IP Library Granted Patent US 11,921,903
Granted Patent B1
US 11,921,903 · App. 18/327,755 · Granted Mar 5, 2024

Machine learning model fingerprinting

Inventors: David Beveridge (Tillamook, OR); Andrew Davis (Portland, OR)
Assignee: HiddenLayer, Inc.
G06F21/64G06F21/577G06F21/629
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Quick Facts
Patent No.
US 11,921,903
App. No.
18/327,755
Granted
Mar 5, 2024
Kind
B1
Abstract

Data is received that characterizes artefacts associated with each of a plurality of layers of a first machine learning model. Fingerprints are then generated for each of the artefacts in the layers of the first machine learning model. These generated fingerprints collectively form a model indicator for the first machine learning model. It is then determined whether the first machine learning model is derived from another machine learning model by performing a similarity analysis between the model indicator for the first machine learning model and model indicators generated for each of a plurality of reference machine learning models each comprising a respective set of fingerprints. Data characterizing the determination can be provided to a consuming application or process. Related apparatus, systems, techniques and articles are also described.

Claims (39)

1. A method for implementation by one or more computing devices comprising:

receiving data characterizing artefacts associated with each of a plurality of layers of a first machine learning model;

generating, for each layer of the first machine learning model, fingerprints corresponding to each of the artefacts in such layer, the generated fingerprints collectively forming a model indicator for the first machine learning model;

determining whether the first machine learning model is derived from another machine learning model by performing a similarity analysis between the model indicator for the first machine learning model and model indicators generated for each of a plurality of reference machine learning models each comprising a respective set of fingerprints, the similarity analysis determining a number of values in each fingerprint of the first machine learning model within each of a plurality of pre-defined bin to generate a first value distribution and comparing the first value distribution with value distributions for each of the plurality of reference machine learning models; and

providing data characterizing the determining to a consuming application or process.

2. The method of claim 1 , wherein the artefacts comprise: weights, biases, running mean, and running variance.

3. The method of claim 1 , wherein the similarity analysis is conducted on an fingerprint-by-fingerprint basis.

4. The method of claim 1 , wherein the similarity analysis is conducted on a model indicator-by-model indicator basis.

5. The method of claim 1 , wherein each fingerprint comprises a matrix of values.

6. The method of claim 1 further comprising:

determining, as part of the similarity analysis, a Euclidean distance from each fingerprint of the first machine learning model relative to each fingerprint of the reference machine learning models.

7. The method of claim 1 , wherein the similarity analysis comprises:

inputting a reference set of inputs into the first machine learning model to generate an output set; and

comparing the output set to outputs for each of a plurality of reference output sets each corresponding to a different one of the reference machine learning models.

8. The method of claim 1 , wherein the providing data comprises one or more of: storing the data characterizing the determining in physical persistence, loading the data characterizing the determining into memory, transmitting the data characterizing the determining over a network to a remote computing device, or causing the data characterizing the determining to be displayed in a graphical user interface.

9. The method of claim 1 , wherein the derivation determination is based on a level of similarity between the first machine learning model and one of the reference machine learning models.

10. The method of claim 9 further comprising: generating a score characterizing the level of similarity, wherein the score forms part of the provided data.

11. The method of claim 1 further comprising:

initiating, by the consuming application or process and based on the determining, a remediation operation relative to the first machine learning model.

12. The method of claim 11 , wherein the remediation operation comprises: isolating or blocking access to the first machine learning model.

13. The method of claim 11 , wherein the remediation operation comprises: partially disabling functionality of the first machine learning model.

14. The method of claim 11 , wherein the remediation operation comprises: logging inputs and/or outputs of the first machine learning model.

15. The method of claim 11 , wherein the remediation operation comprises: poisoning the first machine learning model.

16. The method of claim 1 , wherein at least one of the artefacts only has a single corresponding generated fingerprint.

17. The method of claim 1 , wherein at least one of the artefacts has a plurality of corresponding generated fingerprints.

18. A method for implementation by one or more computing devices comprising:

receiving data characterizing artefacts associated with each of a plurality of layers of a machine learning model;

generating, for each layer of the machine learning model, fingerprints corresponding to each of the artefacts in such layer, the generated fingerprints collectively forming a model indicator for the machine learning model; and

providing the model indicator to a consuming application or process

wherein the consuming application or process conducts a similarity analysis to determine a provenance of the machine learning model, the similarity analysis comprising determining a number of values in each fingerprint of the machine learning model within each of a plurality of pre-defined bin to generate a first value distribution and comparing the first value distribution with value distributions for each of a plurality of reference machine learning models.

19. A system comprising:

at least one data processor; and

memory storing instructions which, when executed by the at least one data processor, result in operations comprising:

receiving data characterizing artefacts associated with each of a plurality of layers of a first machine learning model;

generating, for each layer of the first machine learning model, fingerprints corresponding to each of the artefacts in such layer, the generated fingerprints collectively forming a model indicator for the first machine learning model;

determining whether the first machine learning model is derived from another machine learning model by performing a similarity analysis between the model indicator for the first machine learning model and model indicators generated for each of a plurality of reference machine learning models each comprising a respective set of fingerprints, the similarity analysis determining a number of values in each fingerprint of the first machine learning model within each of a plurality of pre-defined bin to generate a first value distribution and comparing the first value distribution with value distributions for each of the plurality of reference machine learning models; and

providing data characterizing the determining to a consuming application or process.

20. The system of claim 19 , wherein the operations further comprise:

initiating, by the consuming application or process and based on the determining, a remediation operation relative to the first machine learning model.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 6, 2023
From: BEVERIDGE, DAVID; DAVIS, ANDREW
To: HIDDENLAYER, INC.
Reel/Frame 063871/0480 →
Cited By (9)
US 12,235,999 US 12,306,935 US 12,321,498 US 12,462,018 US 12,481,793 US 12,536,338 US 12,572,650 US 12,596,965 US 12,682,234