of separate images from the plurality of images acquired in the step of acquiring the plurality of images, the plurality of separate images representing a condition of reflection in which a proportion of a specular reflection component on the surface of the object is greater than a proportion of a diffuse reflection component on the surface of the object; and
synthesizing together the plurality of separate images respectively obtained from the plurality of images to generate a synthetic image, wherein
the step of synthesizing together the plurality of separate images includes determining a condition of the object based on the synthetic image.