Pixel size reduction method for event driven sensors

1. An event sensor comprising:

a plurality of pixels, each pixel configured to output pixel data, wherein, in a first state, the pixel data provides a differential value of the intensity of incident illumination and, in a second state, the pixel data provides an absolute value of the intensity of the incident illumination;

an external readout line shared among the plurality of pixels; and

an external processing circuit configured to output a stream of pixel events, each respective pixel event generated when a comparator of the external processing circuit obtains a sample of pixel data from a particular pixel via the external readout line that breaches a threshold value.

2. The event sensor of claim 1 , wherein the external processing circuit comprises:

a controller configured to arbitrate access to the external readout line among the plurality of pixels by selectively activating a readout switch located within each pixel using a selection signal.

3. The event sensor of claim 1 , wherein samples of pixel data transferred to the external processing circuit from an output of each pixel in an analog domain is converted into a digital domain prior to reaching an input terminal of the comparator.

4. The event sensor of claim 1 , wherein the external processing circuit is further configured to output grayscale image data defining an absolute value of the intensity of incident illumination at each pixel.

5. The event sensor of claim 1 , wherein the external readout line is capacitively coupled to the external processing circuit.

6. The event sensor of claim 1 , wherein the plurality of pixels form a column of a pixel array.

7. A pixel comprising:

a photodetector circuit configured to generate, at a sample node, pixel data, wherein, in a first state, the pixel data provides a differential value of the intensity of incident illumination and, in a second state, the pixel data provides an absolute value of the intensity of the incident illumination;

an output node coupled to an external processing circuit via an external readout line shared among a plurality of pixels, the external processing circuit configured to output a stream of pixel events, each respective pixel event generated when a comparator of the external processing circuit obtains a sample of pixel data from a particular pixel via the external readout line that breaches a threshold value; and

a readout switch intervening between the photodetector circuit and the output node that is configured to isolate the sample node from the output node until a selection signal is received from a controller of the external processing circuit.

8. The pixel of claim 7 , wherein the photodetector circuit includes a logarithmic amplifier configured to convert photocurrent that is proportional to the intensity of incident illumination into a voltage.

9. The pixel of claim 7 , wherein the photodetector circuit includes a photodiode coupled to the sample node via a buffer amplifier.

10. The pixel of claim 7 , further comprising:

a capacitor intervening between the photodetector circuit and the switch.

11. The pixel of claim 10 , further comprising:

a grayscale switch coupled in parallel with the capacitor, the grayscale switch configured to transition to a closed state in response to receiving a grayscale signal from the controller, wherein the pixel data provides an absolute value of the intensity of incident illumination when the grayscale switch is in the closed state.

12. The pixel of claim 7 , further comprising:

a switched capacitor amplifier intervening between the photodetector circuit and the switch.

13. The pixel of claim 12 , wherein an operating point of the switched capacitor amplifier is reset in response to receiving a reset signal from the controller.

14. The pixel of claim 12 , wherein an operating point of the switched capacitor amplifier is reset in response to receiving the selection signal and a reset signal from the controller.

15. The pixel of claim 7 , wherein a voltage of the pixel data at the sample node is set to a reference voltage associated with the threshold value in response to receiving a reset signal at the pixel.

16. An event sensor comprising:

an external readout line shared among a plurality of pixels, each pixel configured to output pixel data, wherein, in a first state, the pixel data provides a differential value of the intensity of incident illumination and, in a second state, the pixel data provides an absolute value of the intensity of the incident illumination; and

an external processing circuit configured to output a stream of pixel events, each respective pixel event generated when a comparator of the external processing circuit obtains a sample of pixel data from a particular pixel via the external readout line that breaches a threshold value.

17. The event sensor of claim 16 , wherein each pixel includes a sampling node coupled to the external readout line via a readout switch, and wherein the external processing circuit comprises a controller configured to reset a voltage appearing at the sampling node each time the readout switch is activated.

18. The event sensor of claim 16 , wherein the external processing circuit includes a differencing circuit configured to remove a direct current voltage component from samples of pixel data provided to the comparator.

19. The event sensor of claim 16 , wherein the external processing circuit is further configured to output data defining an absolute value of the intensity of incident illumination at each pixel.

20. The event sensor of claim 16 , wherein each respective pixel event includes address information for the particular pixel producing the sample of pixel data that breaches the threshold value, the address information being determined based on a time that the comparator obtains the sample.