IP Library › Granted Patent US 11,953,544
Granted Patent B1
US 11,953,544 · App. 18/337,973 · Granted Apr 9, 2024

Systems and methods for testing functionality and performance of a sensor and hub

Inventor: Jeron E. Bornstein (Delray Beach, FL)
Assignee: The ADT Security Corporation
G01R31/2834G01R31/287G01R31/2874
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Quick Facts
Patent No.
US 11,953,544
App. No.
18/337,973
Granted
Apr 9, 2024
Kind
B1
Abstract

A system for testing a sensor and a hub is provided. The system includes a testing control device and a sensor testing device. The testing control device is configured to select a testing profile based at least in part on the sensor, and transmit a testing initiation signal based at least in part on the testing profile. The sensor testing device is configured to perform testing of the sensor and the hub in response to the testing initiation signal, the testing including rotating the sensor along at least one axis based at least in part on the testing profile, and transmit test data to the testing control device based at least in part on the testing of the sensor and the hub. The testing control device is configured to receive the test data from the sensor testing device.

Claims (17)

1. A method in a system for testing a sensor and a hub, the sensor and the hub being configured to communicate with each other, the system comprising a testing control device and a sensor testing device configured to communicate with the testing control device, the method comprising:

selecting, in the testing control device, a testing profile based at least in part on the sensor, the testing profile corresponding to an operating condition of the sensor and the hub to be tested;

transmitting a testing initiation signal from the testing control device to the sensor testing device based at least in part on the testing profile;

performing, in the sensor testing control device, testing of the sensor and the hub in response to the testing initiation signal, the testing comprising:

rotating the sensor along at least one axis based at least in part on the testing profile; and

simulating the operating condition of the sensor and the hub;

generating test data based on the simulation of the operating condition;

transmitting the test data from the sensor testing device to the testing control device based at least in part on the testing of the sensor and the hub; and

receiving, in the testing control device, the test data from the sensor testing device.

2. The method of claim 1 , further comprising rotating the sensor along a first axis for a plurality of rotations, each of the plurality of rotations being according to a predefined increment.

3. The method of claim 1 , wherein generating the test data further comprises generating a plurality of measurements associated with signaling characteristics of at least one of signaling from the hub to the sensor or signaling from the sensor to the hub, each measurement of the plurality of measurements being mapped to a corresponding angle of rotation of the sensor.

4. The method of claim 1 , wherein the sensor comprises two sub-modules, the method further comprising rotating the two sub-modules relative to one another.

5. The method of claim 1 , further comprising simulating, for the sensor, a presence of at least one of water, heat, motion, or a chemical.

6. The method of claim 1 , wherein simulating the operating condition further comprises causing a movable barrier to change position while performing the testing of the sensor, the movable barrier being disposed between the sensor and the hub.

7. The method of claim 1 , wherein simulating the operating condition further comprises causing at least one of a plurality of movable barriers to change position while performing the testing of the sensor, each of the plurality of movable barriers comprising at least one of a glass material, a cement material, a wood material, a metal material, a plastic material, or a drywall material.

8. The method of claim 1 , wherein simulating the operating condition further comprises transmitting at least one of a simulated interference signal or a simulated noise signal.

9. The method of claim 1 , wherein generating test data further comprises measuring at least one of a temperature of the sensor, a battery level of the sensor, an audible indication produced by sensor, or a visible indication produced by sensor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 15, 2023
From: BORNSTEIN, JERON E.
To: THE ADT SECURITY CORPORATION
Reel/Frame 064915/0951 →
Cited By (1)
US 12,560,645