Calibration scheme for a non-linear ADC
In described examples, an analog to digital converter (ADC), having an input operable to receive an analog signal and an output operable to output a digital representation of the analog signal, includes a voltage to delay (VD) block. The VD block is coupled to the input of the ADC and generates a delay signal responsive to a calibration signal. A backend ADC is coupled to the VD block, and receives the delay signal. The backend ADC having multiple stages including a first stage. A calibration engine is coupled to the multiple stages and the VD block. The calibration engine measures an error count of the first stage and stores a delay value of the first stage for which the error count is minimum.
1. An analog to digital converter (ADC) comprising:
a voltage to delay (VD) block configured to generate a delay signal responsive to a calibration signal;
a backend ADC coupled to the VD block and configured to receive the delay signal, the backend ADC having a plurality of stages including a first stage; and
a calibration circuit coupled to the plurality of stages and the VD block, the calibration circuit configured to:
determine an error count of the first stage in response to the delay signal; and
store a delay value of the first stage for which the error count is minimum.
2. The ADC of claim 1 , wherein each stage of the plurality of stages comprises:
a delay block coupled to the calibration circuit;
an AND gate coupled to the delay block; and
a delay comparator coupled to the delay block and the calibration circuit.
3. The ADC of claim 1 , wherein the calibration circuit further comprises an accumulator, and the calibration circuit is configured to generate a plurality of input codes.
4. The ADC of claim 3 further comprising a DAC (digital to analog converter) coupled to the calibration circuit, and configured to generate the calibration signal in response to an input code of the plurality of input codes.
5. The ADC of claim 4 configured to operate in a delay- calibration mode, a memory-calibration mode, and a mission mode, wherein the delay-calibration mode includes a plurality of cycles, and in a cycle of the plurality of cycles:
the calibration circuit is configured to modify the delay value of a first delay block in the first stage;
the calibration circuit is configured to generate the plurality of input codes;
the VD block is configured to generate a plurality of delay signals in response to the plurality of input codes;
the first stage is configured to generate a digital code in response to the plurality of delay signals; and
the accumulator is configured to determine the error count of the first stage, in which the error count is an absolute difference in a number of ones and zeroes in the digital code.
6. The ADC of claim 5 , wherein the delay value for which the error count of the first stage is minimum is stored in the calibration circuit as the delay value of the first stage.
7. The ADC of claim 6 further comprising a second stage in the backend ADC, the second stage is coupled to the first stage, and configured to receive an output of the first stage, wherein in the delay-calibration mode;
the calibration circuit is configured to modify a delay value of a second delay block in the second stage;
the calibration circuit is configured to generate the plurality of input codes;
the VD block is configured to generate a plurality of delay signals in response to the plurality of input codes the second stage is configured to generate a digital code in response to the plurality of delay signals; and
the accumulator is configured to determine the error count of the second stage, in which the error count is the absolute difference in a number of ones and zeroes in the digital code.
8. The ADC of claim 7 , wherein the delay value for which the error count of the second stage is minimum is stored in the calibration circuit as the delay value of the second stage.
9. The ADC of claim 8 further comprising a storage circuit coupled to the backend ADC.
10. The ADC of claim 9 , wherein in the memory-calibration mode:
the calibration circuit is configured to generate a plurality of input codes;
the DAC is configured to generate a calibration signal in response to an input code of the plurality of input codes;
the VD block is configured to generate a delay signal responsive to the calibration signal;
the backend ADC is configured to generate an output code responsive to the delay signal; and
the storage circuit is configured to store the input code at an address corresponding to the output code.
11. The ADC of claim 5 , wherein in the mission mode:
the VD block is configured to generate a delay signal in response to an input voltage; and
the backend ADC is configured to generate a raw code in response to the delay signal, wherein the input code stored at an address corresponding to the raw code is generated as a final output.
12. The ADC of claim 4 further comprising a multiplexer coupled to the DAC, the multiplexer configured to receive an input voltage and the calibration signal.
13. The ADC of claim 12 , wherein the VD block further comprising:
one or more preamplifiers, each preamplifier configured to compare one of the input voltage and the calibration signal to a threshold voltage; and
a delay multiplexer coupled to the one or more preamplifiers, and configured to generate the delay signal based on an output of one of the preamplifiers.
14. A method of operating an analog to digital converter (ADC) comprising:
generating a delay signal responsive to a calibration signal;
providing the delay signal to a backend ADC, the backend ADC having a plurality of stages that includes a first stage;
determining an error count of the first stage by a calibration circuit, in which the error count is an absolute difference in a number of ones and zeroes generated by the first stage; and
storing a delay value, of the first stage in the calibration circuit, for which the error count is minimum.
15. The method of claim 14 further comprising:
generating a plurality of input codes by the calibration circuit; and
generating the calibration signal in response to an input code of the plurality of input codes.
16. The method of claim 15 , wherein determining the error count further comprises performing a plurality of cycles, and in a cycle of the plurality of cycles:
modifying the delay value of a first delay block in the first stage;
generating the plurality of input codes by the calibration circuit;
generating a digital code by the first stage in response to the plurality of input codes; and
determining the absolute difference in numbers of ones and zeroes in the digital code.
17. The method of claim 16 further comprising storing the delay value for which the error count of the first stage is minimum as the delay value of the first stage.
18. The method of claim 17 further comprising providing an output of the first stage to a second stage in the backend ADC.
19. The method of claim 18 further comprising:
modifying a delay value of a second delay block in the second stage;
generating the plurality of input codes by the calibration circuit;
generating a digital code by the second stage in response to the plurality of input codes;
determining an absolute difference in numbers of ones and zeroes in the digital code; and
storing the delay value for which the error count of the second stage is minimum as the delay value of the second stage.
20. A device comprising:
a processor;
a memory coupled to the processor; and
an analog to digital converter (ADC) coupled to the processor and the memory, the ADC including:
a voltage to delay (VD) block configured to generate a delay signal responsive to a calibration signal;
a backend ADC coupled to the VD block, and configured to receive the delay signal, the backend ADC having a plurality of stages including a first stage; and
a calibration circuit coupled to the plurality of stages and the VD block, the calibration circuit configured to:
determine an error count of the first stage in response to the delay signal; and
store a delay value of the first stage for which the error count is minimum.