IP Library Granted Patent US 11,973,003
Granted Patent B2
US 11,973,003 · App. 18/156,499 · Granted Apr 30, 2024

Ceramic metal circuit board and semiconductor device using the same

Inventors: Takayuki Naba (Chigasaki Kanagawa, JP); Keiichi Yano (Yokohama Kanagawa, JP); Hiromasa Kato (Nagareyama Chiba, JP)
Assignees: KABUSHIKI KAISHA TOSHIBA; TOSHIBA MATERIALS CO., LTD.
H01L23/3735H05K1/0271H05K1/0306H05K1/09C04B2235/9607
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Quick Facts
Patent No.
US 11,973,003
App. No.
18/156,499
Granted
Apr 30, 2024
Kind
B2
Abstract

According to one embodiment, a ceramic metal circuit board is a ceramic metal circuit board formed by bonding metal circuit plates to at least one surface of a ceramic substrate. At least one of the metal circuit plates has an area of not less than 100 mm 2 and includes a concave portion having a depth of not less than 0.02 mm within a range of 1% to 70% of a surface of the at least one of the metal circuit plates. The concave portion is provided not less than 3 mm inside from an end of the metal circuit plate.

Claims (17)

1. A ceramic metal circuit board formed by bonding metal circuit plates to at least one surface of a ceramic substrate, wherein at least one of the metal circuit plates has an area of not less than 100 mm 2 and comprises a concave portion having a depth of not less than 0.02 mm within a range of 1% to 70% of a surface of the at least one of the metal circuit plates, and the concave portion is provided not less than 3 mm inside from an end of the at least one of the metal circuit plates, and

wherein a sectional shape of the concave portion is at least one shape selected from a triangular shape or a shape with a convex portion formed at an inlet edge of the concave portion.

2. The ceramic metal circuit board according to claim 1 , wherein an area to provide the concave portion falls within a range of 3% to 70% of one metal circuit plate surface.

3. The ceramic metal circuit board according to claim 2 , wherein the area to provide the concave portion falls within a range of 30% to 95% of one metal circuit plate surface other than a semiconductor element mounting portion region and a terminal mounting portion region.

4. The ceramic metal circuit board according to claim 1 , wherein the depth of the concave portion falls within a range of 10% to 90% of a thickness of the metal circuit plate.

5. The ceramic metal circuit board according to claim 1 , wherein an average minimum diameter d (mm) or an average minimum groove width w of the concave portion viewed from an upper side falls within a range of 0.5 mm to 2 mm.

6. The ceramic metal circuit board according to claim 1 , wherein an average shortest distance p between concave portions is not less than d/2 (mm) or not less than w/2 (mm).

7. The ceramic metal circuit board according to claim 1 , wherein a thickness of the metal circuit plate is not less than 0.3 mm.

8. The ceramic metal circuit board according to claim 1 , wherein a surface size of the ceramic substrate is not less than 12 cm 2 .

9. The ceramic metal circuit board according to claim 1 , wherein the ceramic metal circuit board has a structure including a back metal plate provided on a side opposite to a surface of the ceramic substrate on which the at least one of the metal circuit plates is provided.

10. The ceramic metal circuit board according to claim 9 , wherein the ceramic metal circuit board has a structure including a concave portion provided in the back metal plate.

11. The ceramic metal circuit board according to claim 1 , wherein the ceramic substrate comprises a silicon nitride substrate.

12. The ceramic metal circuit board according to claim 1 , wherein at least a part of the surface of the ceramic substrate, which excludes a portion where the at least one of the metal circuit plates is provided, comprises a concave portion.

13. A semiconductor device including a semiconductor element provided on a metal circuit plate provided with a concave portion of the ceramic metal circuit board of claim 1 comprises a concave portion.

14. The semiconductor device according to claim 13 , wherein semiconductor elements are provided on the at least one of the metal circuit plates provided with the concave portion.

15. The semiconductor device according to claim 13 , wherein a junction temperature of the semiconductor element is not less than 170° C.

16. The semiconductor device according to claim 13 , wherein the semiconductor device is resin-molded.

Assignments (3)
NUNC PRO TUNC ASSIGNMENT Recorded Feb 19, 2026
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MATERIALS CO. LTD.
Reel/Frame 074940/0511 →
CHANGE OF NAME Recorded Feb 19, 2026
From: TOSHIBA MATERIALS CO. LTD.
To: NITERRA MATERIALS CO., LTD.
Reel/Frame 074941/0803 →
CHANGE OF ADDRESS Recorded Feb 19, 2026
From: KABUSHIKI KAISHA TOSHIBA
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 074941/0846 →
Priority Claims (1)
JP 2017-057693 · Mar 23, 2017 · national
Continuity (3)
Continuation 16546509 · Aug 21, 2019
Continuation PCTJP2018010256 · Mar 15, 2018
Related Publication 20230154826A1 · May 18, 2023